Communication technology has become indispensable in a modernsociety. Its importance is growing day by day. One of the main reasonsbehind this growth is the advancement in the analog and mixed signalcircuit design.Analog to digital converter (ADC) is an essential part in a modernreceiver system. Its development is driven by the progress of CMOStechnologies with an aim to reduce area and power consumption. In thearea of RF integrated circuits for wireless application low operationalvoltage, and less current consumption are the central aspects of thedesign. The aim of this master thesis is the development and design ofa low-power analog to digital converter for RF applications.The basic specifications are:· High Speed, Low Current (1.5 V supply voltage)· Maximum input frequency 3.5 MHz· 8-bit resolution· Sampling rate < 100 MHzThus, this work comprises a theoretical concept phase in whichdifferent ADC topologies will be investigated. Based on which anappropriate ADC architecture will be fixed. Later, the chosen design willbe implemented in an industrial 130 nm CMOS process.

Este trabalho apresenta estudos voltados ao teste de Amplificadores Diferenciais. No primeiro momento, por meio de simulações SPICE, falhas catastróficas são injetadas em dois Amplificadores Diferenciais, projetados para uma tecnologia CMOS de 0,5m com configurações complementares, a fim de comprovar a ocorrência de variações nas tensões DC dos nós do circuito sob teste à medida que há injeções de falhas no mesmo. Também se faz análises preliminares dos resultados para verificar a possibilidade de diagnosticar as falhas através de assinaturas compostas pela digitalização (em um bit) dos valores DC dos nós do circuito sob teste. Posteriormente, é desenvolvida uma metodologia de teste simples e com baixo custo, aplicável a Amplificadores Totalmente Diferenciais. Considerando a necessidade do Circuito de Realimentação de Modo Comum para manter o controle do modo comum das saídas, é proposta a reutilização deste circuito como verificador, possibilitando a observação de falhas ocorridas tanto no Amplificador quanto no próprio bloco de CMFB. Falhas catastróficas e paramétricas são injetadas, por simulação, em dois amplificadores totalmente diferenciais, um projetado em 180nm e outro em 130nm. Testes DC e transientes são realizados e a cobertura de falhas é avaliada. Os resultados das simulações apontam boa cobertura de falhas, enquanto apenas os sinais de realimentação de modo comum precisam ser monitorados. Dessa forma é proposta uma estratégia de teste que apresenta um baixo custo e uma baixa sobrecarga de área do circuito. / This work presents a study related to the testing of Differential Amplifiers. Firstly, by means of SPICE simulations, catastrophic faults are injected in two complementary Differential Amplifiers, designed considering a 0,5μm CMOS technology, in order to prove the concept of testing the circuit by checking the occurrence of variations in the DC voltage of the circuit internal nodes due to the injected faults. The possibility of diagnosing faults using a digitized representation of the DC values of the observed nodes of the circuit was also investigated. Then, a simple and cost-effective test methodology for Fully Differential Amplifiers (FDA) is proposed. Considering the need of the common mode feedback circuit to maintain the control of the common mode output voltage, it is proposed to re-use this circuit as a checker, allowing the observation of faults in both the amplifier itself and the CMFB block. Catastrophic and parametric faults are injected in two FDAs, designed in 180nm and 130nm technology respectively. DC and transient tests are performed and the fault coverage is evaluated. The simulation results indicate high fault coverage, while only the signals from the common mode feedback need to be monitored. This way a low cost and low overhead test methodology is proposed.

Este trabalho apresenta estudos voltados ao teste de Amplificadores Diferenciais. No primeiro momento, por meio de simulações SPICE, falhas catastróficas são injetadas em dois Amplificadores Diferenciais, projetados para uma tecnologia CMOS de 0,5m com configurações complementares, a fim de comprovar a ocorrência de variações nas tensões DC dos nós do circuito sob teste à medida que há injeções de falhas no mesmo. Também se faz análises preliminares dos resultados para verificar a possibilidade de diagnosticar as falhas através de assinaturas compostas pela digitalização (em um bit) dos valores DC dos nós do circuito sob teste. Posteriormente, é desenvolvida uma metodologia de teste simples e com baixo custo, aplicável a Amplificadores Totalmente Diferenciais. Considerando a necessidade do Circuito de Realimentação de Modo Comum para manter o controle do modo comum das saídas, é proposta a reutilização deste circuito como verificador, possibilitando a observação de falhas ocorridas tanto no Amplificador quanto no próprio bloco de CMFB. Falhas catastróficas e paramétricas são injetadas, por simulação, em dois amplificadores totalmente diferenciais, um projetado em 180nm e outro em 130nm. Testes DC e transientes são realizados e a cobertura de falhas é avaliada. Os resultados das simulações apontam boa cobertura de falhas, enquanto apenas os sinais de realimentação de modo comum precisam ser monitorados. Dessa forma é proposta uma estratégia de teste que apresenta um baixo custo e uma baixa sobrecarga de área do circuito. / This work presents a study related to the testing of Differential Amplifiers. Firstly, by means of SPICE simulations, catastrophic faults are injected in two complementary Differential Amplifiers, designed considering a 0,5μm CMOS technology, in order to prove the concept of testing the circuit by checking the occurrence of variations in the DC voltage of the circuit internal nodes due to the injected faults. The possibility of diagnosing faults using a digitized representation of the DC values of the observed nodes of the circuit was also investigated. Then, a simple and cost-effective test methodology for Fully Differential Amplifiers (FDA) is proposed. Considering the need of the common mode feedback circuit to maintain the control of the common mode output voltage, it is proposed to re-use this circuit as a checker, allowing the observation of faults in both the amplifier itself and the CMFB block. Catastrophic and parametric faults are injected in two FDAs, designed in 180nm and 130nm technology respectively. DC and transient tests are performed and the fault coverage is evaluated. The simulation results indicate high fault coverage, while only the signals from the common mode feedback need to be monitored. This way a low cost and low overhead test methodology is proposed.

