This thesis discusses structural and ferroelectric properties of two well-known classes of materials, perovskite oxides and Hydrogen bonded ferroelectrics, using first-principles calculations. Certain aspects of first principles calculations are central to the problems presented in this thesis. Such as the ability to calculate polarization based on the modern theory of polarization and calculation of ferroelectric property under finite electric displacement field. Therefore, these fundamental theoretical approaches are discussed following an opening section on the basic methodology of density-functional theory. In addition to the discussion on theoretical methods, a brief review of different phenomena and techniques crucial to alter/enhance ferroelectric properties at the interfaces of perovskite materials has been presented along with examples. The first problem presented in this thesis proposes and validates an alternative quantitative measure of ferroelectric(FE) and antiferrodistortive(AFD) instabilities by means of calculating inverse capacitance and layer inverse capacitance of layered perovskites. The presented methodological approach is applied to BaTiO$_{3}$/CaTiO$_{3}$ and PbTiO$_{3}$/SrTiO$_{3}$ superlattices and it precisely estimates FE and AFD instabilities. Here we also present an approach to accurately predict the ferroelectric instabilities in large period superlattices from the statistical coefficients obtained from short period superlattices. In the second problem, we study ferroelectricity in an organic crystal(croconic acid) for which ferroelectric polarization is close to that of bulk BaTiO$_{3}$. We employ new meta-GGA functional named SCAN and revisit all structural and ferroelectric properties. Calculated X-ray absorption spectra(XAS) qualitatively and quantitatively agrees well with experimental O K-edge spectra. By discussing the origin of each XAS peak and their characteristic we demonstrate with a systematic approach the connection between ferroelectricity and XAS in croconic acid. Best to our knowledge such relation has not been realized in past. This study could prove XAS as a new way to measure ferroelectric instability in hydrogen-bonded organic ferroelectrics. / Physics

Perovskite based artificial superlattices has recently been extensively investigated due to the immense promise in various device applications. The major applications include non-volatile random access memories, microwave devices, phase shifters voltage tunable capacitor applications etc. In this thesis we have taken up the investigation of two different types of symmetric superlattices, viz. BaZrO3/BaTiO3 and SrTiO3/BaZrO3, with possible applicability to voltage tunable devices. Chapter 1 deals with the introduction to the perovskite based functional oxides. Their various applications and the specific requirements for voltage tunable device applications has also been discussed in detail. The basic properties of BaTiO3 and SrTiO3, which are well documented in the literature, have been reviewed. The fundamental physics of interfacial interactions that influence the properties of superlattices is also discussed using existing models. The reason behind the choice of constructing artificial superlattices of BaZrO3/BaTiO3 and SrTiO3/BaZrO3 and the motivation behind this thesis is outlined. Chapter 2 gives a brief description of the basic characterization techniques that has been employed for studying the thin films. These include pulsed laser deposition of oxide thin films, structural characterization using X-Ray Diffraction and Atomic Force Microscope and electrical characterization of thin film metal-insulator-metal structures. The basic principle behind the techniques has also been included in various sections of this chapter. Chapter 3 introduces the reader to basic properties of the less studied perovskite material BaZrO3, one of the parent components of Ba(Zr,Ti)O3 based ceramics for high frequency applications. BaZrO3 is the common material in both the types of superlattices studied in this thesis. Initially the growth of polycrystalline BaZrO3 on (111)Pt/TiO2/SiO2/Si has been elaborated in this chapter. After characterizing the crystalline quality of the films and optimizing the growth conditions, epitaxial BaZrO3 films has been grown on (001) SrTiO3 substates. Dielectric properties of epitaxial BaZrO3 film have been measured as a function of temperature and frequencies. The electric field tunability of BaZrO3 films has been calculated from capacitance-voltage data for comparison with