Spelling suggestions: "subject:"electron channeling"" "subject:"alectron channeling""
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Quantum theory of electron channeling in crystalsJohnson, E. January 1986 (has links)
No description available.
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A study of fatigue in single crystal copper using electron channelling contrast imagingAhmed, Jaoued January 1998 (has links)
No description available.
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Energy Loss by Channeled Electrons: A Quantitative Study on Transition Metal OxidesRusz, Ján, Muto, Shunsuke, Tatsumi, Kazuyoshi 12 1900 (has links)
No description available.
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Local electronic structure analysis by site-selective ELNES using electron channeling and first-principles calculationsMuto, Shunsuke, Tatsumi, Kazuyoshi 02 1900 (has links)
No description available.
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Application of Forward Modeling to Materials CharacterizationSingh, Saransh 01 August 2017 (has links)
The four pillars of material science and engineering namely structure, processing, properties and performance form the so-called material paradigm. At the heart of the material paradigm is materials characterization, which is used to measure and identify the relationships. Materials Characterization typically reconstructing the conditions giving rise to a measurement, a classic inverse problem. The solutions of these inverse problems are under or over determined and not unique. The solutions of these inverse problems can be greatly improved if accurate forward models exist for these characterization experiments. In this thesis, we will be focusing of developing forward models for electron diffraction modalities. Specifically, four different forward models for electron diffraction, namely the Electron Backscatter Diffraction, Electron Channeling Patterns, Precession Electron Diffraction and Transmission kikuchi Diffraction modalities are presented. Further, these forward models are applied to important materials characterization problems, including diffraction pattern indexing using the dictionary approach and forward model based orientation refinement. Finally, a novel pole figure inversion algorithm using the cubochoric representation and model based iterative reconstruction is also presented.
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Bridging the Gap: Probing Structure-Property Relationships in Functional Materials through Advanced Electron Microscopy Based CharacterizationDeitz, Julia January 2018 (has links)
No description available.
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Site occupancy determination of Eu/Y doped in Ca2SnO4 phosphor by electron channeling microanalysisYamane, H., Kawano, T., Tatsumi, K., Fujimichi, Y., Muto, S. 05 1900 (has links)
No description available.
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Epitaxy and Characterization of Metamorphic Semiconductorsfor III-V/Si Multijunction PhotovoltaicsBoyer, Jacob Tyler January 2020 (has links)
No description available.
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