Global ETD Search

21	Inversion of low energy electron diffraction IV spectra of reconstructed structure of SiC (0001) Ng, Tsz-kit, Victor. January 2000 (has links) Thesis (M. Phil.)--University of Hong Kong, 2001. / Includes bibliographical references (leaves 57-58).
22	Surface structure determination of Ga/Si (111) 3x3-R30 by Kikuchi electron holography / So, Wai-kei. January 2001 (has links) Thesis (M. Phil.)--University of Hong Kong, 2002. / Includes bibliographical references (leaf 99).
23	Determine the atomic structure of a surface with mixed structure phases by using LEED Patterson function Tsang, Wai-kan., 曾衛勤. January 2004 (has links) published_or_final_version / abstract / toc / Physics / Master / Master of Philosophy Surfaces (Physics) Atomic structure. Low energy electron diffraction. Patterson function.
24	Surface structure determination of Ga/Si (111) 3x3-R30 by Kikuchi electron holography 蘇偉基, So, Wai-kei. January 2001 (has links) published_or_final_version / Physics / Master / Master of Philosophy Electron holography. Low energy electron diffraction. Gallium compounds.
25	Inversion of low energy electron diffraction IV spectra of reconstructed structure of SiC (0001) 吳子傑, Ng, Tsz-kit, Victor. January 2000 (has links) published_or_final_version / Physics / Master / Master of Philosophy Silicon carbide Surfaces (Physics) Low energy electron diffraction.
26	Low-energy electron diffraction effects at complex interfaces Oh, Doogie 06 April 2009 (has links) Low-energy electron scattering was used as a tool to study electron-stimulated processes at complex interfaces. The electron diffraction in each complex interface is theoretically treated by a multiple scattering formalism for quantitative analysis. Mathematical descriptions of electron-stimulated processes and a multiple scattering expansion extended from the single-scattering case are presented. This analysis method was applied in three research topics: These are 1) electron-stimulated desorption of Cl+ from Si surfaces, 2) characterization of epitaxial graphene on Si-terminated SiC(0001), and 3) low-energy electron induced DNA damage. Zone-specific desorption of Cl+ from Si(111)- 7X7:Cl surfaces was demonstrated. Graphene epitaxially grown on SiC(0001) surfaces was analyzed using Auger electron diffraction and Raman scattering spectroscopy. Finally, the roles of interfacial water and dissociative electron attachment resonances in low-energy electron-induced DNA damage were revealed. Electron scattering calculations using the "path approach" were applied in all of the above mentioned studies. The combination of theory and experiment has lead to insight regarding electron scattering with complex targets. ESD AED DEA DESD Green function Low energy electron diffraction
27	Comparing cluster and slab model geometries from density functional theory calculations of si(100)-2x1 surfaces using low-energy electron diffraction Dogbe, John Kofi. January 2007 (has links) Thesis (Ph. D.)--University of Nevada, Reno, 2007. / "May, 2007." Includes bibliographical references. Online version available on the World Wide Web.
28	Direct determination of surface structures of C2H4 and C2H2 on si(100) by LEED Patterson inversion Lam, King-cheong. January 2008 (has links) Thesis (M. Phil.)--University of Hong Kong, 2009. / Includes bibliographical references (leaves 59-60) Also available in print.
29	The adsorption and desorption of allylamine on the Si(100) surface Zhang, Yunfeng, January 2008 (has links) Thesis (M.S.)--University of Nevada, Reno, 2008. / "August, 2008." Includes bibliographical references. Online version available on the World Wide Web.
30	A real space approach to LEED computation with flexible local mesh refinement Song, Weihong. January 2004 (has links) Thesis (Ph. D.)--University of Hong Kong, 2005. / Also available in print.

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