This project deals with implementation of a first order Sigma–Delta AD converter on the FPGA. This ADC is design for an audio signal processing. ADC is build up partially from digital blocks implemented in FPGA (programmed using VHDL) and from few analog components placed external to FPGA. Output from ADC is PCM signal. Data from ADC is created UDP datagram, which is sent to PC via network connection. Income data are received in created program, which save data to text file. This text file is processing in MATLAB.

L'expansion du marché des semi-conducteurs dans tous les secteurs d'activité résulte de la capacité de créer de nouvelles applications grâce à l'intégration de plus en plus de fonctionnalités sur une surface de plus en plus faible. Pour chaque entreprise, la compétitivité dépend du coût de fabrication mais aussi de la fiabilité du produit. Ainsi, la phase de test d'un circuit intégré, et plus particulièrement des circuits analogiques et mixtes, est le facteur prédominant dans les choix d'un compromis entre ces deux critères antagonistes, car son coût est désormais proche du coût de production. Cette tendance contraint les acteurs du marché à mettre en place de nouvelles solutions moins onéreuses. Parmi les recherches dans ce domaine, la conception en vue du test (DfT) consiste à intégrer pendant le développement de la puce, une circuiterie additionnelle susceptible d'en faciliter le test, voire d'effectuer un auto-test (BIST). Mais la sélection d'une de ces techniques nécessite une évaluation de leur capacité de différencier les circuits fonctionnels des circuits défaillants. Ces travaux de recherche introduisent une méthodologie d'estimation de la qualité d'une DfT ou d'un BIST dans le flot de conception de circuits analogiques et mixtes. Basée sur la génération d'un large échantillon prenant en compte l'impact des variations d'un procédé technologique sur les performances et les mesures de test du circuit, cette méthodologie calcule les métriques de test exprimant la capacité de chaque technique de détecter les circuits défaillants sans rejeter des circuits fonctionnels et d'accepter les circuits fonctionnels en rejetant les circuits défaillant. Ensuite, le fonctionnement d'un auto-test numérique adapté aux convertisseurs sigma-delta est présenté ainsi qu'une nouvelle méthode de génération et d'injection du stimulus de test. La qualité de ces techniques d'auto-test est démontrée en utilisant la méthodologie d'estimation des métriques de test. Enfin, un démonstrateur développé sur un circuit programmable démontre la possibilité d'employer une technique d'auto-test dans un système de calibrage intégré. / The pervasiveness of the semiconductor industry in an increasing range of applications that span human activity stems from our ability to integrate more and more functionalities onto a small silicon area. The competitiveness in this industry, apart from product originality, is mainly defined by the manufacturing cost, as well as the product reliability. Therefore, finding a trade-off between these two often contradictory objectives is a major concern and calls for efficient test solutions. The focus nowadays is mainly on Analog and Mixed-Signal (AMS) circuits since the associated testing cost can amount up to 70% of the overall manufacturing cost despite that AMS circuits typically occupy no more than 20% of the die area. To this end, there are intensified efforts by the industry to develop more economical test solutions without sacrificing product quality. Design-for-Test (DfT) is a promising alternative to the standard test techniques. It consists of integrating during the development phase of the chip extra on-chip circuitry aiming to facilitate testing or even enable a built-in self-test (BIST). However, the adoption of a DFT technique requires a prior evaluation of its capability to distinguish the functional circuits from the defective ones. In this thesis, we present a novel methodology for estimating the quality of a DfT technique that is readily incorporated in the design flow of AMS circuits. Based on the generation of a large synthetic sample of circuits that takes into account the impact of the process ariations on the performances and test measurements, this methodology computes test metrics that determine whether the DFT technique is capable of rejecting defective devices while passing functional devices. In addition, the thesis proposes a novel, purely digital BIST technique for Sigma-Delta analog-to-digital converters. The efficiency of the test metrics evaluation methodology is demonstrated on this novel BIST technique. Finally, a hardware prototype developed on an FPGA shows the possibility of adapting the BIST technique within a calibration system.

This master’s thesis deals with the issue of digital to analog conversion and possibility of its realization in digital circuits. Goal of this project is to design sigma-delta digital to analog converter with resolution of 14 bits and frequency band (0 ÷ 20) kHz. Main functional blocks: interpolator and modulator sigma-delta will be realized like digital structures. Reconstruction filter will be realized like an analog structure. For design a check of parameters of designed converter programs MATLAB and Simulink are used. