Introduction. A part of the standard testing procedure on high voltage cables is the measuring of the volume resistivity in the different semi-conductive layers. A need for improvement has been realized because of the increased frequency of testing, which is a result of the recent expansion of cable production of NKT in Karlskrona. Objective. The objectives of the thesis are to firstly discover what the needs are for improvements within the method of conducting volume resistivity measurements on high voltage cables. Secondly, following these discoveries, solving the problems by developing new products. Method. The method for the thesis work is divided into two parts, performing a case study on the current measurement method, and product development for the new solutions. The case study was conducted mainly by gathering empirical data through interviews and observations. The product development process started with ideation for solutions, followed by prototyping, and lastly, a validation process to test the new solutions through experiments and lead used testing. The entirety of the work was conducted through a design thinking approach. Result. From the case study it was discovered that two main issues needed to be addressed, being a new solution for a measurement rig, and a way to streamline the painting and taping process. A new design for a measurement rig was invented. The new solution contains two rigs, which allows for more samples to be heated simultaneously, halving the preheating time when testing four samples from the current measurement method. A preparation station was also created to aid the operators with the taping and painting, which resulted in a 40% reduced time for these tasks. Conclusion. By implementing new products, the measurement method for conducting volume resistivity has been improved by time effectiveness, robustness, and reliability.

This thesis is focused on the description of the method of reactive sputtering of thin films. Currently, there are many ways how to create thin films and there are many applications of thin films in various industrial sectors. In this paper at the first are listed the issue of thin films, followed by an overview of the deposition techniques and of the chemical analysis of deposited thin films. It also describes the four-point measurement method of sheet resistance, mechanical test of adhesion and optical properties. At the end of the theoretical part are described the material composition of the deposited films. The goal of the practical part is to optimize the deposition process of the mixed layer of indium tin oxide (In2O3: SnO2) and contribute to the overall understanding of the influence of annealing on the layer. There were created six series of samples with that applied layers. First, the work focused on examining of the influence of annealing on the throughput in the whole measuring range, and then comparing the series due to the transmittance in the visible light spectrum. Furthermore were compared the value of sheet resistance of unannealed and subsequently annealed samples.