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Thesis (M.S.)--West Virginia University, 2008. / Title from document title page. Document formatted into pages; contains ix, 56 p. : ill. (some col.). Includes abstract. Includes bibliographical references (p. 46-48).

Thesis (M.S.)--West Virginia University, 2010. / Title from document title page. Document formatted into pages; contains viii, 95 p. : ill. (some col.). Includes abstract. Includes bibliographical references (p. 89-95).

Thesis (M.S.)--West Virginia University, 2008. / Title from document title page. Document formatted into pages; contains vi, 70 p. : ill. (some col.). Includes abstract. Includes bibliographical references (p. 67-70).

Thesis (PhD)--Macquarie University, School of Mathematics, Physics, Computing and Electronics, 1999. / "1998"--T.p. Includes bibliographical references.

Ce travail de thèse se focalise sur l’étude de piézogénérateur à base de nanofils de GaN.L’objectif principal est de développer des nouveaux dispositifs pour la conversion d’énergie mécanique en énergie électrique pour la récupération d’énergie et la détection de déformations transitoires. Le région active des dispositifs développés consiste en des nanofils ou microfils de GaN encapsulé dans une couche polymère. Les nanofils sont synthétisés par épitaxie par jet moléculaire (EJM) tandis que les microfils sont synthétisés par épitaxie en phase vapeur aux organométalliques (EPVOM).Trois architectures de dispositifs sont explorées: basées sur une matrice rigide, une matrice flexible, et sur un dispositif entièrement flexible. Deux dispositifs d’excitation mécanique,développés et mis en place pour les besoins de la thèse, sont utilisés pour caractériser les dispositifs piézogénérateurs. En particulier, un mode d’excitation cyclique discontinue (tapping) et un mode d’excitation cyclique continue sont utilisés pour explorer les performances électriques des piezogénérateurs dans une large bande de fréquence (de 1 Hz à 3 kHz). Basé sur ces observations expérimentales, une synthèse complète du comportement des transitoires de tension aux bornes des piézogénérateurs lorsqu’ils sont soumis à différentes déformations est faite. Un désign basé sur une diode Schottky aux sommets des nanofils et différents designs capacitifs sont comparés et leurs circuits électriques équivalents sont proposés. Les mécanismes de fonctionnement des piézogénérateurs ont été validés par des observations expérimentales.Enfin, un processus pour fabriquer des piézogénérateurs et des capteurs entièrement flexibles a été développé et ces derniers ont été caractérisés. En particulier, la fabrication d’un dispositif flexiblecomposé d’une matrice de pixel actif a été démontrée.Pour le piézogénérateur rigide à base de nanofils synthétisés par EJM, la plus haute densité de puissance moyenne mesurée atteint 22.1 mW/cm3. Pour les piézogénérateurs flexibles à base de microfils synthétisés par EPVOM, la plus haute densité de puissance moyenne mesurée atteint 16.5μW/cm3. Le dispositif flexible montre une bonne sensibilité aux vibrations de faible amplitude et répond de façon stable à un tapotement avec le doigt. Une énergie moyenne d’environ 100 pJ peut être délivrée par ce dernier lorsqu’il est soumis à une déformation cyclique par le tapotement d’un doigt. / This PhD work focuses on the study of GaN nanowire-based piezogenerating devices.The main objective is to develop novel devices for mechanical-to-electrical energy conversion for energy harvesting and for detection of transient deformations. The active material of the developed devices consists of a polymer-embedded nanowire membranes containing either molecular beam epitaxy (MBE) grown GaN nanowires or metal-organic chemical vapor deposition (MOCVD) grown GaN microwires.Three device architectures are explored, namely a piezogenerator with a rigid matrix, with a flexible matrix and a fully flexible device. Two home-made mechanical excitation set-ups are used to characterize the generators. In particular, tapping mode and continuous compression deformations are applied to explore the devices’ electrical performance in a large frequency range (from 1 Hz to 3 kHz). Based on these extensive experimental investigations, a panoramic summary of the generator transient behavior under various deformation conditions are made. A Schottky diode design and different versions of capacitive design for the piezogeneration are compared, and their equivalent electrical circuits are proposed. The piezogenerators’ working mechanisms are further validated by experimental investigations.Finally, a process to fabricate fully flexible generators and sensors is developed and these flexible devices are extensively characterized. In particular, a flexible device composed of a matrix ofactive pixels is demonstrated.For the MBE nanowire-based piezogenerators on a rigid substrate, the best recorded average power output density reaches 22.1 mW/cm3. For the MOCVD microwire based flexible generators, the best recorded average power output density attains 16.5 μW/cm3. The flexible devices show a good sensitivity to ambient vibrations and respond stably to finger tapping deformations. An average energy of about 100 pJ can be delivered by the flexible device under one finger tapping gesture.

