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Amplitude thermal robustness study of GMR spin valve magnetic recording heads. / 硏究巨磁阻自旋閥磁記錄頭的靈敏度與溫度之關係 / Amplitude thermal robustness study of GMR spin valve magnetic recording heads. / Yan jiu ju ci zu zi xuan fa ci ji lu tou de ling min du yu wen du zhi guan xi

Chan Lai To = 硏究巨磁阻自旋閥磁記錄頭的靈敏度與溫度之關係 / 陳麗圖. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2000. / Includes bibliographical references (leaves 80-83). / Text in English; abstracts in English and Chinese. / Chan Lai To = Yan jiu ju ci zu zi xuan fa ci ji lu tou de ling min du yu wen du zhi guan xi / Chen Litu. / Abstracts --- p.ii / 論文摘要 --- p.iii / Acknowledgements --- p.iv / Table of Contents --- p.v / List of Figures --- p.viii / Abbreviations --- p.xi / Chapter Chapter 1 --- Introduction --- p.1 / Chapter 1.1 --- History of Data Storage in Computers --- p.1 / Chapter 1.2 --- Structure and Working Principle of the Recording Head of a Magnetic Disk Storage device --- p.2 / Chapter 1.2.1 --- Structure of a Current Magnetic Recording Head --- p.2 / Chapter 1.2.2 --- Principle of Recording --- p.6 / Chapter 1.2.2.1 --- General Operating Principle of a Magnetic Recording Head --- p.7 / Chapter 1.2.2.2 --- Principle of Recording using AMR Elements --- p.9 / Chapter 1.2.2.3 --- Principle of Recording using GMR Elements --- p.14 / Chapter 1.3 --- Reliability of Magnetic Recording Heads --- p.23 / Chapter 1.3.1 --- Importance in the Determination of Reliability of Magnetic Recording Heads --- p.23 / Chapter 1.3.2 --- Current Relevant Reliability Issues in the Field --- p.23 / Chapter 1.4 --- Objectives of the Thesis Work --- p.24 / Chapter Chapter 2 --- Methodology --- p.25 / Chapter 2.1 --- Sample Preparation --- p.25 / Chapter 2.2 --- Principle of Amplitude Thermal Robustness Measurements --- p.28 / Chapter 2.2.1 --- Black's Equation --- p.28 / Chapter 2.2.2 --- Thermal Coefficient (TC) or Temperature Resistivity Coefficient Test --- p.29 / Chapter 2.2.3 --- Temperature Rise (TR) --- p.31 / Chapter 2.2.4 --- Thermal Electrical (TE) Stress Test (Accelerated Test) --- p.34 / Chapter 2.2.5 --- Maximum MR Resistance for Normal Device Operation --- p.38 / Chapter 2.3 --- Magnetic Field Effects Induced by the Biasing Current in an ATR Measurement --- p.40 / Chapter Chapter 3 --- Experimental Results and Data Analysis --- p.41 / Chapter 3.1 --- Results of the ATR Measurement --- p.43 / Chapter 3.1.1 --- Thermal Coefficient (TC) Test Result --- p.43 / Chapter 3.1.2 --- Temperature Rise (TR) Results --- p.48 / Chapter 3.1.3 --- Thermal Electrical (TE) Stress Test Result --- p.51 / Chapter 3.1.4 --- Maximum MR Resistance for Normal Device Operation --- p.60 / Chapter 3.2 --- Preliminary Data from the Magnetic Field Effects Induced by the Biasing Current in an ATR Measurement --- p.61 / Chapter Chapter 4 --- Discussion of Results and Failure Mechanisms --- p.62 / Chapter 4.1 --- Summary of the ATR characteristics of GMR heads --- p.62 / Chapter 4.2 --- "Comparison of ATR characteristics of AMR and GMR, and Discussion of Failure Mechanisms" --- p.63 / Chapter 4.2.1 --- ATR characteristics and Failure Mechanisms of AMR --- p.63 / Chapter 4.2.1.1 --- Summary of ATR characteristics of AMR heads --- p.63 / Chapter 4.2.1.2 --- Electromigration (EM) Induced Failure in AMR --- p.65 / Chapter 4.2.1.3 --- Diffusion Induced Failure in AMR --- p.67 / Chapter 4.2.2 --- Possibility of Diffusion Induced Failure in GMR --- p.68 / Chapter 4.2.3 --- Possibility of EM Induced Failure in GMR --- p.69 / Chapter 4.3 --- Magnetic-field Dependent ATR characteristics of GMR --- p.69 / Chapter 4.3.1 --- Temperature Dependence of the Exchange Coupling Field --- p.70 / Chapter 4.3.2 --- Rotation or Reversal of Magnetic Moments of the Pinned Layer --- p.75 / Chapter 4.3.3 --- Relaxation of the Magnetization of the Pinning Layer --- p.77 / Chapter Chapter 5 --- Conclusions and Suggestions for Future Work --- p.78 / References --- p.80

Identiferoai:union.ndltd.org:cuhk.edu.hk/oai:cuhk-dr:cuhk_323114
Date January 2000
ContributorsChan, Lai To., Chinese University of Hong Kong Graduate School. Division of Physics.
Source SetsThe Chinese University of Hong Kong
LanguageEnglish, Chinese
Detected LanguageEnglish
TypeText, bibliography
Formatprint, xi, 83 leaves : ill. ; 30 cm.
RightsUse of this resource is governed by the terms and conditions of the Creative Commons “Attribution-NonCommercial-NoDerivatives 4.0 International” License (http://creativecommons.org/licenses/by-nc-nd/4.0/)

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