superlattice structures. Chapter 4 deals with the basic considerations involving growth of artificial superlattices and multilayers using pulsed laser ablation technique. The fundamental differences between formation of multilayers and superlattices have also been discussed, and the basic considerations for optimizing growth parameters are analyzed in this chapter. X-ray θ-2θ and φ-scans have been performed to investigate crystal quality of superlattices. The growth rates calculated from the satellite reflections in X-ray θ-2θ scans indicate fair degree of control over the growth and φ-scans confirms epitaxial cube-on cube growth of both types of superlattices. Atomic Force microscopy has been used to hcaracterize the film quality and surface morphology of superlattice structures and it has been found that the films have a very smooth surface with rms roughness of the order of few nanometres. Chapter5 deals with the detailed electrical characterization of both types of superlattices structures. Dielectric response showed nearly temperature invariance for both types of superlattices. Polarization measurements show that the heterostructures are in paraelectric state. Even for paraelectric/ferroelectric BaZrO3/BaTiO3 superlattices, stress induced stabilization of the paraelectric state is exhibited in low period superlattices. Paraelectric/paraelectric-SrTiO3/BaZrO3 superlattices exhibited a tunability of ~20% at intermediate modulation periods and an extremely stable dissipation factor with respect to temperature which is very attractive for device application point of view. A maximum tunability of ~40% has been observed for lowest period BaZrO3/BaTiO3 superlattice. Relatively high Quality Factors has been observed for both type of superlattices and their dependence on the modulation periods has been analyzed. Dielectric relaxation data showed that Maxwell-Wanger type of behaviour is exhibited but the presence of a conductance component G had to be realized in the equivalent circuit representation, which originates from the observation of a square law dependence of the alternating current on the frequency. Finally DC electrical characteristics were investigated as a function of temperature to determine the type of conduction mechanism that is involoved. The data has been analyzed using existing theories of high field conduction in thin dielectric films and it has been found that at different temperature ranges, the conduction mechanism varied from bulk limited Poole-Frenkel to Space Charge limited conduction. The activation energy calculation indicate that the physical processes responsible for dielectric relaxation and dc conduction are identical.

This work deals with the structural and dielectric properties of Bariumtitanate (BTO) / Strontiumtitanate (STO) superlattices. The investigations were carried during the research for a doctoral thesis on the IFW Dresden, Institute for Metallic Materials (under supervision of Prof. Schulz). These multilayers have been prepared on single crystalline STO of (100) and (111) orientated substrates. All films where grown in an epitaxial mode. Additional superlattices and Bariumstrontiumtitanate (BSTO) thin films on silicon substrates with platinum bottom electrodes have been prepared. Thereby, (111) fibre-textured polycrystalline superlattices were produced. According to our knowledge this result was achieved for the first time (is unique in the world at the moment). According to high resolution TEM investigations of (001) oriented superlattices multilayers with atomically thin interfaces without noticeable interdiffusion have been prepared. XRD pattern of a multilayer consisting of BTO and STO monolayers that have only a thickness adequate one unit cell of BTO respective STO confirm this assumption. Multilayers on (111) oriented STO substrates show a much higher interface roughness than (001) orientated films. Regarding to the examinations in this thesis it is suggested that the roughness is correlated with the reduction of internal stresses by deformation of the stack and not with interdiffusion between the monolayers. For electrical measurements the film thickness has been varied from 30 nm to 300 nm and the periodicity in the range from 0.8 nm to 20 nm. Additionally, BSTO films of equivalent thickness and integral chemical composition were produced. Dielectical measurements were carried out in the temperature range from 20 K to 600 K and hysteresis measurements were done. It has to be pointed out, that multilayers have always lower dielectrical