• Refine Query
  • Source
  • Publication year
  • to
  • Language
  • 5
  • 1
  • Tagged with
  • 6
  • 6
  • 3
  • 3
  • 2
  • 2
  • 2
  • 2
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • 1
  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
1

Linear dichroism in the NEXAFS spectroscopy of <i>n</i>-alkane thin films

Fu, Juxia 09 November 2006
Linear dichroism in Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy has been used to determine molecular orientation at surfaces and in microscopic domains. However, the molecular orientation of n-alkanes cannot be derived unambiguously from their NEXAFS spectra due to the inadequate understanding of the character of the relevant spectroscopic features in the NEXAFS spectra of n-alkanes (i.e. C 1s to sigma*C-H, C 1s to sigma*C-C transitions).<p>We have studied the linear dichroism in the NEXAFS spectra of n-alkane thin films by using angular dependent NEXAFS spectroscopy to explore the molecular orientation of hexacontane (HC, n-C60H122). The HC thin films were epitaxially grown onto the cleaved NaCl (001) surfaces by physical vapor deposition. NEXAFS spectra of the HC thin film were acquired at different angles using STXM microscopy. A detailed analysis of the angular dependence of the NEXAFS spectra of the HC thin film helps to understand the relationship between the linear dichroism and the molecular orientation in n-alkane molecules. This linear dichroism in the NEXAFS spectroscopy of n-alkanes is relevant for quantitative measurements of molecular orientation, such as for the microanalysis of crystalline organic materials. <p>The linear dichroism of the NEXAFS resonances for n-alkanes has also been studied by ab initio calculations. These calculations were carried out on an isolated n-alkane molecule and a cluster of n-alkane molecules. The calculations on an isolated n-alkane molecule are used to study the linear dichroism for the NEXAFS resonances above the C 1s IP. The cluster calculations account for matrix effects in the NEXAFS features of condensed n-alkanes. A comparison of calculations on an isolated molecule and on a cluster of molecules provides information on how the NEXAFS spectra change from gas phase to condensed phase and determines the linear dichroism of each NEXAFS feature below the C 1s IP.<p>In the process of preparing n-alkane thin films for the study of linear dichroism, the morphology and molecular orientation of n-alkane thin films with different chain length (n-C36H74 and n-C60H122) have also been investigated by the NEXAFS spectroscopy and microscopy. These thin films were epitaxially grown onto cleaved NaCl (001) surfaces by physical vapor deposition. The results revealed that the morphology and molecular orientation of n-alkane thin films depend on the chain length and deposition parameters, such as substrate temperature. These observations have been rationalized by the thermodynamics of nucleation and the kinetics of growth.
2

Linear dichroism in the NEXAFS spectroscopy of <i>n</i>-alkane thin films

Fu, Juxia 09 November 2006 (has links)
Linear dichroism in Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy has been used to determine molecular orientation at surfaces and in microscopic domains. However, the molecular orientation of n-alkanes cannot be derived unambiguously from their NEXAFS spectra due to the inadequate understanding of the character of the relevant spectroscopic features in the NEXAFS spectra of n-alkanes (i.e. C 1s to sigma*C-H, C 1s to sigma*C-C transitions).<p>We have studied the linear dichroism in the NEXAFS spectra of n-alkane thin films by using angular dependent NEXAFS spectroscopy to explore the molecular orientation of hexacontane (HC, n-C60H122). The HC thin films were epitaxially grown onto the cleaved NaCl (001) surfaces by physical vapor deposition. NEXAFS spectra of the HC thin film were acquired at different angles using STXM microscopy. A detailed analysis of the angular dependence of the NEXAFS spectra of the HC thin film helps to understand the relationship between the linear dichroism and the molecular orientation in n-alkane molecules. This linear dichroism in the NEXAFS spectroscopy of n-alkanes is relevant for quantitative measurements of molecular orientation, such as for the microanalysis of crystalline organic materials. <p>The linear dichroism of the NEXAFS resonances for n-alkanes has also been studied by ab initio calculations. These calculations were carried out on an isolated n-alkane molecule and a cluster of n-alkane molecules. The calculations on an isolated n-alkane molecule are used to study the linear dichroism for the NEXAFS resonances above the C 1s IP. The cluster calculations account for matrix effects in the NEXAFS features of condensed n-alkanes. A comparison of calculations on an isolated molecule and on a cluster of molecules provides information on how the NEXAFS spectra change from gas phase to condensed phase and determines the linear dichroism of each NEXAFS feature below the C 1s IP.<p>In the process of preparing n-alkane thin films for the study of linear dichroism, the morphology and molecular orientation of n-alkane thin films with different chain length (n-C36H74 and n-C60H122) have also been investigated by the NEXAFS spectroscopy and microscopy. These thin films were epitaxially grown onto cleaved NaCl (001) surfaces by physical vapor deposition. The results revealed that the morphology and molecular orientation of n-alkane thin films depend on the chain length and deposition parameters, such as substrate temperature. These observations have been rationalized by the thermodynamics of nucleation and the kinetics of growth.
3

