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Understanding the impact of bulk traps on GaN HEMT DC and RF characteristicsKalavagunta, Aditya. January 2009 (has links)
Thesis (Ph. D. in Electrical Engineering)--Vanderbilt University, May 2009. / Title from title screen. Includes bibliographical references.
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A charge based power MOSFET model /Budihardjo, Irwan Kukuh. January 1995 (has links)
Thesis (Ph. D.)--University of Washington, 1995. / Vita. Includes bibliographical references (leaves [80]-83).
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Study of reliability mechanisms and their interaction in nanoscale CMOSFETsMishra, Rahul, January 2008 (has links)
Thesis (Ph.D.)--George Mason University, 2008. / Vita: p. 121. Thesis director: Dimitris E. Ioannou. Submitted in partial fulfillment of the requirements for the degree of Doctor of Philosophy in Electrical and Computer Engineering. Title from PDF t.p. (viewed Jan. 11, 2009). Includes bibliographical references (p. 111-120). Also issued in print.
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GaAs MESFET modeling and its applicationsHo, Wai. January 1993 (has links)
Thesis (M.S.)--Ohio University, November, 1993. / Title from PDF t.p.
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Computerized evaluation of parameters for HEMT, DC and microwave S parameter modelsChen, Lu. January 1995 (has links)
Thesis (M.S.)--Ohio University, November, 1995. / Title from PDF t.p.
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1/f AM and PM noise in a common source heterojunction field effect transistor amplifierCardon, Christopher Don. January 2007 (has links)
Thesis (M.S.)--University of Wyoming, 2007. / Title from PDF title page (viewed on July 28, 2008). Includes bibliographical references (p. 61-62).
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Buried-channel silicon carbide MOSFETS /Wagner, William E., January 1997 (has links)
Thesis (Ph. D.)--Lehigh University, 1997. / Includes vita. Bibliography: leaves 117-141.
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Investigation of electrical characteristics of III-V MOS devices with silicon interface passivation layerZhu, Feng, January 1900 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2008. / Vita. Includes bibliographical references.
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Surface and interface modification of alternative semiconductor materials for advanced transistorsJiang, Qi, January 2009 (has links)
Thesis (M.S.)--Rutgers University, 2009. / "Graduate Program in Chemistry and Chemical Biology." Includes bibliographical references (p. 29-31).
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Reliability of advanced dielectrics in gate oxide and device level packaging in MEMSRahman, Mohammad Shahriar. January 2009 (has links)
Thesis (Ph.D.)--University of Texas at Arlington, 2009.
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