Spelling suggestions: "subject:"0ptical profilometry"" "subject:"0ptical profileometry""
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Characterizing the Localized Corrosion of AA7075-T6 and AA2024-T3 by Optical ProfilometryNeeley, Alexandra 19 June 2012 (has links)
No description available.
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Nanoindentation as a Characterization Tool for Wear Resistance in Stainless SteelsDoran, Marc C. 01 September 2016 (has links)
No description available.
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Fourier Transform Interferometry for 3D Mapping of Rough and Discontinuous SurfacesLally, Evan M. 07 June 2010 (has links)
Of the wide variety of existing optical techniques for non-contact 3D surface mapping, Fourier Transform Interferometry (FTI) is the method that most elegantly combines simplicity with high speed and high resolution. FTI generates continuous-phase surface maps from a projected optical interference pattern, which is generated with a simple double-pinhole source and collected in a single snapshot using conventional digital camera technology. For enhanced stability and reduced system size, the fringe source can be made from a fiber optic coupler.
Unfortunately, many applications require mapping of surfaces that contain challenging features not ideally suited for reconstruction using FTI. Rough and discontinuous surfaces, commonly seen in applications requiring imaging of rock particles, present a unique set of obstacles that cannot be overcome using existing FTI techniques. This work is based on an original analysis of the limitations of FTI and the means in which errors are generated by the particular features encountered in the aggregate mapping application.
Several innovative solutions have been developed to enable the use of FTI on rough and discontinuous surfaces. Through filter optimization and development of a novel phase unwrapping and referencing technique, the Method of Multiple References (MoMR), this work has enabled surface error correction and simultaneous imaging of multiple particles using FTI.
A complete aggregate profilometry system has been constructed, including a MoMR-FTI software package and graphical user interface, to implement these concepts. The system achieves better than 22µm z-axis resolution, and comprehensive testing has proven it capable to handle a wide variety of particle surfaces. A range of additional features have been developed, such as error correction, particle boundary mapping, and automatic data quality windowing, to enhance the usefulness of the system in its intended application.
Because of its high accuracy, high speed and ability to map varied particles, the developed system is ideally suited for large-scale aggregate characterization in highway research laboratories. Additionally, the techniques developed in this work are potentially useful in a large number of applications in which surface roughness or discontinuities pose a challenge. / Ph. D.
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A Comparison of the Degradation of Mold and Mold-like Fungi on Defined Synthetic Thermoset Polyadipate Polyurethane CoatingsHancock, Amber Nicole 22 June 2020 (has links)
No description available.
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The Effects Of Phosphate And Silicate Inhibitors On Surface Roughness And Copper Release In Water Distribution SystemsMacNevin, David 01 January 2008 (has links)
The effects of corrosion inhibitors on water quality and the distribution system were studied. This dissertation investigates the effect of inhibitors on iron surface roughness, copper surface roughness, and copper release. Corrosion inhibitors included blended poly/ortho phosphate, sodium orthophosphate, zinc orthophosphate, and sodium silicate. These inhibitors were added to a blend of surface water, groundwater, and desalinated brackish water. Surface roughness of galvanized iron, unlined cast iron, lined cast iron, and polyvinyl chloride was measured using pipe coupons exposed for three months. Roughness of each pipe coupon was measured with an optical surface profiler before and after exposure to inhibitors. For most materials, inhibitor did not have a significant effect on surface roughness; instead, the most significant factor determining the final surface roughness was the initial surface roughness. Coupons with low initial surface roughness tended to have an increase in surface roughness during exposure, and vice versa, implying that surface roughness tended to regress towards an average or equilibrium value. For unlined cast iron, increased alkalinity and increased temperature tended to correspond with increases in surface roughness. Unlined cast iron coupons receiving phosphate inhibitors were more likely to have a significant change in surface roughness, suggesting that phosphate inhibitors affect stability of iron pipe scales. Similar roughness data collected with new copper coupons showed that elevated orthophosphate, alkalinity, and temperature were all factors associated with increased copper surface roughness. The greatest increases in surface roughness were observed with copper coupons receiving phosphate inhibitors. Smaller increases were observed with copper coupons receiving silicate inhibitor or no inhibitor. With phosphate inhibitors, elevated temperature and alkalinity