<p> </p><p> </p><p> </p><p><p>The main</p><p>objective of this thesis is to study the polarization effects of the beetle <em>Cetonia aurata </em>using Mueller-matrix ellipsometry. The outer shell of the beetle consists of complex microstructures which control the polarization of the reflected light. It has metallic appearance which originates from helicoidal structures. When these microstructures are exposed to polarized or unpolarized light, only left-handed circularly polarized light is reflected. Moreover, the exo-skeleton of the beetle absorbs right-handed polarized light. Multichannel Mueller-matrix ellipsometer or dual rotating compensator ellipsometer, called RC2, from J.A.Woollam is used to measure the polarization caused by different parts of beetle’s body. The 16 Mueller matrix elements are measured in the spectral range 400-800 nm at multiple angles of incidencein the range 40⁰-70⁰. An Optical model is developed to help us understand the nature and type of microstructure which only reflects the green colour circularly polarized light. With the help of multiparametric modeling, we were able to find optical properties and structural parameters. The parameters are: the number of layers, the numbers of sub-layers, their thicknesses, and the orientation with respect to optical axes. This optical model describes the nanostructures which provide the reflection properties similar to the nanostructure found in the beetle <em>Cetonia aurata. </em>The model is also useful for analysis of the optical response data of different materials with multilayer structures.</p></p><p> </p>

The main objective of this thesis is to study the polarization effects of the beetle Cetonia aurata using Mueller-matrix ellipsometry. The outer shell of the beetle consists of complex microstructures which control the polarization of the reflected light. It has metallic appearance which originates from helicoidal structures. When these microstructures are exposed to polarized or unpolarized light, only left-handed circularly polarized light is reflected. Moreover, the exo-skeleton of the beetle absorbs right-handed polarized light. Multichannel Mueller-matrix ellipsometer or dual rotating compensator ellipsometer, called RC2, from J.A.Woollam is used to measure the polarization caused by different parts of beetle’s body. The 16 Mueller matrix elements are measured in the spectral range 400-800 nm at multiple angles of incidencein the range 400-700. An Optical model is developed to help us understand the nature and type of microstructure which only reflects the green colour circularly polarized light. With the help of multiparametric modeling, we were able to find optical properties and structural parameters. The parameters are: the number of layers, the numbers of sub-layers, their thicknesses, and the orientation with respect to optical axes. This optical model describes the nanostructures which provide the reflection properties similar to the nanostructure found in the beetle Cetonia aurata. The model is also useful for analysis of the optical response data of different materials with multilayer structures.

Les spin-lasers sont des dispositifs semi-conducteurs dans lesquels les processus de recombinaison radiative impliquant des porteurs polarisés en spin résultent en une émission de photons polarisés circulairement. Néanmoins, des anisotropies linéaires supplémentaires dans la cavité conduisent généralement à une émission laser préférentiellement polarisée linéairement et à un éventuel couplage entre modes. Dans cette thèse, une méthode générale pour la modélisation de lasers à semi-conducteurs tels que laser à surface verticale (externe) à cavité et contenant des puits quantiques multiples et impliquant des anisotropies pouvant révéler (i) une biréfringence linéaire locale due au champ de déformation à la surface ou (ii) une biréfringence dans les puits quantiques due au couplage d'amplitude de phase provenant de la réduction du D2d biaxial au groupe de symétrie C2v aux interfaces semiconductrices ternaires III-V. Une nouvelle méthode récursive à matrice S de diffusion est mise en œuvre en utilisant un tenseur de gain dérivé analytiquement des équations de Maxwell-Bloch. Il permet de modéliser les propriétés de l'émission (seuil, polarisation, dédoublement de mode) du laser avec plusieurs zones actives à puits quantiques en recherchant les modes propres résonnants de la cavité. La méthode est démontrée sur des structures laser réelles et est utilisée pour l'extraction de tenseurs de permittivité optique de déformation de surface et de puits quantiques en accord avec des expériences. La méthode est généralisée pour trouver les modes propres au laser dans le cas le plus général des pompes polarisées circulaires (déséquilibre entre les canaux de spin-up et de spin-down) et le dichroïsme à gain linéaire. De plus, la mesure de la matrice de Mueller 4x4 complète pour des angles d'incidence multiples et des angles azimutaux dans le plan a été utilisée pour l'extraction de tenseurs de permittivité optique de couches contraintes superficielles et de puits quantiques. Une telle dépendance spectrale des éléments tensoriels optiques est cruciale pour la modélisation des modes propres du laser de spin, les conditions de résonance, et aussi pour la compréhension des sources d'anisotropies de structure. / Spin-lasers are semiconductor devices in which the radiative recombination processes involving spin-polarized carriers result in an emission of circularly polarized photons. Nevertheless, additional linear in-plane anisotropies in the cavity generally lead in preferential linearly-polarized laser emission and to possible coupling between modes. In this thesis, a general method for the modeling of semiconductor laser such as vertical-(external)-cavity surface-emitting laser containing multiple quantum wells and involving anisotropies that may reveal i) a local linear birefringence due to the strain field at the surface or ii) a birefringence in quantum wells (QWs) due to phase amplitude coupling originating from the reduction of the biaxial D2d to the C2v symmetry group at the III-V ternary semiconductor interfaces. A novel scattering S-matrix recursive method is implemented using a gain tensor derived analytically from the Maxwell-Bloch equations. It enables to model the properties of the emission (threshold, polarization, mode splitting) from the laser with multiple quantum well active zones by searching for the resonant eigenmodes of the cavity. The method is demonstrated on real laser structures and is used for the extraction of optical permittivity tensors of surface strain and quantum wells in agreement with experiments. The method is generalized to find the laser eigenmodes in the most general case of circular polarized pumps (unbalance between the spin-up and spin-down channels) and linear gain dichroism. In addition, the measurement of full 4x4 Mueller matrix for multiple angles of incidence and in-plane azimuthal angles has been used for extraction of optical permittivity tensors of surface strained layers and quantum wells. Such spectral dependence of optical tensor elements are crucial for modeling of spin-laser eigenmodes, resonance conditions, and also for understanding of sources of structure anisotropies.