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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

Search results

Showing 71 to 80 of 289 (0.04 seconds)

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71

The reduction of contact resistance in AIGaN/GaN heterostructure field effect transistors /

Amaya, Rony E. January 1900 (has links)
Thesis (M. Eng.)--Carleton University, 2002. / Includes bibliographical references (p. 76-81). Also available in electronic format on the Internet.
72

Study of reliability mechanisms and their interaction in nanoscale CMOSFETs

Mishra, Rahul, January 2008 (has links)
Thesis (Ph.D.)--George Mason University, 2008. / Vita: p. 121. Thesis director: Dimitris E. Ioannou. Submitted in partial fulfillment of the requirements for the degree of Doctor of Philosophy in Electrical and Computer Engineering. Title from PDF t.p. (viewed Jan. 11, 2009). Includes bibliographical references (p. 111-120). Also issued in print.
73

Buried-channel silicon carbide MOSFETS /

Wagner, William E., January 1997 (has links)
Thesis (Ph. D.)--Lehigh University, 1997. / Includes vita. Bibliography: leaves 117-141.
74

Investigation of electrical characteristics of III-V MOS devices with silicon interface passivation layer

Zhu, Feng, January 1900 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2008. / Vita. Includes bibliographical references.
75

Surface and interface modification of alternative semiconductor materials for advanced transistors

Jiang, Qi, January 2009 (has links)
Thesis (M.S.)--Rutgers University, 2009. / "Graduate Program in Chemistry and Chemical Biology." Includes bibliographical references (p. 29-31).
76

Reliability of advanced dielectrics in gate oxide and device level packaging in MEMS

Rahman, Mohammad Shahriar. January 2009 (has links)
Thesis (Ph.D.)--University of Texas at Arlington, 2009.
77

A study of electron transport in the inversion layer advanced silicon carbide (SiC) power MOSFETs /

Zeng, Yu (Anne), January 2004 (has links)
Thesis (Ph. D.)--Lehigh University, 2004. / Includes vita. Includes bibliographical references (leaves 85-89).
78

Hafnium dioxide gate dielectrics, metal gate electrodes, and phenomena occurring at their interfaces

Schaeffer, James Kenyon, Ekerdt, John G. January 2004 (has links) (PDF)
Thesis (Ph. D.)--University of Texas at Austin, 2004. / Supervisor: John G. Ekerdt. Vita. Includes bibliographical references. Also available from UMI.
79

Nitrogen and hydrogen induced trap passivation at the SiO₂/4H-SiC interface

Dhar, Sarit. January 2005 (has links)
Thesis (Ph. D. in Interdisciplinary Materials Science)--Vanderbilt University, May 2005. / Title from title screen. Includes bibliographical references.
80

A novel MOSFET's with source/drain on insulator /

Zhang, Zhikuan. January 2002 (has links)
Thesis (M. Phil.)--Hong Kong University of Science and Technology, 2002. / Includes bibliographical references. Also available in electronic version. Access restricted to campus users.

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