were associated with larger increases in surface roughness and blue-green copper (II) scales.. Otherwise a compact, dull red copper (I) scale was observed. These data suggest that phosphate inhibitor addition corresponds with changes in surface morphology, and surface composition, including the oxidation state of copper solids. The effects of corrosion inhibitors on copper surface chemistry and cuprosolvency were investigated. Most copper scales had X-ray photoelectron spectroscopy binding energies consistent with a mixture of Cu2O, CuO, Cu(OH)2, and other copper (II) salts. Orthophosphate and silica were detected on copper surfaces exposed to each inhibitor. All phosphate and silicate inhibitors reduced copper release relative to the no inhibitor treatments, keeping total copper below the 1.3 mg/L MCLG for all water quality blends. All three kinds of phosphate inhibitors, when added at 1 mg/L as P, corresponded with a 60% reduction in copper release relative to the no inhibitor control. On average, this percent reduction was consistent across varying water quality conditions in all four phases. Similarly when silicate inhibitor was added at 6 mg/L as SiO2, this corresponded with a 25-40% reduction in copper release relative to the no inhibitor control. Hence, on average, for the given inhibitors and doses, phosphate inhibitors provided more predictable control of copper release across changing water quality conditions. A plot of cupric ion concentration versus orthophosphate concentration showed a decrease in copper release consistent with mechanistic control by either cupric phosphate solubility or a diffusion limiting phosphate film. Thermodynamic models were developed to identify feasible controlling solids. For the no inhibitor treatment, Cu(OH)2 provided the closest prediction of copper release. With phosphate inhibitors both Cu(OH)2 and Cu(PO4)·2H2O models provided plausible predictions. Similarly, with silicate inhibitor, the Cu(OH)2 and CuSiO3·H2O models provided plausible predictions.
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Profilométrie optique par méthodes inverses de diffraction électromagnétiqueArhab, Slimane 02 October 2012 (has links)
La profilométrie optique est une technique de métrologie de surface rapide et non destructive. Dans ce mémoire, nous avons abordé cette problématique par des méthodes inverses de diffraction électromagnétique et dans une configuration de type Microscopie Tomographique Optique par Diffraction (ODTM). La surface est sondée par un éclairement sous plusieurs angles d'incidences ; la mesure en amplitude et en phase du champ lointain diffracté constitue les données du problème. Des profils de surfaces ont été reconstruits en considérant différents modèles de diffraction, parmi lesquelles une méthode approchée fondée sur les approximations de diffusion simple et de paraxialité. La résolution latérale de cette méthode et des techniques classiques de profilométrie est limitée par le critère d'Abbe-Rayleigh, défini sur la base de l'ouverture numérique pour l'éclairement et la détection du champ. Afin de dépasser cette limite de résolution, nous avons développé une méthode itérative de Newton-Kantorovitch régularisée. L'opérateur de diffraction y est rigoureusement modélisé par une méthode des moments, résolution numérique des équations du formalisme intégral de frontière, et l'expression de la dérivée de Fréchet de cet opérateur est obtenue par la méthode des états adjoints, à partir du théorème de réciprocité. Pour les surfaces unidimensionnelles métalliques, notre technique permet d'inverser à partir de données synthétiques des surfaces très rugueuses avec une résolution au delà du critère d'Abbe-Rayleigh. / Optical profilometry is a nondestructive and fast noncontact surface metrology technique. In this thesis, we have tackled this issue with inverse scattering electromagnetic methods and in an Optical Digital Tomographic Microscopy (ODTM) configuration. The surface is probed with illuminations under several incidence angles; the measure of far scattered field amplitude and phase constitutes the problem data. Surface profiles have been reconstructed using different scattering models among which an approximate theory based on single scattering and paraxiality. The lateral resolution of this technique and classical profilometric approaches is limited by the so-called Abbe-Rayleigh's criterion defined out of the numerical aperture for illumination and field detection. In order to overpass this resolution limit, we have developed a regularized iterative Newton-Kantorovitch's method. The scattering operator is rigorously modelized with the method of moments, that is a numerical solution of boundary integral equations, and its Fréchet derivative adjoint states expression is deduced from the reciprocity theorem. For one-dimensional metallic surfaces, our method succeeds in inverting from synthetic data very rough surfaces with the resolutions beyond the Abbe-Rayleigh's criterion. The performance of this technique and inversion conditions clearly differ from one polarization to the other : in the TM case, interactions at longer distance than in the TE case improve yet the resolution. This work includes also an experimental validation of our inverse model on grooves in indium phosphure substrate at 633 nm.
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