The feasibility of developing test circuits to perform in-circuit testing of analog circuits is investigated in this thesis. A modular approach to analog testing has been adopted. Accordingly, the testing of an operational amplifier, which is a basic building block in analog circuits, is addressed. One convenient technique for measuring the frequency response of an op-amp requires a unity gain buffer to be inserted into its feedback loop. This buffer has to be simple in construction, small and accurate. Two buffer circuits that satisfy these requirements are described in this thesis. Enhanced slewing techniques are devised to achieve increased levels of performance. The buffers were integrated with an op-amp into a test chip. Digital logic is used to provide controllability and accessibility to each of the buffers and the op-amp so that they can characterized separately. The performance of the enhanced slewing buffers was verified with measurements performed on the test chip. The performance of the buffers conformed well with the simulated values. The buffers exhibited excellent settling times even while driving large capacitive loads. Their output swing and distortion performance were good for inputs as large as 2 V peak-to-peak values. / Graduation date: 1994