Spelling suggestions: "subject:"logic ingesting"" "subject:"logic andtesting""
1 |
VLSI testing for high reliability: Mixing IDDQ and logic testingHwang, Suntae January 1993 (has links)
No description available.
|
2 |
Conditional stuck-at fault model for PLA test generationCornelia, Olivian E. January 1987 (has links)
No description available.
|
3 |
Conditional stuck-at fault model for PLA test generationCornelia, Olivian E. January 1987 (has links)
No description available.
|
4 |
On Enhancing Deterministic Sequential ATPGDuong, Khanh Viet 15 March 2011 (has links)
This thesis presents four different techniques for improving the average-case performance of deterministic sequential circuit Automatic Test Patterns Generators (ATPG). Three techniques make use of information gathered during test generation to help identify more unjustifiable states with higher percentage of "don't care" value. An approach for reducing the search space of the ATPG was introduced. The technique can significantly reduce the size of the search space but cannot ensure the completeness of the search. Results on ISCAS–85 benchmark circuits show that all of the proposed techniques allow for better fault detection in shorter amounts of time. These techniques, when used together, produced test vectors with high fault coverages. Also investigated in this thesis is the Decision Inversion Problem which threatens the completeness of ATPG tools such as HITEC or ATOMS. We propose a technique which can eliminate this problem by forcing the ATPG to consider search space with certain flip-flops untouched. Results show that our technique eliminated the decision inversion problem, ensuring the soundness of the search algorithm under the 9-valued logic model. / Master of Science
|
5 |
A new fault model and its application in synthesizing Toffoli networksZhong, Jing 29 October 2008 (has links)
Reversible logic computing is a rapidly developing research area. Both reversible logic synthesis and testing reversible logic circuits are very important issues in this area. In this thesis, we present our work in these two aspects.
We consider a new fault model, namely the crosspoint fault, for reversible circuits. The effects of this kind of fault on the behaviour of the circuits are studied. A randomized test pattern generation algorithm targeting this kind of fault is introduced and analyzed. The relationship between the crosspoint faults and stuck-at faults is also investigated.
The crosspoint fault model is then studied for possible applications in reversible logic synthesis. One type of redundancy exists in Toffoli networks in the form of undetectable multiple crosspoint faults. So redundant circuits can be simplified by deleting those undetectable faults. The testability of multiple crosspoint faults is analyzed in detail. Several important properties are proved and integrated into the simplifying algorithm so as to speed up the process.
We also provide an optimized implementation of a Reed-Muller spectra based reversible logic synthesis algorithm. This new implementation uses a compact form of the Reed-Muller spectra table of the specified reversible function to save memory during execution. Experimental results are presented to illustrate the significant improvement of this new implementation.
|
6 |
Hardware Security through Design ObfuscationChakraborty, Rajat Subhra 04 May 2010 (has links)
No description available.
|
Page generated in 0.0723 seconds