Line width parameters for a number of spectral lines in the pure rotational spectrum of formaldehyde (CH20) and formic acid (HCOOH) have been measured using a sourcemodulated microwave spectrograph. All transitions studied in this investigation were of the type ΔJ=O (i.e. Q-branch transitions), with ΔK-1=0 and ΔK+1 =+l. The center frequencies of the measured lines varied from 8662.0 MHz to 48612.70 MHz. The experimentally determined collision diameters for self broadening interactions involving HCOOH and CH2 Q molecules were found to be 2 - 27 per cent less than those calculated by the Murphy-Boggs theory of collision broadening. Much better agreement between a simplified broadening scheme for symmetric top molecules and the observed foreign-gas collision diameters is obtained by using Birnbaum's theory.

A tunable erbium-doped fiber ring laser using an intra-cavity Fabry-Perot filter as the tuning element is investigated. Tuning is achieved by varying the applied voltage which controls the FP cavity length. The laser's wavelength is monitored using an optical spectrum analyzer to determine the laser's spectral characteristics under static conditions at different wavelengths over its tuning range of approximately 50nm. When the laser is tuned rapidly, the frequency versus time characteristic is determined using a fiber Fabry-Perot interferometer with a photodetector to convert the optical signal to an electrical signal. The core of the research is to determine the degree of spectral broadening of the laser as a function of the spectral tuning rate. The fringe contrast of fiber Fabry-Perot interferometer transmittance curves decreases with increase in the tuning frequency. The gain at a certain wavelength becomes a function of time putting an upper limit on the tuning frequency of the system. The carrier lifetime of erbium ions dictates the maximum achievable tuning speed.

Thesis (Ph. D.)--Ohio State University, 2005. / Title from first page of PDF file. Document formatted into pages; contains xiv, 218 p.; also includes graphics (some col.) Includes bibliographical references (p. 208-218). Available online via OhioLINK's ETD Center

Thesis (Ph. D.)-- University of Washington, 2004. / Vita. Includes bibliographical references (leaves 242-251).

A propagação de eventos transientes na lógica combinacional é estudada através da simulação elétrica do circuito, utilizando-se o simulador Hspice. Uma das fontes de falhas transientes é o pulso transiente causado por partículas ionizantes que atingem o circuito. O estudo é centrado nas propriedades de mascaramento elétrico das portas lógicas. Estuda-se a propagação do pulso transiente através de cada estágio da lógica até que alcance um elemento da memória. A partir do estudo das propriedades de mascaramento elétrico, propõe-se um modelo simples para a degradação e ampliação de um pulso transiente enquanto este é propagado através de uma cadeia de portas lógicas. O modelo considera as propriedades elétricas das portas, utilizando como parâmetro principal da modelagem o tempo de propagação (atraso) da porta lógica. O modelo é computacionalmente eficiente e adequado para implementação em ferramentas de auxilio de projeto automatizadas, como ferramentas de timing analysis. A ferramenta timing analysis poderia então executar um algoritmo para percorrer todos os nós de um circuito, determinando os nós mais sensíveis, ajudando a estimar e reduzir a taxa de falhas transientes do circuito. Visando no futuro, testar o modelo e o comportamento de circuitos combinacional sobre efeito de partículas radioativas, foram estudadas algumas arquiteturas existentes capazes de medir a largura dos pulsos transientes nos circuitos combinacionais on-chip, para compararmos com o modelo analítico proposto e os comportamentos elétricos obtidos através de simulação Hspice. / Single Event Transients in Combinatorial Logic are studied using spice-level circuit simulation. The study is centered on the electrical masking properties of the gates. The propagation of the transient through each stage of logic until it reaches a memory element is characterized. Both duration and amplitude of the transient pulse are attenuated as it propagates through the logic gates. A simple, first order model for the degradation of a transient pulse as it is propagated through a chain of logic gates is proposed. The model considers the electrical properties of the logic gates through which the pulse propagates. The model is computationally efficient and intended to be implemented in a timing analysis tool. The timing analysis tool could then implement an algorithm to traverse all circuit nodes, determining the most sensitive nodes, helping to estimate and reduce the soft error failure rate of the whole circuit. Aiming at the future, test the model and the behavior of combinatorial circuits effect on radioactive particles, was studied some existing architectures capable of measuring the width of transient pulses in combinatorial circuits on-chip, to compare with the proposed analytical model and the electrical behaviors obtained by Hspice simulation.