Kinetics and Thermodynamics of n-Alkane Thin Film Epitaxial Growth

2013 April 1900 (has links)
Controlling molecular orientation is of great importance in organic thin films due to the fact that the fundamental properties of functional nanomaterials depend on molecular orientation at the nanoscale. However, controlling molecular orientation cannot be achieved without having an extensive understanding about the controlling factors in the organic film growth processes. Most previous studies have been devoted to monolayer structures. The structure of multilayer films has not been well investigated. This study was performed using a phenomenological approach, in which the morphology and orientation of n-alkane thin films were studied as a function of substrate identity, interface treatment, substrate temperature and deposition rate. The experimental techniques that were used include IR-spectroscopy, polarized optical microscopy, and near-edge X-ray absorption fine structure (NEXAFS) spectroscopy and X-ray microscopy. The kinetic and thermodynamic factors that govern the orientation of organic thin films were extracted from the experimental results, and generalized to make a framework by which the morphology and orientation of organic films can be predicted. Epitaxial growth was specifically considered as a method to pattern organic thin films. In epitaxial growth, the oriented crystals of an organic film grow on a crystalline substrate such that the structure of the substrate is copied by the deposit crystals. For epitaxy it is required that the lattice planes of two crystals are parallel and similar in the lattice points spacing. A minor part of this dissertation is devoted to epitaxy in an inorganic system. One of the favorable consequences of epitaxial growth in inorganic systems is lattice strain that alters the electronic properties of semiconductor devices. A synchrotron based experimental method has been developed to quantitatively measure the degree of strain in Si1-xGex alloy films grown epitaxially on the Si(100) substrate.
4

Development of in-situ flow electrochemical Scanning Transmission X-ray Microscopy

Prabu, Vinod January 2017 (has links)
Understanding electrically activated processes at electrode-electrolyte interfaces is needed to improve many technologies, including energy conversion, semiconductor devices, bio-sensors, corrosion protection, etc. In-situ spectro-electrochemical studies based on a wide range of spectroscopies are particularly useful. Scanning Transmission X-ray microscopy (STXM) is a synchrotron-based technique which measures near-edge X-ray absorption fine structure (NEXAFS) with high spatial resolution. In addition to information on morphology, STXM also provides chemical state analysis using the X-ray absorption data, which makes in-situ STXM studies of electrochemical process of special interest. This thesis reports ex-situ and in-situ STXM based qualitative and quantitative studies on copper (Cu) electrodeposition and electrostripping. The influence of electrolyte pH on the distribution of Cu(I) and Cu(0) species electrodeposited from aqueous CuSO4 solutions was studied. An instrument capable of performing in-situ flow electrochemical STXM studies was designed and fabricated. The performance of this device was evaluated for in-situ Cu electrodeposition studies. Findings based on ex-situ and in-situ STXM studies are discussed. Suggestions are made for further instrumentation improvements. / Thesis / Master of Science (MSc)
5

Hochauflösende Bildgebung und NEXAFS-Spektroskopie mit weicher Röntgenstrahlung aus laserinduzierten Plasmen / Soft X-ray high-resolution imaging and NEXAFS spectroscopy using a laser-induced plasma

Müller, Matthias 20 October 2018 (has links)
No description available.
6

Structure of Self-Assembled Monolayers on Gold Studied by NEXAFS and Photoelectron Spectroscopy

Watcharinyanon, Somsakul January 2008 (has links)
Self-assembled monolayers (SAMs) provide well-defined and ordered films of molecules spontaneously chemisorbed on a surface. By designing molecules with desired functionalities, such molecular film can be interesting for a range of applications from molecular electronics to catalysis. Important parameters for SAM applications are the film structure and quality, which are dependent on the structure of molecular constituents, the substrate, and the self-assembly process. In this work, SAMs on Au(111) of a variety of functionalized molecules, with thiol and silane headgroups, have been studied using high-resolution X-ray photoemission spectroscopy (HRXPS), near-edge X-ray absorption fine structure (NEXAFS) spectroscopy, Infrared reflection absorption spectroscopy (IRRAS), contact angle measurements and Kelvin probe measurements. In particular, the effects of varying the size of the backbone, varying the headgroup, inclusion of a porphyrin tailgroup, different ways of deprotection of the headgroups, and mixed molecular layers have been investigated. The first part of thesis work is focused on SAMs of oligo(phenyleneethynylene) (OPE) derivatives. First the effect of the extent of the conjugated system on the structure of SAM was investigated. As the lateral π-system in the OPE backbone increases, molecular surface densities become lower and molecular inclinations larger. Subsequently, a bulky porphyrin tailgroup was added onto the OPE molecule. Porphyrin-functionalized OPE with several headgroups were compared and the thioacetyl anchor group was found to form a high quality SAM. In the second part of the work, the molecular orientation of thiol-derivatized tetraphenylporphyrin layers was studied. The geometry of the molecular layer and the number of linkers that bind to the gold surface depend strongly on preparation schemes, i.e. whether or not the acetyl protection groups on the thiol were removed before adsorption. Finally, mixed SAMs of a ferrocene-terminated alkanethiol and alkanethiols were studied. By diluting the ferrocene-functionalized molecules in unfunctionalized alkanethiols, the orientational order and the packing density improved. The geometrical structure and the fraction of the ferrocene-terminated molecules can be tuned by controlling the parameters in the preparation scheme.

Page generated in 0.0499 seconds