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This dissertation introduces scanning probe microscopy (SPM) and describes the construction and design of a home built low temperature magnetic force microscope (MFM). Then the magnetic coatings on atomic force microscope cantilevers with a focused ion beam (FIB) will be explained. This technique allows the convenient deposition of complex or expensive materials such as CoCrPt. With the MFM tip coated by FIB, the ferromagnetic domain structure of a La[subscript 0.67]Ca[subscript 0.33]MnO₃ film is studied as a function of an in-plane magnetic field below room temperature. Next I will discuss the use of chemically-synthesized FePt nanocrystals as a good candidate for high density storage media. This nanocrystal film showed sintering problems during the annealing process, which is essential to make FePt a hard ferromagnet. A silica overcoating method was used to prevent nanocrystal sintering, which allowed the MFM study of films made from these nanocrystals. I will also discuss resistance measurements of the FePt nanocrystals.

Nanowires are sensitive to external influences such as surface charges or external electric fields. An Atomic Force Microsope (AFM) is modified to perform back gating and tip gating measurements in order to understand the interaction between an external field, and surface charge and nanowire conductance. A 2D finite element method (FEM) model is developed to simulate the measured conductance. The model shows that surface states play a critical role in determining nanowire conductance. A 3D FEM model is developed to examine the influence of the AFM tip on the lateral resolution of the AFM tip in the electrostatic measurement. The radius of the AFM tip determines the lateral resolution of the tip. However, carrier concentration in the nanowire establishes a lower limit on the lateral resolution, for small tip radii. These results enable one to optimize Scanning Probe Microscopy experiments as well as inform sample preparation for nanowire characterization.

Nanowires are sensitive to external influences such as surface charges or external electric fields. An Atomic Force Microsope (AFM) is modified to perform back gating and tip gating measurements in order to understand the interaction between an external field, and surface charge and nanowire conductance. A 2D finite element method (FEM) model is developed to simulate the measured conductance. The model shows that surface states play a critical role in determining nanowire conductance. A 3D FEM model is developed to examine the influence of the AFM tip on the lateral resolution of the AFM tip in the electrostatic measurement. The radius of the AFM tip determines the lateral resolution of the tip. However, carrier concentration in the nanowire establishes a lower limit on the lateral resolution, for small tip radii. These results enable one to optimize Scanning Probe Microscopy experiments as well as inform sample preparation for nanowire characterization.

Thesis (Ph. D.)--University of Texas at Austin, 2007. / Vita. Includes bibliographical references.

Thesis (Ph. D.)--University of Texas at Austin, 2005. / Vita. Includes bibliographical references.

Theses (M.S.)--Marshall University, 2006. / Title from document title page. Includes abstract. Document formatted into pages: contains v, 75 pages including illustrations. Bibliography: p. 72-75.

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by Chen Yunjie. / Thesis (Ph.D.)--Chinese University of Hong Kong, 1997. / Includes bibliographical references (p. 141). / Electronic reproduction. Hong Kong : Chinese University of Hong Kong, [2012] System requirements: Adobe Acrobat Reader. Available via World Wide Web. / Mode of access: World Wide Web.

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