141 |
Effects of light-matter interactions within semiconductor microcavitiesBello, Frank Daniel January 2009 (has links)
No description available.
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142 |
Optical and electrical characterisation of er-doped si-based structuresGad, Mahmoud A. M. January 2003 (has links)
No description available.
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143 |
Atomic structure and properties of graphene and novel graphene derivativesNair, Rahul Raveendran January 2010 (has links)
No description available.
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144 |
Scanning tunnelling microscopy of thin film polysiRigopoulos, Nickolas January 2000 (has links)
No description available.
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145 |
Magnetotransport studies of artificially disordered two-dimensional electron gasesMelhuish, Gavin January 2005 (has links)
No description available.
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146 |
Theoretical studies of clean and adsorbate covered low and high index semiconductor surfacesSmardon, Raymond David January 2004 (has links)
No description available.
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147 |
Theoretical and experimental studies of the hot electron barrier light emitterAiyarak, Pattara January 2001 (has links)
No description available.
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148 |
Investigations of the luminescence of GaN and InGaN/GaN quantum wellsPecharromaÌn-Gallego, RauÌl January 2004 (has links)
No description available.
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149 |
Optical characterisation of III-V semiconductor quantum dots and quantum dot structuresAshmore, Adam Dennis January 2004 (has links)
This thesis describes an extensive study of the optical properties of In(Ga)As/Ga(Al)As quantum dots, both singularly and in laser devices. For the optical characterisation, the spectroscopic techniques of photoluminescence (PL), photoluminescence-excitation (PLE) and electroluminescence (EL) have been used. Additionally, for studying submicron structures, sophisticated micro-PL techniques allowed excitation, and detection, of a single quantum dot. A variety of special growth and fabrication techniques were used to isolate a single quantum dot from the rest of the ensemble. Firstly, a submicron mesa that isolated a single quantum dot was fabricated using e-beam lithography and dry etching techniques. Excitation intensity and wavelength dependence of the emission provided information about the nature of the exciton complexes in the dot and the absorption and relaxation of carriers in the structure. The linewidth of the single exciton, and the variation with temperature, was measured. Secondly, samples consisting of a single layer of InGaAs quantum dots incorporated within the intrinsic region of a GaAs/AlGaAs Metal-Insulator-Semiconductor type Schottky structure allowed sequential dot charging via variation of the gate bias. Both n- and p- type samples, grown under similar conditions, were investigated. Single quantum dots were probed through submicron apertures opened in the top metal contact using electron beam lithography and dry etching. The emission undergoes several pronounced changes as additional carriers are sequentially loaded into the dot. The results reveal direct information regarding Coulomb interaction and correlation effects in dots containing a controlled number of excess electrons (up to four) or holes (up to two). Magneto- optical results reveal further information about the few-particle wave functions. A detailed study of the device performance and physical processes in In(Ga)As- Ga(Al)As self-assembled quantum dot lasers showed that these lasers offer several potential advantages over conventional quantum well lasers including low threshold current density, temperature insensitive threshold current density and high differential gain. Device performance (threshold current density and its variation with temperature) has been studied as a function of a number of parameters, including dot density, dot composition and dot confinement potential. The application of large (<14T) magnetic fields has been used to study carrier transport and dot carrier capture effects. When applied along the growth axis, such fields result in an increase in the threshold current density and a decrease in the external quantum efficiency. These effects are attributed to inhibited inplane carrier transport resulting in an increase in the carrier capture efficiency by non-lasing dots. Spontaneously emitted light, recorded via small windows formed in the top metallic contact, has been studied as a function of injection current and temperature. Analysis of this data provides information on non-radiative loss mechanisms and dot carrier dynamics.
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150 |
Electronic Raman scattering in semiconductorsWolland, Stale January 1974 (has links)
No description available.
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