A propagação de eventos transientes na lógica combinacional é estudada através da simulação elétrica do circuito, utilizando-se o simulador Hspice. Uma das fontes de falhas transientes é o pulso transiente causado por partículas ionizantes que atingem o circuito. O estudo é centrado nas propriedades de mascaramento elétrico das portas lógicas. Estuda-se a propagação do pulso transiente através de cada estágio da lógica até que alcance um elemento da memória. A partir do estudo das propriedades de mascaramento elétrico, propõe-se um modelo simples para a degradação e ampliação de um pulso transiente enquanto este é propagado através de uma cadeia de portas lógicas. O modelo considera as propriedades elétricas das portas, utilizando como parâmetro principal da modelagem o tempo de propagação (atraso) da porta lógica. O modelo é computacionalmente eficiente e adequado para implementação em ferramentas de auxilio de projeto automatizadas, como ferramentas de timing analysis. A ferramenta timing analysis poderia então executar um algoritmo para percorrer todos os nós de um circuito, determinando os nós mais sensíveis, ajudando a estimar e reduzir a taxa de falhas transientes do circuito. Visando no futuro, testar o modelo e o comportamento de circuitos combinacional sobre efeito de partículas radioativas, foram estudadas algumas arquiteturas existentes capazes de medir a largura dos pulsos transientes nos circuitos combinacionais on-chip, para compararmos com o modelo analítico proposto e os comportamentos elétricos obtidos através de simulação Hspice. / Single Event Transients in Combinatorial Logic are studied using spice-level circuit simulation. The study is centered on the electrical masking properties of the gates. The propagation of the transient through each stage of logic until it reaches a memory element is characterized. Both duration and amplitude of the transient pulse are attenuated as it propagates through the logic gates. A simple, first order model for the degradation of a transient pulse as it is propagated through a chain of logic gates is proposed. The model considers the electrical properties of the logic gates through which the pulse propagates. The model is computationally efficient and intended to be implemented in a timing analysis tool. The timing analysis tool could then implement an algorithm to traverse all circuit nodes, determining the most sensitive nodes, helping to estimate and reduce the soft error failure rate of the whole circuit. Aiming at the future, test the model and the behavior of combinatorial circuits effect on radioactive particles, was studied some existing architectures capable of measuring the width of transient pulses in combinatorial circuits on-chip, to compare with the proposed analytical model and the electrical behaviors obtained by Hspice simulation.

A propagação de eventos transientes na lógica combinacional é estudada através da simulação elétrica do circuito, utilizando-se o simulador Hspice. Uma das fontes de falhas transientes é o pulso transiente causado por partículas ionizantes que atingem o circuito. O estudo é centrado nas propriedades de mascaramento elétrico das portas lógicas. Estuda-se a propagação do pulso transiente através de cada estágio da lógica até que alcance um elemento da memória. A partir do estudo das propriedades de mascaramento elétrico, propõe-se um modelo simples para a degradação e ampliação de um pulso transiente enquanto este é propagado através de uma cadeia de portas lógicas. O modelo considera as propriedades elétricas das portas, utilizando como parâmetro principal da modelagem o tempo de propagação (atraso) da porta lógica. O modelo é computacionalmente eficiente e adequado para implementação em ferramentas de auxilio de projeto automatizadas, como ferramentas de timing analysis. A ferramenta timing analysis poderia então executar um algoritmo para percorrer todos os nós de um circuito, determinando os nós mais sensíveis, ajudando a estimar e reduzir a taxa de falhas transientes do circuito. Visando no futuro, testar o modelo e o comportamento de circuitos combinacional sobre efeito de partículas radioativas, foram estudadas algumas arquiteturas existentes capazes de medir a largura dos pulsos transientes nos circuitos combinacionais on-chip, para compararmos com o modelo analítico proposto e os comportamentos elétricos obtidos através de simulação Hspice. / Single Event Transients in Combinatorial Logic are studied using spice-level circuit simulation. The study is centered on the electrical masking properties of the gates. The propagation of the transient through each stage of logic until it reaches a memory element is characterized. Both duration and amplitude of the transient pulse are attenuated as it propagates through the logic gates. A simple, first order model for the degradation of a transient pulse as it is propagated through a chain of logic gates is proposed. The model considers the electrical properties of the logic gates through which the pulse propagates. The model is computationally efficient and intended to be implemented in a timing analysis tool. The timing analysis tool could then implement an algorithm to traverse all circuit nodes, determining the most sensitive nodes, helping to estimate and reduce the soft error failure rate of the whole circuit. Aiming at the future, test the model and the behavior of combinatorial circuits effect on radioactive particles, was studied some existing architectures capable of measuring the width of transient pulses in combinatorial circuits on-chip, to compare with the proposed analytical model and the electrical behaviors obtained by Hspice simulation.

