NDLTD Global ETD Search
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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

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Reliability of SRAMs and 3D TSV ICS: Design Protection from Soft Errors and 3D Thermal Modeling

Shiyanovskii, Yuriy 26 June 2012 (has links)
No description available.
Computer Engineering
Electrical Engineering
Soft Error
SRAMs
Hardening
Reliability
Memory Cell Design
3D ICs
TSV
Through-Silicon Vias
Thermal Modeling
Thermal Management

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