Thesis (M.S.E.C.E.)--University of Delaware, 2007. / Principal faculty advisor: Dennis W. Prather, Dept. of Electrical and Computer Engineering. Includes bibliographical references.

No description available.

Call number: LD2668 .T4 1963 F76 / Master of Science

Correlated double sampling (CDS) is a widely used signal processing technique for removal of the Nyquist (reset) noise which is associated with charge sensing circuits employed in a solid state imager. In this thesis work, the power spectral density at the output of a correlated double sampling circuit with first-order low-pass filtered white noise at the input is calculated. A circuit constructed with discrete elements is made to simulate the output stage of a charge-coupled device (CCD). A low-pass filtered wide-band noise from a noise generator is added to the reset reference level when the output signal from this simulator is sampled by the correlated double sampling technique. The experiment measurements show that only about 10% of the noise power measured by simple sampling is obtained when CDS is employed. An autoregressive (AR) model is assumed to fit the sampled data and a recursive algorithm, based on least-squares solutions for the AR parameters using forward and backward linear prediction, is adopted for spectrum estimation. Some conclusions on choosing the bandwidth of the low pass filter for optimum operation is also included.

Apresentamos um estudo sistemático das propriedades eletrônicas e estruturais dos elementos N, P e AS em SI e GE amorfos. Primeiramente, utilizamos o método de Monte Carlo para gerar as configurações amorfas iniciais. Nesta etapa as interações atômicas são descritas pelos potencias de Tersoff. A partir do modelo inicial para os sistemas desordenados, as propriedades eletrônicas e estruturais são determinadas usando a teoria do funcional da densidade e os pseudopotenciais de Bachelet-Hamann-Schlüter. Concluímos que as impurezas de P e AS são estáveis em sítios tricoordenados e metaestáveis em sítios tetracoordenados para os dois sistemas hospedeiros. Por outro lado a impureza de N apresenta um comportamento diferente. Este átomo é estável em sítios tricoordenados para ambos os hospedeiros, mas em sítios tetracoordenados ele é instável no a-SI e metaestável no a-GE. Discutimos a relevância de nossos resultados relacionados com a dopagem tipo-n de semicondutores amorfos hidrogenados. / The electronic and structural properties of the elements N, P and AS in amorphous SI and GE are systematically investigated. The calculation procedure is based on two approaches. First, we have used the Monte Carlo method to generate the initial amorphous configurations. A reliable description of the atomic interaction is provided by using the Tersoff potentials. Having the initial model for the amorphous structure, we analyzed the electronic and structural configurations within the framework of the density-functional theory and the Bachelet-Hamann-Schlüter pseudopotentials. We found that the P and AS impurities are stable in 3-fold coordinated sites and metastable in 4-fold coordinated sites for both host systems. On the other hand, the N impurity presents a different behavior. This atom is stable in 3-fold coordinated sites for both host systems but in 4-fold coordinated sites it is unstable in a-SI and metastable in a-GE. The relevance of these results for the n-type doping in hydrogenated amorphous semiconductors is discussed.

Apresentamos um estudo sistemático das propriedades eletrônicas e estruturais dos elementos N, P e AS em SI e GE amorfos. Primeiramente, utilizamos o método de Monte Carlo para gerar as configurações amorfas iniciais. Nesta etapa as interações atômicas são descritas pelos potencias de Tersoff. A partir do modelo inicial para os sistemas desordenados, as propriedades eletrônicas e estruturais são determinadas usando a teoria do funcional da densidade e os pseudopotenciais de Bachelet-Hamann-Schlüter. Concluímos que as impurezas de P e AS são estáveis em sítios tricoordenados e metaestáveis em sítios tetracoordenados para os dois sistemas hospedeiros. Por outro lado a impureza de N apresenta um comportamento diferente. Este átomo é estável em sítios tricoordenados para ambos os hospedeiros, mas em sítios tetracoordenados ele é instável no a-SI e metaestável no a-GE. Discutimos a relevância de nossos resultados relacionados com a dopagem tipo-n de semicondutores amorfos hidrogenados. / The electronic and structural properties of the elements N, P and AS in amorphous SI and GE are systematically investigated. The calculation procedure is based on two approaches. First, we have used the Monte Carlo method to generate the initial amorphous configurations. A reliable description of the atomic interaction is provided by using the Tersoff potentials. Having the initial model for the amorphous structure, we analyzed the electronic and structural configurations within the framework of the density-functional theory and the Bachelet-Hamann-Schlüter pseudopotentials. We found that the P and AS impurities are stable in 3-fold coordinated sites and metastable in 4-fold coordinated sites for both host systems. On the other hand, the N impurity presents a different behavior. This atom is stable in 3-fold coordinated sites for both host systems but in 4-fold coordinated sites it is unstable in a-SI and metastable in a-GE. The relevance of these results for the n-type doping in hydrogenated amorphous semiconductors is discussed.

Thesis (Ph.D.)--University of Nevada, Reno, 2005. / "August, 2005." Includes bibliographical references (leaves 74-75). Online version available on the World Wide Web.

University of Macau / Faculty of Science and Technology / Department of Electrical and Electronics Engineering

Thesis (M.S.)--Oregon State University, 2001. / Typescript (photocopy). Includes bibliographical references (leaves 33-35). Also available online.

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