For nearly three decades, researchers have studied the persistent underrepresentation of women in computer science and computing-related fields. Findings indicate that recruitment and retention strategies result in short-term gains in interest and diversity in computer science. One recruitment strategy that shows promise to increase student interest in computer science is after-school programs. To increase the number of students exposed to and interested in computer science and Science, Technology, Engineering, and Math (STEM) fields, a suburban school district in southeastern Pennsylvania started an after-school program. This fee-based program offers seven-week long robotics, programming, and science experiment courses for elementary and middle school students. This study used a quantitative approach with the expectancy-value model as the theoretical framework to examine whether there are lasting effects from this after-school program on course and career selection. The results show a higher likelihood of study participants, each of whom participated in an after-school program, to select computer science in high school than the general high school population. The results also show that the rate of computer science choice for this group is also significant when accounting for the gender of the participants. Family dynamics may have been the influencing factor. The results are not supportive of the after-school program influencing participants to study computer science at the collegiate level, but there is some support for study participants interest in a computing career. / Educational Psychology

Broadening participation in engineering has been a pressing focus of engineering education research for decades. Despite efforts to improve engineering access for historically underrepresented groups, progress has been slow. The National Academy of Engineering and other governmental and professional agencies have voiced the need to increase the presence of women in engineering as a national priority. Women have always been underrepresented in engineering spaces and are too often told either explicitly or through negative treatment that they do not belong in engineering. This messaging is a barrier to broadening engineering participation for women; when women do feel like they belong, conversely, they are more likely to enter and remain in engineering spaces. My study was designed to understand women's experiences of belonging at different organizational levels. I investigate women's perceptions, competencies, motivations, and opportunities for belonging both within their engineering programs/colleges and outside of engineering at their institutions. Using this multi-level approach, I identified connections between belonging components at each level and found that the source of women's belonging and engagement matters for their overall levels of belonging and intentions to persist in engineering. The results of this study revealed that women experience higher levels of belonging outside of engineering than within their engineering programs. However, belonging in engineering related to students' intentions to persist toward their engineering degrees, but belonging outside of engineering did not. I also found that different activities relate to women's belonging at each level, which could have implications for how we support students in finding belonging. My findings present an opportunity for educators to be intentional about how and where they help students cultivate belonging. If we can help women find greater belonging in their engineering programs/colleges, we may be able to influence the likelihood that they persist in their engineering program in a way that belonging initiatives outside of engineering may not. / Doctor of Philosophy / Broadening participation in engineering has been a pressing focus of engineering education research for decades. Despite efforts to improve engineering access for historically underrepresented groups, progress has been slow. The National Academy of Engineering and other governmental and professional agencies have voiced the need to increase the presence of women in engineering as a national priority. Women have always been underrepresented in engineering spaces and are too often told either explicitly or through negative treatment that they do not belong in engineering. This messaging is a barrier to broadening engineering participation for women; when women do feel like they belong, conversely, they are more likely to enter and remain in engineering spaces. My study was designed to understand women's experiences of belonging at different organizational levels. I investigate women's perceptions, competencies, motivations, and opportunities for belonging both within their engineering programs/colleges and outside of engineering at their institutions. Using this multi-level approach, I identified connections between belonging components at each level and found that the source of women's belonging and engagement matters for their overall levels of belonging and intentions to persist in engineering. The results of this study revealed that women experience higher levels of belonging outside of engineering than within their engineering programs. However, belonging in engineering related to students' intentions to persist toward their engineering degrees, but belonging outside of engineering did not. I also found that different activities relate to women's belonging at each level, which could have implications for how we support students in finding belonging. My findings present an opportunity for educators to be intentional about how and where they help students cultivate belonging. If we can help women find greater belonging in their engineering programs/colleges, we may be able to influence the likelihood that they persist in their engineering program in a way that belonging initiatives outside of engineering may not.

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