The growing market of portable devices and smart wearables has contributed to innovation and development of systems with longer battery-life. While Near Threshold Computing (NTC) systems address the need for longer battery-life, they have certain limitations. NTC systems are prone to be significantly affected by variations in the fabrication process, commonly called process variation (PV). This dissertation explores an intriguing effect of PV, called choke points. Choke points are especially important due to their multifarious influence on the functional correctness of an NTC system. This work shows why novel research is required in this direction and proposes two techniques to resolve the problems created by choke points, while maintaining the reduced power needs.
| Identifer | oai:union.ndltd.org:UTAHS/oai:digitalcommons.usu.edu:etd-8576 |
| Date | 01 May 2019 |
| Creators | Bal, Aatreyi |
| Publisher | DigitalCommons@USU |
| Source Sets | Utah State University |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | All Graduate Theses and Dissertations |
| Rights | Copyright for this work is held by the author. Transmission or reproduction of materials protected by copyright beyond that allowed by fair use requires the written permission of the copyright owners. Works not in the public domain cannot be commercially exploited without permission of the copyright owner. Responsibility for any use rests exclusively with the user. For more information contact digitalcommons@usu.edu. |
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