NDLTD Global ETD Search
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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

Search results

Showing 161 to 170 of 509 (0.063 seconds)

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161

Understanding the impact of bulk traps on GaN HEMT DC and RF characteristics

Kalavagunta, Aditya. January 2009 (has links)
Thesis (Ph. D. in Electrical Engineering)--Vanderbilt University, May 2009. / Title from title screen. Includes bibliographical references.
162

A charge based power MOSFET model /

Budihardjo, Irwan Kukuh. January 1995 (has links)
Thesis (Ph. D.)--University of Washington, 1995. / Vita. Includes bibliographical references (leaves [80]-83).
163

Study of reliability mechanisms and their interaction in nanoscale CMOSFETs

Mishra, Rahul, January 2008 (has links)
Thesis (Ph.D.)--George Mason University, 2008. / Vita: p. 121. Thesis director: Dimitris E. Ioannou. Submitted in partial fulfillment of the requirements for the degree of Doctor of Philosophy in Electrical and Computer Engineering. Title from PDF t.p. (viewed Jan. 11, 2009). Includes bibliographical references (p. 111-120). Also issued in print.
164

GaAs MESFET modeling and its applications

Ho, Wai. January 1993 (has links)
Thesis (M.S.)--Ohio University, November, 1993. / Title from PDF t.p.
165

Computerized evaluation of parameters for HEMT, DC and microwave S parameter models

Chen, Lu. January 1995 (has links)
Thesis (M.S.)--Ohio University, November, 1995. / Title from PDF t.p.
166

1/f AM and PM noise in a common source heterojunction field effect transistor amplifier

Cardon, Christopher Don. January 2007 (has links)
Thesis (M.S.)--University of Wyoming, 2007. / Title from PDF title page (viewed on July 28, 2008). Includes bibliographical references (p. 61-62).
167

Buried-channel silicon carbide MOSFETS /

Wagner, William E., January 1997 (has links)
Thesis (Ph. D.)--Lehigh University, 1997. / Includes vita. Bibliography: leaves 117-141.
168

Investigation of electrical characteristics of III-V MOS devices with silicon interface passivation layer

Zhu, Feng, January 1900 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2008. / Vita. Includes bibliographical references.
169

Surface and interface modification of alternative semiconductor materials for advanced transistors

Jiang, Qi, January 2009 (has links)
Thesis (M.S.)--Rutgers University, 2009. / "Graduate Program in Chemistry and Chemical Biology." Includes bibliographical references (p. 29-31).
170

Reliability of advanced dielectrics in gate oxide and device level packaging in MEMS

Rahman, Mohammad Shahriar. January 2009 (has links)
Thesis (Ph.D.)--University of Texas at Arlington, 2009.

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