Este trabalho apresenta estudos voltados ao teste de Amplificadores Diferenciais. No primeiro momento, por meio de simulações SPICE, falhas catastróficas são injetadas em dois Amplificadores Diferenciais, projetados para uma tecnologia CMOS de 0,5m com configurações complementares, a fim de comprovar a ocorrência de variações nas tensões DC dos nós do circuito sob teste à medida que há injeções de falhas no mesmo. Também se faz análises preliminares dos resultados para verificar a possibilidade de diagnosticar as falhas através de assinaturas compostas pela digitalização (em um bit) dos valores DC dos nós do circuito sob teste. Posteriormente, é desenvolvida uma metodologia de teste simples e com baixo custo, aplicável a Amplificadores Totalmente Diferenciais. Considerando a necessidade do Circuito de Realimentação de Modo Comum para manter o controle do modo comum das saídas, é proposta a reutilização deste circuito como verificador, possibilitando a observação de falhas ocorridas tanto no Amplificador quanto no próprio bloco de CMFB. Falhas catastróficas e paramétricas são injetadas, por simulação, em dois amplificadores totalmente diferenciais, um projetado em 180nm e outro em 130nm. Testes DC e transientes são realizados e a cobertura de falhas é avaliada. Os resultados das simulações apontam boa cobertura de falhas, enquanto apenas os sinais de realimentação de modo comum precisam ser monitorados. Dessa forma é proposta uma estratégia de teste que apresenta um baixo custo e uma baixa sobrecarga de área do circuito. / This work presents a study related to the testing of Differential Amplifiers. Firstly, by means of SPICE simulations, catastrophic faults are injected in two complementary Differential Amplifiers, designed considering a 0,5μm CMOS technology, in order to prove the concept of testing the circuit by checking the occurrence of variations in the DC voltage of the circuit internal nodes due to the injected faults. The possibility of diagnosing faults using a digitized representation of the DC values of the observed nodes of the circuit was also investigated. Then, a simple and cost-effective test methodology for Fully Differential Amplifiers (FDA) is proposed. Considering the need of the common mode feedback circuit to maintain the control of the common mode output voltage, it is proposed to re-use this circuit as a checker, allowing the observation of faults in both the amplifier itself and the CMFB block. Catastrophic and parametric faults are injected in two FDAs, designed in 180nm and 130nm technology respectively. DC and transient tests are performed and the fault coverage is evaluated. The simulation results indicate high fault coverage, while only the signals from the common mode feedback need to be monitored. This way a low cost and low overhead test methodology is proposed.

The aim of this thesis is to design an amplifier for electrostatic and dynamic headphones with D/A converter integrated into one device. This device is controlled by a microcontroller The thesis deals mainly with the design, realisation and testing of all functional blocks of the device.

CDMA channel selection requires sharp as well as wide-band Filtering. SAW Filters which have been used for this purpose are only available in IF range. In direct conversion receivers this has to be done at low frequencies. Switched Capacitor technique has been employed to design a low power, highly selective low-pass channel select Filter for CDMA wireless receivers. The topology which has been chosen ensures the low sensitivity of the Filter response. The circuit has been designed in a mixed-mode 0. 18u CMOS technology working with a single supply of 1. 8 V while its current consumption is less than 10 mA.

CDMA channel selection requires sharp as well as wide-band Filtering. SAW Filters which have been used for this purpose are only available in IF range. In direct conversion receivers this has to be done at low frequencies. Switched Capacitor technique has been employed to design a low power, highly selective low-pass channel select Filter for CDMA wireless receivers. The topology which has been chosen ensures the low sensitivity of the Filter response. The circuit has been designed in a mixed-mode 0. 18u CMOS technology working with a single supply of 1. 8 V while its current consumption is less than 10 mA.

