Luk, Wai Chun = / Thesis (M.Phil.)--Chinese University of Hong Kong, 2010. / Includes bibliographical references (leaves 101-108). / Abstracts in English and Chinese. / Luk, Wai Chun = / Chapter 1 --- Introduction --- p.1 / Chapter 2 --- Theoretical Background --- p.5 / Chapter 2.1 --- Maxwell´ةs equations in matter --- p.5 / Chapter 2.2 --- Dielectric constant of materials --- p.8 / Chapter 2.3 --- Dispersion relation of surface plasmon polaritons --- p.10 / Chapter 2.4 --- Excitation of surface plasmon polaritons --- p.16 / Chapter 2.4.1 --- Prism coupling --- p.17 / Chapter 2.4.2 --- Grating coupling --- p.21 / Chapter 2.5 --- Diffraction of light in gratings --- p.26 / Chapter 2.6 --- Applications --- p.27 / Chapter 3 --- Analysis Methods --- p.29 / Experimental Section --- p.29 / Chapter 3.1 --- Interference Lithography --- p.29 / Chapter 3.2 --- Gold grating fabrication --- p.32 / Chapter 3.2.1 --- Substrate preparation --- p.33 / Chapter 3.2.2 --- Photoresist preparation --- p.34 / Chapter 3.2.3 --- Spin coating of omnicoat and photoresist --- p.35 / Chapter 3.2.4 --- Interference lithography set-up and procedures --- p.35 / Chapter 3.2.5 --- The post-exposed treatments --- p.37 / Chapter 3.2.6 --- The optimal exposure time calibration --- p.37 / Chapter 3.2.7 --- Gold thin film deposition --- p.39 / Chapter 3.2.8 --- Typical gold grating sample --- p.41 / Chapter 3.3 --- Measurement system --- p.41 / Chapter 3.3.1 --- The angle dependent reflectivity measurement --- p.42 / Chapter 3.3.2 --- Data presentation of a typical band structure --- p.45 / Chapter 3.3.3 --- Periodicity measurement of the grating samples --- p.48 / Chapter 3.3.4 --- Diffracted intensity measurement of gratings --- p.52 / Chapter 3.3.5 --- Data presentation of the angle dependent diffracted intensity measurement --- p.53 / Calculation Section --- p.54 / Chapter 3.4 --- RCWA simulations --- p.54 / Chapter 3.4.1 --- The dispersion relation --- p.56 / Chapter 3.4.2 --- The diffracted intensity --- p.56 / Chapter 3.4.3 --- The field pattern graphs --- p.57 / Chapter 4 --- Resonance modes in one-dimensional gold gratings --- p.60 / Chapter 4.1 --- Structure of the gold grating samples --- p.61 / Chapter 4.2 --- Results of angle dependent reflectivity --- p.63 / Chapter 4.2.1 --- Surface Plasmon Polaritons (SPPs) --- p.65 / Chapter 4.2.2 --- Wood´ةs anomaly --- p.65 / Chapter 4.2.3 --- Waveguide Resonance (WG) --- p.67 / Chapter 4.2.4 --- Coupling of SPPs and WG --- p.67 / Chapter 4.3 --- Results of angle dependent diffracted intensity measurement --- p.68 / Chapter 4.4 --- Basic properties of SPPs and WG modes by RCWA --- p.73 / Chapter 4.4.1 --- Sample 1 (D = 40 nm) --- p.74 / Chapter 4.4.1(a) --- λ = 980 nm of Sample 1 --- p.75 / Chapter 4.4.1(b) --- λ = 633 nm of Sample 1 --- p.81 / Chapter 4.4.2 --- Sample 2 (D = 390 nm) --- p.83 / Chapter 4.4.2(a) --- λ = 980 nm of Sample 2 --- p.85 / Chapter 4.4.2(b) --- λ = 725 nm of Sample 2 --- p.87 / Chapter 4.4.2(c) --- λ = 633 nm of Sample 2 --- p.92 / Chapter 4.5 --- Summary --- p.97 / Chapter 5 --- Conclusions --- p.99 / Bibliography --- p.101

Sham, Chun Hong = 金屬光栅光學特性的實驗和理論研究 / 沈鎮康. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2009. / Includes bibliographical references (leaves 109-111). / Abstract also in Chinese. / Sham, Chun Hong = Jin shu guang shan guang xue te xing de shi yan he li lun yan jiu / Shen Zhenkang. / Chapter 1 --- Introduction --- p.1 / Chapter 1.1 --- Background --- p.1 / Chapter 1.2 --- Overview of the Thesis --- p.2 / Chapter 2 --- Basic Theory --- p.4 / Chapter 2.1 --- Dielectric Constant of Metals --- p.5 / Chapter 2.2 --- The Maxwell´ةs Equations --- p.7 / Chapter 2.3 --- Scaling Properties of the Maxwell´ةs Equations --- p.9 / Chapter 2.4 --- Translational Symmetry and the Bloch´ةs Theorem --- p.10 / Chapter 2.4.1 --- Continuous Translational Symmetry --- p.11 / Chapter 2.4.2 --- Discrete Translational Symmetry --- p.12 / Chapter 2.4.3 --- Photonic Bloch´ةs Theorem --- p.13 / Chapter 3 --- Principles of Rigorous Coupled Wave Analysis --- p.14 / Chapter 3.1 --- Mathematical Formulation --- p.15 / Chapter 3.2 --- One-layer systems --- p.15 / Chapter 3.3 --- Layered Systems --- p.19 / Chapter 3.3.1 --- Matching Boundary Conditions --- p.19 / Chapter 3.3.2 --- The Transfer Matrices --- p.21 / Chapter 3.3.3 --- Scattering Matrices --- p.22 / Chapter 3.4 --- Calculation of Reflection and Transmission --- p.24 / Chapter 3.5 --- Calculation of Field Pattern --- p.26 / Chapter 3.5.1 --- Finding the Coefficients --- p.26 / Chapter 3.5.2 --- Summing to Get the Field --- p.27 / Chapter 3.6 --- 5-polarization --- p.27 / Chapter 3.7 --- Analogy to mechanics --- p.29 / Chapter 3.8 --- Conclusion --- p.30 / Chapter 4 --- Numerical Implementation of Rigorous Coupled Wave Analysis --- p.31 / Chapter 4.1 --- Finite Number of Terms --- p.31 / Chapter 4.2 --- Fourier Factorization Rule --- p.32 / Chapter 4.3 --- Calculation of Field Pattern --- p.34 / Chapter 4.4 --- Transfer Matrix for Forward Deduction --- p.36 / Chapter 4.5 --- Calculation of Time-Averaged Poynting Vector --- p.36 / Chapter 4.6 --- Convergence of RCWA --- p.37 / Chapter 4.7 --- Simple Examples --- p.40 / Chapter 4.7.1 --- Oblique Incidence on Vacuum --- p.40 / Chapter 4.7.2 --- Oblique Incidence on Semi-Infinite Glass --- p.41 / Chapter 4.7.3 --- Normal Incidence on a Thin Gold Film --- p.41 / Chapter 5 --- A Tunable All-Direction Light Absorber --- p.43 / Chapter 5.1 --- Description of the Absorber --- p.44 / Chapter 5.2 --- Tunability --- p.45 / Chapter 5.3 --- Theoretical Understanding on the Results --- p.46 / Chapter 5.4 --- Other EM modes Involved --- p.49 / Chapter 5.5 --- Structural Flexibility --- p.54 / Chapter 6 --- Sample Preparation Techniques --- p.57 / Chapter 6.1 --- Interference Lithography --- p.57 / Chapter 6.1.1 --- Basic Principle of IL --- p.58 / Chapter 6.1.2 --- Experimental Setup for IL --- p.59 / Chapter 6.1.3 --- Experimental Procedures for IL --- p.60 / Chapter 6.1.4 --- Tuning the Period --- p.61 / Chapter 6.1.5 --- Tuning Grating Width --- p.62 / Chapter 6.1.6 --- Tuning the grating height --- p.64 / Chapter 6.2 --- Sputtering --- p.65 / Chapter 6.2.1 --- Description of Sputtering System --- p.65 / Chapter 6.2.2 --- Effect of Varying the Position on Sample Holder --- p.66 / Chapter 6.3 --- Chemical deposition of silver --- p.69 / Chapter 7 --- Sample Characterization Techniques --- p.72 / Chapter 7.1 --- Scanning Electron Microscope --- p.72 / Chapter 7.1.1 --- Grating width measurement --- p.72 / Chapter 7.1.2 --- Sidewall Coverage Measurement --- p.73 / Chapter 7.2 --- Thickness Measurement --- p.74 / Chapter 7.3 --- Reflectance Measurement --- p.75 / Chapter 7.3.1 --- Experimental Setup --- p.76 / Chapter 7.3.2 --- Use of Prism --- p.79 / Chapter 8 --- Experimental Realization of All-Direction Light Absorber --- p.82 / Chapter 8.1 --- Reflectance of Glass Substrate --- p.82 / Chapter 8.2 --- Planar Metal-SU8-Metal Systems --- p.87 / Chapter 8.3 --- SU8 Grating on Glass Substrate --- p.89 / Chapter 8.4 --- SU8 Grating on Gold Substrate --- p.92 / Chapter 8.4.1 --- Grating on a Thick Layer of Gold --- p.93 / Chapter 8.4.2 --- Grating on a Thin Layer of Gold --- p.93 / Chapter 8.5 --- Cavities-Embedded Systems and Future Work --- p.96 / Chapter 8.6 --- Summary and Future Experimental Work --- p.100 / Chapter 9 --- Conclusion --- p.102 / Chapter A --- Notes on Glass Cleaning --- p.104 / Chapter B --- An Experiment on Sidewall Coverage --- p.107 / Bibliography --- p.109