Laser nano-patterning with near-field optical microscope (NSOM) and the associated energy transport analysis are achieved in this study. Based on combined experimental/theoretical analyses, it is found that laser nano-patterning with a NSOM probes strongly depend on the laser conditions and material properties of the target: the energy transport from the NSOM probes to the targets changes from pure optical to a combination of thermal and optical transport when the pulse duration of laser is increased from femtosecond to nanosecond. As a result, the mechanisms of nano-pattern formation on targets changes from nano-ablation to nano-oxidation/ recrystallization when the laser pulse duration is increased from femtosecond to nanosecond. Also, with the laser nano-patterning experiments, thermal damage of NSOM probes is observed which can be attributed to the low transport efficiency (10-4 – 10-6) and associated heating of the metal cladding of NSOM probes. The heating of NSOM probes are studied with developed time harmonic and transient thermoreflectance (TR) imaging. From time harmonic TR when the NSOM probes are driven with continuous laser, it is found that the location of heating of NSOM probes is ~20-30µm away from the NSOM tip. The strength of the heating is determined by the laser power (linear dependence), wavelength of the laser (stronger with short A), and aperture size of NSOM probes (stronger when aperture size < A/2). From the transient TR imaging when the NSOM probes are driven with pulsed laser, it is found that the peak temperature of the NSOM probe shifts much closer to the tip. The possible reason for the change in the location of peak temperature when continuous laser is changed to pulsed laser can be attributed to the competition between the heat generation and dissipation rates at different location of the probe: the tip experiences highest temperature with pulsed heating as the entire heating processes is adiabatic. The tip also experiences highest heat dissipation rate due to its large surface-to-volume ratio which overcomes the heat generation at the tip under quasi-steady state resulting in shift of the hot spot. The knowledge obtained in this study can be important in the future design of more efficient NSOM probes and other nano-optic devices.

Les nanocristaux semi-conducteurs colloïdaux possèdent des propriétés photo-physiques qui en font des objets de choix pour des applications variées, comme le marquage biologique, le photovoltaïque ou encore l’optique quantique. Leur interaction avec une structure photonique peut modifier leurs propriétés d’émission (durée de vie, intensité…). Le microscope optique de champ proche est un outil privilégié pour venir sonder ces modifications à l’échelle nanométrique.Cette thèse porte sur la réalisation d’une sonde active de champ proche réalisée à partir d’un nanocristal cœur/coquille CdSe/CdS greffé à l’apex d’une fibre optique amincie. Cette sonde est utilisée pour cartographier, dans les 3 dimensions de l’espace et à l’échelle nanométrique, les variations de durée de vie de l’émetteur. Elle permet de rendre compte des variations des modes photoniques sur la surface.Une partie de cette thèse porte sur la réalisation de la sonde active elle-même. Grâce à cette sonde les études sont alors développées sur un réseau de trous dans un film mince d’or. Des simulations FDTD ont été réalisées dans le but de déterminer les paramètres pertinents du réseau et d’analyser leur réponse en champ proche.Les résultats expérimentaux des durées de vie en divers points de différents réseaux, obtenus avec la sonde active, sont confrontés aux résultats numériques. / Colloidal semiconductor nanocrystals have photo-physical properties that make them objects of choice for various applications, such as biological marking, photovoltaics or quantum optics. Their interaction with a photonic structure can modify their emission properties (lifetime, intensity, etc.). The near-field optical microscope is a privileged tool to probe these changes at the nanoscale.This thesis deals with the realization of an active near-field probe made from a CdSe / CdS core / shell nanocrystal grafted to the apex of a thinned optical fiber. This probe is used to map, in the 3 dimensions of the space and on the nanometric scale, the variations in the lifetime of the emitter. It makes it possible to account for variations in photonic modes on the surface.A part of this thesis concerns the realization of the active probe itself. Thanks to this probe the studies are then developed on a hole grating made in a thin film of gold. FDTD simulations were performed to determine relevant grating parameters and to analyze their near field response.The experimental results of the lifetimes at various points of different gratings, obtained with the active probe, are compared with the numerical results.

Infrared antennas are employed in sensing applications requiring specific spectral, polarization, and directional properties. Because of their inherently small dimensions, there is significant interaction, both thermal and electromagnetic, between the antenna, the antenna-coupled sensor, and the low-frequency readout structures necessary for signal extraction at the baseband modulation frequency. Validation of design models against measurements requires separation of these effects so that the response of the antenna-coupled sensor alone can be measured in a calibrated manner. Such validations will allow confident extension of design techniques to more complex infrared-antenna configurations. Two general techniques are explored to accomplish this goal. The extraneous signal contributions can be measured separately with calibration structures closely co-located near the devices to be characterized. This approach is demonstrated in two specific embodiments, for removal of cross-polarization effects arising from lead lines in an antenna-coupled infrared dipole, and for removal of distributed thermal effects in an infrared phased-array antenna. The second calibration technique uses scanning near-field microscopy to experimentally determine the spatial dependence of the electric-field distributions on the signal-extraction structures, and to include these measured fields in the computational electromagnetic model of the overall device. This approach is demonstrated for infrared dipole antennas which are connected to coplanar strip lines. Specific situations with open-circuit and short-circuit impedances at the termination of the lines are investigated.

Solar energy conversion, miniaturization of semiconductor devices and associated lifetime, reliability and efficiency of devices are the basic premise of this work. This work is focused on the study of optoelectronic devices especially solar cells and its nondestructive diagnostic. Solar cells are advantageous for study mainly because the pn junction is located near the surface and contains a lot of inhomogeneities. It has been difficult until recently to investigate their local physical (electrical and optical) parameters due to the size of inhomogeneities. Behavior of inhomogeneities can be well understood with knowledge of its local properties. Establishment of measurement workplace, that satisfies requirements for measurement of local emission and optically induced current measurement, allows us detection and localization of inhomogeneities with spatial resolution more or less 100 nm. The core of thesis is characterization of imperfection using nondestructive techniques in the macroscopic region but primarily in microscopic region using scanning probe microscopy. Integral parts of the work are characterization techniques for photoelectrical devices, microscopic techniques and data processing. Scanning near-field optical microscope is used for the purpose of microscopic characterization such as topography, local optical, photoelectrical and electrooptical properties of structures in high spatial resolution. Locally induced current technique, current voltage characteristics, emission from reversed bias pn junction measurement including its thermal dependence are used for samples investigation in macroscopical region. It is possible to localize defects and structure inhomogeneity using mentioned techniques. Localised defects are consequently analyzed for composition and measured using electron microscopy. Specific outputs of work are classification of photoelectric devices defects and specification of nondestructive characterization techniques used for defect detection. Experimental characterization techniques are described together with defects measurement procedures. The key output is the catalog of serious defects which was detected. Particular defects of samples are shown including describe of its properties and physical meaning.