Content addressable memories (CAMs) are gaining popularity with computer networks. Testing costs of CAMs are extremely high owing to their unique configuration. In this thesis, a fault analysis is carried out on an industrial ternary CAM (TCAM) design, and search path test algorithms are designed. The proposed algorithms are able to test the TCAM array, multiple-match resolver (MMR), and match address encoder (MAE). The tests represent a 6x decrease in test complexity compared to existing algorithms, while dramatically improving fault coverage.
| Identifer | oai:union.ndltd.org:WATERLOO/oai:uwspace.uwaterloo.ca:10012/809 |
| Date | January 2005 |
| Creators | Wright, Derek |
| Publisher | University of Waterloo |
| Source Sets | University of Waterloo Electronic Theses Repository |
| Language | English |
| Detected Language | English |
| Type | Thesis or Dissertation |
| Format | application/pdf, 367597 bytes, application/pdf |
| Rights | Copyright: 2005, Wright, Derek. All rights reserved. |
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