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Monomers, polymers, charge-transfer complexes of 2-benzylidene-1,3-dithioles (Dithiafulvenes), and 1,3-dithiolium (Dithiafulvenium) salts of dithioesters and poly(dithioesters) were synthesized. The infrared, nuclear magnetic resonance (NMR) and ultra violet spectra of these materials were also reported. Condensation polymerization of piperidinium tetrathio terephthalate with α-halocarbonyl compounds using phase-transfer techniques yielded poly(dithioesters) that upon dehydrative cyclization with sulfuric acid gave poly(1,3-dithiafulvenium) salts. Polymerization of substituted dithiafulvenes with diacid chlorides, p-phenylene diisocyanate or terephthalaldehyde yielded polymers with inherent viscosities of 0.10 dL/g to 0.21 dL/g. The electric resistivity of the charge-transfer complexes of several dithiafulvenes and the electron donors TCNQ and TNF measured by the two-probe method was found to be >10⁶ Ω.cm at room temperature, hence behaving like insulators. Polyesters and polyesterimides of 4,4'-sulfonyl diphenol were synthesized. The low molecular weight polymers had viscosities of 0.12 to 0.20 dL/g. The polymers formed brittle films and their IR and NMR spectra were reported.

Luo Yun. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2004. / Includes bibliographical references. / Abstracts in English and Chinese. / Abstract --- p.i / 论文摘要 --- p.ii / Acknowledgements --- p.iii / Table of Contents --- p.iv / List of Figures --- p.vii / List of Tables --- p.xi / Chapter Chapter 1 --- Introduction --- p.1 / Chapter 1.1 --- Conjugated Polymers --- p.1 / Chapter 1.1.1 --- Overview --- p.1 / Chapter 1.1.2 --- Conducting Polymers --- p.2 / Chapter 1.2 --- Electrochemical Doping of Conjugated Polymers --- p.5 / Chapter 1.2.1 --- Doping Conjugated Polymers --- p.7 / Chapter 1.2.2 --- Doping Level --- p.8 / Chapter 1.3 --- Charges in Conjugated Polymers --- p.10 / Chapter 1.3.1 --- Electronic and Geometric Configurations --- p.10 / Chapter 1.3.2 --- Charge Carriers --- p.10 / Chapter 1.4 --- Effects of Localization and Structural Disorder on Conductivity --- p.18 / Chapter 1.5 --- Cyclic Voltammetric Behavior of Conjugated Polymers --- p.18 / Chapter 1.6 --- PEDOT: PSS Systems --- p.21 / Chapter 1.7 --- Motivation --- p.25 / References --- p.27 / Chapter Chapter 2 --- Instrumentation --- p.32 / Chapter 2.1 --- X-ray Photoelectron Spectroscopy --- p.32 / Chapter 2.1.1 --- Introduction --- p.32 / Chapter 2.1.2 --- Basic Principles and Theory --- p.32 / Chapter 2.1.3 --- Qualitative Analysis Using XPS --- p.35 / Chapter 2.1.4 --- Angular Effect on XPS --- p.35 / Chapter 2.1.5 --- Chemical Shifts --- p.35 / Chapter 2.1.6 --- Valence Band Investigation --- p.37 / Chapter 2.1.7 --- Quantitative Analysis Using XPS --- p.37 / Chapter 2.1.8 --- Instrumental Setup for XPS --- p.40 / Chapter 2.2 --- Scanning Probe Microscopy --- p.40 / Chapter 2.2.1 --- General Introduction --- p.40 / Chapter 2.2.2 --- Atomic Force Microscopy and Conducting Atomic Force Microscopy --- p.40 / Chapter 2.2.3 --- Instrumental Setup for Conducting AFM --- p.44 / Chapter 2.3 --- Cyclic Voltammetry --- p.44 / Chapter 2.4 --- Kelvin Probe --- p.46 / Chapter 2.5 --- a-step Profilometer --- p.48 / References --- p.49 / Chapter Chapter 3 --- Cyclic Voltammetric Characterization of PEDOT:PSS --- p.51 / Chapter 3.1 --- Film Preparations --- p.51 / Chapter 3.2 --- Electrochemistry --- p.52 / Chapter 3.3 --- Results and Discussions --- p.53 / References --- p.56 / Chapter Chapter 4 --- Electronic Structure of Doped and Dedoped PEDOT:PSS Systems --- p.57 / Chapter 4.1 --- Introduction --- p.57 / Chapter 4.2 --- Sample Preparations --- p.58 / Chapter 4.3 --- Results and Discussions --- p.60 / Chapter 4.3.1 --- XPS of C 1s Core Level of PEDOT:PSS --- p.61 / Chapter 4.3.2 --- XPS of S 2p Core Level of PEDOT:PSS --- p.66 / Chapter 4.3.3 --- XPS of O Is Core Level of PEDOT:PSS --- p.71 / Chapter 4.3.4 --- XPS of Valence Band of PEDOT:PSS --- p.77 / Chapter 4.3.5 --- Further Explanations and Discussions --- p.77 / Chapter 4.4 --- Kevin Probe Measurement --- p.83 / Chapter 4.5 --- Conclusions --- p.83 / References --- p.85 / Chapter Chapter 5 --- Morphology and Nano-scale Electrical Properties of PEDOT:PSS Thin Film --- p.87 / Chapter 5.1 --- Introduction --- p.87 / Chapter 5.2 --- Sample Preparations --- p.87 / Chapter 5.3 --- Results and Discussions --- p.88 / Chapter 5.3.1 --- CAFM on as Prepared PEDOT.PSS and Ar+ Sputtered Thin Film --- p.88 / Chapter 5.3.2 --- CAFM on pH Dedoped PEDOT:PSS (pH=6.6) --- p.95 / Chapter 5.3.3 --- CAFM on Electrochemically Dedoped PEDOTrPSS --- p.98 / Chapter 5.4 --- Conclusions --- p.105 / References --- p.106 / Chapter Chapter 6 --- Concluding Remarks and Future Work --- p.107 / Chapter 6.1 --- Concluding Remarks --- p.107 / Chapter 6.2 --- Future Work --- p.108

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by Sin Lai Yi, Mandy. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2002. / Includes bibliographical references (leaves 120-121). / Text in English; abstracts in English and Chinese. / by Sin Lai Yi, Mandy. / Abstract --- p.ii / 論文摘要 --- p.iii / Acknowledgements --- p.iv / Table of Contents --- p.v / List of Figures --- p.ix / List of Tables --- p.xiii / Chapter Chapter 1 --- Introduction / Chapter 1.1 --- Adhesion --- p.1 / Chapter 1.2 --- Adhesion issues in PLEDs --- p.1 / Chapter 1.3 --- Literature review of the adhesion measurement techniques --- p.4 / Chapter 1.3.1 --- Methods involving detachment normal to the interface --- p.4 / Chapter 1.3.1.1 --- Direct pull-off method --- p.5 / Chapter 1.3.2 --- Methods based upon the application of lateral stresses for detachment --- p.7 / Chapter 1.3.2.1 --- Scotch tape method --- p.7 / Chapter 1.3.2.2 --- Peel test --- p.8 / Chapter 1.4 --- Motivations and aims of studies --- p.11 / Chapter 1.5 --- Outline of the thesis --- p.12 / Chapter Chapter 2 --- Experimental and Instrumentation / Chapter 2.1 --- Sample preparation --- p.13 / Chapter 2.2 --- Instrumentation --- p.13 / Chapter 2.1.1 --- Modified Scotch tape method --- p.13 / Chapter 2.2.2 --- Atomic force microscope --- p.23 / Chapter 2.2.3 --- X-ray photoelectron spectroscopy --- p.26 / Chapter 2.2.4 --- Radio-frequency (RF) plasma etching system --- p.27 / Chapter Chapter 3 --- Verification of the modified Scotch tape method / Chapter 3.1 --- Introduction --- p.31 / Chapter 3.2 --- Verification Test One ´ؤ Measurement against different adhesive tapes --- p.31 / Chapter 3.3 --- Verification Test Two ´ؤ Measurement with different crosshead speeds --- p.40 / Chapter 3.4 --- Verification Test Three ´ؤ Measurement of adhesive tapes with different sizes --- p.46 / Chapter 3.5 --- Summary --- p.51 / Chapter Chapter 4 --- Adhesion of gold films coated on the plasma treated ITO / Chapter 4.1 --- Introduction --- p.53 / Chapter 4.2 --- Characteristics of RF plasma etching --- p.53 / Chapter 4.2.1 --- Test One ´ؤ Study the relationship between sputtering time and sputtering depth --- p.54 / Chapter 4.2.2 --- Test Two - Study the relationship beteen self-bias voltage and sputtering depth --- p.54 / Chapter 4.3 --- Modification of the surface morphology of the Ar plasma treated ITO --- p.57 / Chapter 4.4 --- Quantitative adhesion measurement of gold films on plasma treated ITO --- p.62 / Chapter 4.5 --- Summary --- p.68 / Chapter Chapter 5 --- Adhesion of PFO on ITO with self-assembled monolayers as interfacial layers / Chapter 5.1 --- Introduction --- p.69 / Chapter 5.2 --- Reactions between SAMs and ITO --- p.71 / Chapter 5.3 --- Sample preparation --- p.73 / Chapter 5.4 --- Tests of alkylsilane --- p.74 / Chapter 5.4.1 --- Determination of the point of film detachment --- p.74 / Chapter 5.4.2 --- Adhesion test of PFO/alkylsilane/ITO --- p.79 / Chapter 5.4.3 --- Adhesion test of PF0/alkylsilane/Si02 --- p.91 / Chapter 5.5 --- Tests of phenylsilane --- p.104 / Chapter 5.6 --- Summary --- p.114 / Chapter Chapter 6 --- Conclusions and further studies / Chapter 6.1 --- Conclusions --- p.116 / Chapter 6.2 --- Further studies --- p.118 / References --- p.120

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