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Very large integrated pH-ion sensitive field effect transistor sensor array chip /Yeow, Terence Chung Wen. Unknown Date (has links)
Thesis (PhD)--University of South Australia, 1996
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Gate capacitance as a monitor for studying MOS transistor degradation by electrical stressing /Kiat, Ah Lian. Unknown Date (has links)
Thesis (MEng)--University of South Australia, 1995
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The electronic structure and field effects of an organic-based room temperature magnetic semiconductorLincoln, Derek M. January 2007 (has links)
Thesis (Ph. D.)--Ohio State University, 2007. / Full text release at OhioLINK's ETD Center delayed at author's request
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MOSFET RF characterization using bulk and SOI CMOS technologies /Saijets, Jan. January 1900 (has links) (PDF)
Thesis (doctoral)--Helsinki University of Technology, 2007. / Includes bibliographical references (p. 161-171). Also available on the World Wide Web.
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The degradation and time-dependent breakdown of p-type MOSFETS with a high-k dielectric /Yust, Brian. January 1900 (has links)
Thesis (M.S.)--Texas State University-San Marcos, 2008. / Vita. Includes bibliographical references (leaf 77). Also available on microfilm.
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A procedure to verify the accuracy of delivery of prescribed radiation doses in radiotherapy : a thesis submitted in partial fulfilment of the requirements for the degree of Master of Science in Medical Physics in the University of Canterbury /Peszynski, R. I. January 2008 (has links)
Thesis (M. Sc.)--University of Canterbury, 2008. / Typescript (photocopy). Includes bibliographical references (p. 87-89). Also available via the World Wide Web.
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Reliability study of enhancement-mode AIGaN/GaN HEMT fabricated with fluorine plasma treatment technology /Yi, Congwen. January 2008 (has links)
Thesis (M.Phil.)--Hong Kong University of Science and Technology, 2008. / Includes bibliographical references (leaves 76-87). Also available in electronic version.
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Understanding the impact of bulk traps on GaN HEMT DC and RF characteristicsKalavagunta, Aditya. January 2009 (has links)
Thesis (Ph. D. in Electrical Engineering)--Vanderbilt University, May 2009. / Title from title screen. Includes bibliographical references.
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A charge based power MOSFET model /Budihardjo, Irwan Kukuh. January 1995 (has links)
Thesis (Ph. D.)--University of Washington, 1995. / Vita. Includes bibliographical references (leaves [80]-83).
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Study of reliability mechanisms and their interaction in nanoscale CMOSFETsMishra, Rahul, January 2008 (has links)
Thesis (Ph.D.)--George Mason University, 2008. / Vita: p. 121. Thesis director: Dimitris E. Ioannou. Submitted in partial fulfillment of the requirements for the degree of Doctor of Philosophy in Electrical and Computer Engineering. Title from PDF t.p. (viewed Jan. 11, 2009). Includes bibliographical references (p. 111-120). Also issued in print.
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