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The Umbrella File System: Storage Management Across Heterogeneous DevicesGarrison, John Allen 2010 May 1900 (has links)
With the advent of Flash based solid state devices (SSDs), the differences in physical devices used to store data in computers are becoming more and more pronounced. Effectively mapping the differences in storage devices to the files, and applications using the devices, is the problem addressed in this dissertation.
This dissertation presents the Umbrella File System (UmbrellaFS), a layered file system designed to effectively map file and device level differences, while maintaining a single coherent directory structure for users. Particular files are directed to appropriate underlying file systems by intercepting system calls connecting the Virtual File System (VFS) to the underlying file systems. Files are evaluated by a policy module that can examine both filenames and file metadata to make decisions about final placement. Files are transparently directed to and moved between appropriate file systems based on their characteristics. A prototype of UmbrellaFS is implemented as a loadable kernel module in the 2.4 and 2.6 Linux kernels.
In addition to providing the ability to direct files to file systems, UmbrellaFS enables different decisions at other layers of the storage stack. In particular, alternate page cache writeback methods are presented through the use of UmbrellaFS. A multiple queue strategy based on file sequentiality and a sorting strategy are presented as alternatives to standard Linux cache writeback protocols. These strategies are implemented in a 2.6 Linux kernel and show improvements in a variety of benchmarks and tests.
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The Design, Fabrication, and Characterization of Waffle-substrate-based n-channel IGBTs in 4H-SiCMd monzurul Alam (11184600) 27 July 2021 (has links)
<div>Power semiconductor devices play an important role in many areas, including household</div><div>appliances, electric vehicles, high speed trains, electric power stations, and renewable energy</div><div>conversion. In the modern era, silicon based devices have dominated the semiconductor</div><div>market, including power electronics, because of their low cost and high performance. The</div><div>applications of devices rated 600 V - 6.5 kV are still dominated by silicon devices, but they</div><div>are nearly reaching fundamental material limits. New wide band gap materials such as silicon</div><div>carbide (SiC) offer significant performance improvements due to superior material properties</div><div>for such applications in and beyond this voltage range. 4H-SiC is a strong candidate</div><div>among other wide band gap materials because of its high critical electric field, high thermal</div><div>conductivity, compatibility with silicon processing techniques, and the availability of high</div><div>quality conductive substrates.</div><div>Vertical DMOSFETs and insulated gate bipolar transistors (IGBT) are key devices for</div><div>high voltage applications. High blocking voltages require thick drift regions with very light</div><div>doping, leading to specific on-resistance (R<sub>ON,SP</sub> ) that increases with the square of blocking</div><div>voltage (V<sub>BR</sub>). In theory, superjunction drift regions could provide a solution because of a</div><div>linear dependence of R<sub>ON,SP</sub> on V<sub>BR</sub> when charge balance between the pillars is achieved</div><div>through extremely tight process control. In this thesis, we have concluded that superjunction</div><div>devices inevitably have at least some level of charge imbalance which leads to a quadratic</div><div>relationship between V<sub>BR</sub> and R<sub>ON,SP</sub> . We then proposed an optimization methodology to</div><div>achieve improved performance in the presence of this inevitable imbalance.</div><div>On the other hand, an IGBT combines the benefits of a conductivity modulated drift</div><div>region for significantly reduced specific on-resistance with the voltage controlled input of a</div><div>MOSFET. Silicon carbide n-channel IGBTs would have lower conduction losses than equivalent</div><div>DMOSFETs beyond 6.5 kV, but traditionally have not been feasible below 15 kV. This</div><div>is due to the fact that the n+ substrate must be removed to access the p+ collector of the</div><div>IGBT, and devices below 15 kV have drift layers too thin to be mechanically self-supporting.</div><div>In this thesis, we have demonstrated the world’s first functional 10 kV class n-IGBT with</div><div>a waffle substrate through simulation, process development, fabrication and characterization.</div><div><div>The waffle substrate would provide the required mechanical support for this class of devices.</div><div>The fabricated IGBT has exhibited a differential R<sub>ON,SP</sub> of 160 mohm</div><div>.cm<sup>2</sup>, less than half of</div><div>what would be expected without conductivity modulation. An extensive fabrication process</div><div>development for integrating a waffle substrate into an active IGBT structure is described</div><div>in this thesis. This process enables an entirely new class of moderate voltage SiC IGBTs,</div><div>opening up new applications for SiC power devices.</div></div>
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