Accelerometer sensors fabricated with micromachining technologies started to take place of yesterday&rsquo / s bulky sensors in many application areas. The application areas include a wide range from consumer electronics and health systems to military and aerospace applications. Therefore, the performance requirements extend form 1 &mu / g&rsquo / s to 100 thousand g&rsquo / s. However, high performance strategic grade MEMS accelerometer sensors still do not exist in the literature. Smart designs utilizing the MEMS technology is necessary in order to acquire high performance specifications. This thesis reports a high performance accelerometer with a new process by making the use of bulk micromachining technology. The new process includes the utilization of Silicon-on-Insulator (SOI) wafer and its buried oxide (BOX) layer. The BOX layer helps to realize interdigitated finger structures, which commonly find place in surface micromachined CMOS-MEMS capacitive accelerometers. The multi-metal layered CMOS-MEMS devices inherently incorporate interdigitated finger structures. Interdigitated finger structures are highly sensitive to acceleration in comparison with comb-finger structures, which generally find usage in bulk-micromachined devices, due to absence of anti-gap. The designed sensors based on this fabrication process is sought to form a fully-differential signal interfaced sensor with incorporation of the advantages of high sensitive interdigitated finger electrodes and high aspect ratio SOI wafer&rsquo / s bulk single crystal silicon device. Under the light of the envisaged process, sensor designs were made, and verified using a computing environment, MATLAB, and a finite element analysis simulator, CoventorWARE. The verified two designs were fabricated, and all the tests, except the centrifuge test, were made at METU-MEMS Research Center. Among the fabricated sensors, the one designed for the high performance achieves a capacitance sensitivity of 178 fF with a rest capacitance of 8.1 pF by employing interdigitated finger electrodes, while its comb-finger implementation can only achieve a capacitance sensitivity of 75 fF with a rest capacitance of 10 pF.

abstract: A dual-channel directional digital hearing aid (DHA) front-end using a fully differential difference amplifier (FDDA) based Microphone interface circuit (MIC) for a capacitive Micro Electro Mechanical Systems (MEMS) microphones and an adaptive-power analog font end (AFE) is presented. The Microphone interface circuit based on FDDA converts the capacitance variations into voltage signal, achieves a noise of 32 dB SPL (sound pressure level) and an SNR of 72 dB, additionally it also performs single to differential conversion allowing for fully differential analog signal chain. The analog front-end consists of 40dB VGA and a power scalable continuous time sigma delta ADC, with 68dB SNR dissipating 67u¬W from a 1.2V supply. The ADC implements a self calibrating feedback DAC, for calibrating the 2nd order non-linearity. The VGA and power scalable ADC is fabricated on 0.25 um CMOS TSMC process. The dual channels of the DHA are precisely matched and achieve about 0.5dB gain mismatch, resulting in greater than 5dB directivity index. This will enable a highly integrated and low power DHA / Dissertation/Thesis / Ph.D. Electrical Engineering 2011

Vast attention has been paid to active continuous-time filters over the years. Thus as the cheap, readily available integrated circuit OpAmps replaced their discrete circuit versions, it became feasible to consider active-RC filter circuits using large numbers of OpAmps. Similarly the development of integrated operational transconductance amplifier (OTA) led to new filter configurations. This gave rise to OTA-C filters, using only active devices and capacitors, making it more suitable for integration. The demands on filter circuits have become ever more stringent as the world of electronics and communications has advanced. In addition, the continuing increase in the operating frequencies of modern circuits and systems increases the need for active filters that can perform at these higher frequencies; an area where the LC active filter emerges. What mainly limits the performance of an analog circuit are the non-idealities of the used building blocks and the circuit architecture. This research concentrates on the design issues of high frequency continuous-time integrated filters. Several novel circuit building blocks are introduced. A novel pseudo-differential fully balanced fully symmetric CMOS OTA architecture with inherent common-mode detection is proposed. Through judicious arrangement, the common-mode feedback circuit can be economically implemented. On the level of system architectures, a novel filter low-voltage 4th order RF bandpass filter structure based on emulation of two magnetically coupled resonators is presented. A unique feature of the proposed architecture is using electric coupling to emulate the effect of the coupled-inductors, thus providing bandwidth tuning with small passband ripple. As part of a direct conversion dual-mode 802.11b/Bluetooth receiver, a BiCMOS 5th order low-pass channel selection filter is designed. The filter operated from a single 2.5V supply and achieves a 76dB of out-of-band SFDR. A digital automatic tuning system is also implemented to account for process and temperature variations. As part of a Bluetooth transmitter, a low-power quadrature direct digital frequency synthesizer (DDFS) is presented. Piecewise linear approximation is used to avoid using a ROM look-up table to store the sine values in a conventional DDFS. Significant saving in power consumption, due to the elimination of the ROM, renders the design more suitable for portable wireless communication applications.