• Refine Query
  • Source
  • Publication year
  • to
  • Language
  • 1332
  • 486
  • 258
  • 207
  • 60
  • 45
  • 34
  • 28
  • 11
  • 11
  • 11
  • 11
  • 11
  • 11
  • 11
  • Tagged with
  • 2976
  • 2976
  • 476
  • 466
  • 409
  • 343
  • 283
  • 269
  • 263
  • 206
  • 200
  • 193
  • 192
  • 188
  • 188
  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
151

WAVEFRONT ERRORS PRODUCED BY MULTILAYER THIN-FILM OPTICAL COATINGS

Knowlden, Robert Edward January 1981 (has links)
The mirrors used in high energy laser systems have at least two requirements that are uncommon in optical engineering: the reflectance of such mirrors must be very high (> 0.999), and the level of aberrations introduced by the mirrors is desired to be very low, typically λ/50 peak at 3.8 μ. The first requirement can be met by using multilayer thin film coatings, but such coatings can themselves produce aberrations in an optical system. One possible effect in multilayers is that such coatings produce an optical phase change on reflection that varies with angle of incidence and polarization of the illuminating beam. On a strongly curved mirror, such as an f/1.5 parabola used as a collimator, these effects may be appreciable for some coatings (e.g., λ/13 for a broadband all-dielectric reflector), but for an enhanced silver coating the effects are small, typically λ/400 of error that is almost entirely in the form of a small focus shift. If this same parabola is tested at its center of curvature, the coating-caused aberration due to angle of incidence effects are nearly zero (e.g., λ/50,000 for the broadband reflector that gave λ/13 when the parabola was used as a collimator). The wavefront errors due to coating nonuniformities are usually more important than angle of incidence effects. The simplest type of coating nonuniformity to analyze is a proportional error, i.e., an error where the ratios of the thicknesses of the layers are fixed but the thin film stack varies in total thickness across a surface. For a six-layer enhanced reflector for use at 3.8 μ, a 1% thickness error produces an approximate λ/100 wavefront error. At visible wavelengths, however, the aberration produced by such a coating error can be very different because of the optical interference nature of the coating. Means may be developed to estimate the performance of such an infrared reflector from measurements at visible wavelengths. If the errors produced by the coating are to be distinguished from those existing in the test due to misalignment or gravitational flexure of a large mirror, two or more wavelengths must be chosen. There are ambiguities in such a test that may be resolved by choice of an appropriate coating design or by using enough wavelengths in the visible, and both means have been studied. A technique was found where the infrared wavefront can be determined for a coating with proportional thickness errors if the coating prescription is known: interferograms of the mirror are made at three visible wavelengths, and the IR wavefront error due to the coating error is determined in a way that is insensitive to any errors caused by distortion of the substrate or even fairly large misalignments in the optical test of a mirror's figure.
152

Nanoscale investigation of polarization interaction and polarization switching in ferroelectric P(VDF-TrFE) copolymer samples

Kim, Jihee. January 1900 (has links)
Thesis (Ph.D.)--University of Nebraska-Lincoln, 2008. / Title from title screen (site viewed July 22, 2008). PDF text: ix, 169 p. : ill. (some col.) ; 8 Mb. UMI publication number: AAT 3299685. Includes bibliographical references. Also available in microfilm and microfiche formats.
153

Microstructure and superlattice effects on the optical properties of ferroelectric thin films /

Hiltunen, Jussi. January 1900 (has links) (PDF)
Thesis (doctoral)--University of Oulu, 2008. / Includes bibliographical references. Also available on the World Wide Web.
154

Characterization of a novel methyl radical source and related thin film growth studies

Gold, Jeffrey Stephen, January 2000 (has links)
Thesis (Ph. D.)--West Virginia University, 2000. / Title from document title page. Document formatted into pages; contains xi, 108 p. : ill. (some col.) + appendix; 37 p. : ill. Includes abstract. Includes bibliographical references (p. 103-108; p. A-37).
155

Fabrication and characterization of zirconium oxide thin films

Vemuri, Venkata Rama Sesha Ravi Kumar, January 2009 (has links)
Thesis (M.S.)--University of Texas at El Paso, 2009. / Title from title screen. Vita. CD-ROM. Includes bibliographical references. Also available online.
156

Investigation of the influence of cadmium processing on Zn1-xGa2O4-x:Mn thin films for photoluminescent and thin film electroluminescent applications /

Flynn, Michael John. Kitai, Adrian, January 1900 (has links)
Thesis (Ph.D.)--McMaster University, 2003. / Advisor: A.H. Kitai. Includes bibliographical references (leaves 193-199). Also available via World Wide Web.
157

An investigation on effect of Mn-doping on dielectric property of barium strontium stannate titanate

Tam, Dickson Tai Shun. January 2005 (has links) (PDF)
Thesis (M.Sc.)--City University of Hong Kong, 2005. / At head of title: City University of Hong Kong, Department of Physics and Materials Science, Master of Science in materials engineering & nanotechnology dissertation. Title from title screen (viewed on Sept. 4, 2006) Includes bibliographical references.
158

An investigation on effect of Mn-doping on dielectric property of barium strontium stannate titanate

Yeung, Kwok Fai. January 2005 (has links) (PDF)
Thesis (M.Sc.)--City University of Hong Kong, 2005. / At head of title: City University of Hong Kong, Department of Physics and Materials Science, Master of Science in materials engineering & nanotechnology dissertation. Title from title screen (viewed on Sept. 4, 2006) Includes bibliographical references.
159

Optical and electrical characteristics of Cr and Fe doped ZnSe thin film and bulk materials for optically and electrically pumped lasers

Gallian, Andrew. January 1900 (has links) (PDF)
Thesis (Ph. D.)--University of Alabama at Birmingham, 2006. / Additional advisors: Renato Camata, Richard Fork, Andrei Stanishevsky, Charles L. Watkins, Mary Ellen Zvanut. Dissertation not released until Fall 2007. Description based on contents viewed Oct. 6, 2007; title from title screen. Includes bibliographical references (p. 94-102).
160

The preparation of thin films of InSb by vacuum deposition technique

Kakihana, Sanehiko January 2011 (has links)
Digitized by Kansas State University Libraries

Page generated in 0.0411 seconds