NDLTD Global ETD Search
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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

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Statistical Analysis of Specific Secondary Circuit Effect under Fault Insertion in 22 nm FD-SOI Technology Node

McKinsey, Vince Allen January 2021 (has links)
No description available.
Electrical Engineering
Signal Activity Rate
SRA
Statistical Analysis
Carry Multiplexed Adder
VHDL
Verilog
Python
Trust Metrics
Testbenchs
FD-SOI
Fully Depleted Silicon-on-Insulator
CMOS
Semiconductor Technology Node
Secondary Circuit Effects
ASIC
ASIC Flow

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