1 |
Preparation and Analyses of CuAlSe2 Thin FilmCheng, Chia-jen 04 July 2005 (has links)
none
|
2 |
Deposition and characterization of thin film CuAlSe2Tsai, Shiang-hui 20 July 2004 (has links)
We use molecular beam deposition (MBD) system to grow CuAlSe2 thin film. The films have been characterized by electrical measurements but also by X-ray diffraction, electron probe microanalysis, optical measurements, scanning electron microscopy and photoluminescence. It is shown that CuAlSe2 thin film is chalcopyrite structure with a band gap of 2.65eV, p-type conductivity and the smallest resistivity is 1.26¡Ñ102(
|
Page generated in 0.0109 seconds