"1998"--T.p. / Thesis (PhD)--Macquarie University, School of Mathematics, Physics, Computing and Electronics, 1999. / Includes bibliographical references. / Introduction -- A Michelson interferometer for measurement of piezoelectric coefficients -- The piezoelectric coefficient of gallium arsenide -- Extensional piezoelectric coefficients of gallium nitrides and aluminium nitride -- Shear piezoelectric coefficients of gallium nitride and aluminium nitride -- Electrostriction in gallium nitride, aluminium nitride and gallium arsenide -- Summary and prognosis. / The present work represents the first use of the interferometric technique for determining the magnitude and sign of the piezoelectric coefficients of III-V compound semiconductors, in particular gallium arsenide (GaAs), gallium nitride (GaN), and aluminium nitride (AIN). The interferometer arrangement used in the present work was a Michelson interferometer, with the capability of achieving a resolution of 10⁻¹³ m. -- The samples used were of two types. The first were commercial wafers, with single crystal orientation. Both GaAs and GaN were obtained in this form. The second type of sample was polycrystalline thin films, grown in the semiconductor research laboratories at Macquarie University. GaN and AIN samples of this type were obtained. -- The d₁₄ coefficient of GaAs was measured by first measuring the d₃₃ value of a [111] oriented sample. This was then transformed to give the d₁₄ coefficient of the usual [001] oriented crystal. The value obtained for d₁₄ was (-2.7 ± 0.1) pmV⁻¹. This compares well with the most recent reported measurements of -2.69 pmV⁻¹. The significance of the measurement is that this represents the first time this coefficient has been measured using the inverse piezoelectric effect. -- For AIN and GaN samples, the present work also represents the first time their piezoelectric coefficients have been measured by interferometry. For GaN, this work presents the first reported measurements of the piezoelectric coefficients, and some of these results have recently been published by the (Muensit and Guy, 1998). The d₃₃ and d₃₁ coefficients for GaN were found to be (3.4 ± 0.1) pmV⁻¹ and (-1.7 ± 0.1) pmV⁻¹ respectively. Since these values were measured on a single crystal wafer and have been corrected for substrate clamping, the values should be a good measure of the true piezoelectric coefficients for bulk GaN. -- For AIN, the d₃₃ and d₃₁ coefficients were found to be (5.1 ± 0.2) pmV⁻¹, and (-2.6 ± 0.1) pmV⁻¹ respectively. Since these figures are measured on a polycrystalline sample it is quite probable that the values for bulk AIN would be somewhat higher. / The piezoelectric measurements indicate that the positive c axis in the nitride films points away from the substrate. The piezoelectric measurements provide a simple means for identifying the positive c axis direction. -- The interferometric technique has also been used to measure the shear piezoelectric coefficient d₁₅ for AIN and GaN. This work represents the first application of this technique to measure this particular coefficient. The d₁₅ coefficients for AIN and GaN were found to be (-3.6 ± 0.1) pmV⁻¹ and (-3.1 ± 0.1) pmV⁻¹ respectively. The value for AIN agrees reasonably well with the only reported value available in the literature of -4.08 pmV⁻¹. The value of this coefficient for GaN has not been measured. -- Some initial investigations into the phenomenon of electrostriction in the compound semiconductors were also performed. It appears that these materials have both a piezoelectric response and a significant electrostrictive response. For the polycrystalline GaN and AIN, the values of the M₃₃ coefficients are of the order of 10⁻¹⁸ m²V⁻². The commercial single crystal GaN and GaAs wafers display an asymmetric response which cannot be explained. / Mode of access: World Wide Web. / Various pagings ill