Knowing the root cause of why an Integrated Circuit (1C) device fails to function properly is the key to provide the corrective measures to increase the yield and shorten the time to market. In recent years, electrical fault diagnosis method has received growing attention due to the effective and indispensable guiding role it plays in modern fault localization practice when physical measures are more and more confined by the shrinking feature size and condensed internal structure. While most of the fault diagnosis tools are based on gate level fault models, many faults are actually at the transistor level (the intra-gate fault). This thesis provides an innovative method to diagnose the intra-gate faults. It covers a wide range of different types of intra-gate faults. The method extends the capability of gate level fault diagnosis tools to the intra-gate domain by building connections with these intra-gate faults to particular types of gate level faults. Intra-gate faults are transformed to gate level representations so that they can be diagnosed directly by the widely available and well developed gate level diagnosis tools. Real diagnosis of intra-gate faults from wafer data and physical failure analysis photos are provided as solid proofs of the effectiveness of this method.

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The test of digital integrated circuits compares the test pattern results for the device under test (DUT) to the expected test pattern results of a standard reference. The standard response is typically obtained from simulations. The test pattern and response are created and evaluated assuming ideal test conditions. The standard response is normally stored within automated test equipment (ATE). However the use of ATE is the major contributor to the test cost. This thesis explores an alternative strategy to the standard response. As an alternative to the stored standard response, the response is estimated by fault tolerant technique. The purpose of the fault tolerant technique is to eliminate the need of standard response and enable online/real-time testing. Fault tolerant techniques use redundancy and majority voting to estimate the standard response. Redundancy in the circuit leads to fault aliasing. Fault aliasing misleads the majority voter in estimating the standard response. The statistics and phenomenon of aliasing are analyzed for benchmark circuits. The impact of fault aliasing on test with respect to coverage, test escape and over-kill is analyzed. The results show that aliasing can be detected with additional test vectors and get 100% fault coverage.