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Modeling of high strain rate and strain localization in FCC single crystals multiscale dislocation dynamics analyses /Shehadeh, Mu'Tasem A., January 2005 (has links) (PDF)
Thesis (Ph.D.)--Washington State University. / Includes bibliographical references.
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Anisotropic organic materials ferroelectric crystals and spin-polarized radicals /Sui, Yongqiang, January 2007 (has links)
Thesis (Ph. D.)--University of Missouri-Columbia, 2007. / The entire dissertation/thesis text is included in the research.pdf file; the official abstract appears in the short.pdf file (which also appears in the research.pdf); a non-technical general description, or public abstract, appears in the public.pdf file. Title from title screen of research.pdf file (viewed Mar. 13, 2009). Includes bibliographical references.
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Dislocations in gallium arsenide deformed at high temperaturesGallagher, Patrick John January 1987 (has links)
Test pieces of GaAs were cut from Czochralski grown <100> wafers. Prior to deformation the dislocation configuration was established by cathodoluminescence (CL). Etch pits produced by molten KOH on examined crystal surfaces coincided with the CL images. The test pieces were capped with Si₃N₄, heated to between 950 and 1050°C, and plastically deformed by bending. The dislocation configuration after bending was then compared to that of the undeformed crystal.
It was observed that heating to 1050°C did not significantly change the as grown cellular dislocation arrays in the crystal. With strain the dislocation configuration changed appreciably. New bands of dislocations were formed, parallel to the bend axis with dislocation free regions between them. Increasing the strain increased the number of bands. Observations were made on undoped crystals with high and low dislocation densities, and Si doped crystals.
The luminescent properties of the dislocations were observed to change with heating and strain. As grown, a dislocation imaged as a dark spot surrounded by a bright halo, giving bright dislocation networks. After heating to 950°C samples showed only the dark spots without halos. After deformation, all the new dislocations appeared as dark spots or lines without halos. At very low strains, the original dislocations were still evident but were distinct from the new arrays.
In an attempt to correlate the dislocation images with impurity segregation some observations of the samples were made using secondary ion mass spectroscopy (SIMS). The results suggest the possibility of the dark areas in the CL images being associated with the presence of carbon. / Applied Science, Faculty of / Materials Engineering, Department of / Graduate
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Temperature and dislocation stress field models of the LEC growth of gallium arsenideSchvezov, Carlos Enrique January 1986 (has links)
The temperature fields and resulting stress fields have been calculated for a growing GaAs crystal produced by the LEC process. The calculations are based in a finite element numerical thermoelastic stress analysis. The calculated temperature fields have been compared to reported experimental measurements with good agreement. The stress fields have been used to calculate the resolved shear stresses, in the growing crystal, from which the dislocation density and distribution were determined.
Using the model the effects of a range of growth and environmental parameters on the dislocation density and distribution were determined. Theses parameters include crystal length, crystal diameter, cone taper, boron oxide thickness, gas pressure, solid/liquid interface shape, vertical temperature gradients and others. The results show that the temperature distribution in the gas surrounding the crystal, and the boron oxide thickness, were critical factors in determining the dislocation density and distribution in the crystal. The crystal radius, crystal length and interface curvature also strongly influenced the dislocation configuration. After crystal growth, the dislocation density at the end of the crystal was strongly influenced by the cooling procedure adopted. The dislocation distribution on cross-sections of the crystal exhibited two-fold, four-fold and eight-fold symmetry depending on growth and cooling conditions and position in the crystal. / Applied Science, Faculty of / Mining Engineering, Keevil Institute of / Graduate
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Fabrication and characterization of crystalline silicon on insulator by the tungsten strip heater method /Maiz, Jose A. January 1983 (has links)
No description available.
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X-ray topography of laser annealed ion implanted silicon crystalsPrieto, Argenis January 2011 (has links)
Typescript (photocopy). / Digitized by Kansas Correctional Industries
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COMPARATIVE STUDY OF DISLOCATION BEHAVIOR IN SINGLE-CRYSTAL AND RIBBON-TO-RIBBON SILICON.Pinamaneni, Subba Rao. January 1983 (has links)
No description available.
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Photoluminescence study of cadmium zinc tellurideJain, Swati. January 2001 (has links)
Thesis (M.S.)--West Virginia University, 2001. / Title from document title page. Document formatted into pages; contains x, 84 p. : ill. (some col.). Includes abstract. Includes bibliographical references (p. 79-83).
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Organic materials for microelectronics 157 nm photoresists and electrooptic liquid crystals /Hung, Raymond Jui-pu, January 2001 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2001. / Vita. Includes bibliographical references. Available also from UMI/Dissertation Abstracts International.
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Organic materials for microelectronics : 157 nm photoresists and electrooptic liquid crystals /Hung, Raymond Jui-pu, January 2001 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2001. / Vita. Includes bibliographical references (leaves 220-229). Available also in a digital version from Dissertation Abstracts.
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