performances then BSTO films. In all cases the dielectric constant (DC) decreases with decreasing film thickness. Multilayers of a small periodicity show the highest DC?s, decreasing with increasing monolayer thickness in all cases. The maximum of DC shifted with decreasing film thickness to higher temperatures thus correlating with an increase of the out of plane lattice parameter. In this paper the mismatch between the stack respectivly the BSTO layers and the substrate has widely been discussed. In the case of BSTO the dielectric data can be qualitatively explained with the theory of strained films, developed mainly by Pertsev, under the assumption of a strain gradient in the thin film. Strain effects do also play an important role in ferroelectric multilayers as well as size and coupling effects between the monolayers. An adequate theory for the description of the dielectric behaviour of the ferroelectric superlattice produced during this research does yet not exist. Some thesis where pointed out, which effects have to be essentially included in to a consistent theory of ferroelectric multilayer. Some practical tips are also given, how to prepare monolayers and superlattices with very high DC and exellent hysteretic behaviour. / Es wurden (001) und (111) orientierte symmetrische BTO/STO-Multilagen auf niobdotierten STO-Einkristallen abgeschieden. Hierbei wurde sowohl die Gesamtschichtdicke, als auch deren Periodizität variiert. Zum Vergleich wurden weiterhin Ba0.5Sr0.5TiO3-Mischschichten unterschiedlicher Dicke präpariert. Aus den HRTEM und XRD Untersuchungen kann geschlossen werden, dass alle erhaltenen Schichten sowohl phasenrein als auch perfekt biaxial texturiert sind. Im Falle der (001) orientierten Multilagen konnten atomar scharfe Grenzflächen zwischen Einzellagen erhalten werden, wobei sich die Einzellagendicke bis auf eine Monolage (0.4 nm) reduzieren lässt. Aus der Schichtdickenabhängigkeit von d(001), dem mittleren out-of-plane Gitterparameter der Schicht, wird geschlossen, dass die Schichten auf den STO-Einkristallen Spannungsgradienten in den Schicht-normalen besitzen und an der Grenzfläche zum Substrat am stärksten verspannt sind. Die (111) orientierten Multilagen auf den STO-Einkristallen zeigen gegenüber den Schichten auf den (100) orientierten STO-Einkristallen eine deutlich erhöhte Interfacerauhigkeit. Vermutet wird, dass dies einerseits durch die andere kristallographische Orientierung der Wachstumsnormalen bedingt ist, weil damit jeweils keine geschlossenen SrO- bzw. BaO- und TiO3-Lagen ausgebildet werden. Andererseits zeigen die TEM-Aufnahmen eine deutliche Zunahme der Welligkeit der Einzellagen mit wachsendem Abstand vom Substrat, die rein mechanischen Effekten zugeschrieben wird. Die Verwölbung der Einzellagen könnte damit der Reduzierung der mechanischen Energie innerhalb des Systems dienen, wobei die Netzebenen dem Verlauf der Einzellagen folgen. Auf platinbeschichteten Siliziumsubstraten konnten erstmals phasenreine (111) fasertexturierte Mischschichten und BTO/STO-Multilagen abgeschieden werden. Grundlage hierfür war die Optimierung des Pt/Ti/SiO2/Si Schichtsystems hinsichtlich seiner thermischen Stabilität bis zu 800°C. Die Textur der Schichten wird von der Platingrundelektrode übernommen und deren Rauhigkeit teilweise verstärkt. Eine mechanische Verwölbung der Einzellagen konnte hier nicht beobachtet werden. Für die elektrischen Messungen wurden auf allen Schichten etwa 50 nm dicke Platinelektroden durch eine Hartmaske mittels Elektronenstrahlverdampfung im Hochvakuum bei etwa 300°C aufgebracht. Anschließend wurden die Schichten an Luft getempert, um das Sauerstoffdefizit, dass sich bei der Elektrodenabscheidung einstellt, auszugleichen. Die elektrischen Messungen zeichnen sich durch den sehr großen untersuchten Temperaturbereich aus. Temperaturabhängige Messungen im Bereich von 30-600 K finden sich für ferroelektrische Dünnschichten sehr selten in der Literatur und stellen für BTO/STO-Multilagen ein Novum dar. Auch die biasabhängige und teilweise auch temperaturabhängige Messung der Kapazität der Multilagen (C-V-Messungen) ist bisher einmalig. Durch die temperaturabhängigen Hysteresemessungen wurden Einblicke in den elektrischen Polungszustand der Schichten erhalten. Dadurch wird eine sinnvolle Interpretation der ε(T)-Kurven erst möglich. Der Vorteil der Integration des Polarisationsstromes unter Verwendung einer Dreieckspannung als Messsignal besteht in der direkten physikalischen Aussage der Strom-Spannungskurven über die Schaltspannung der Schichten.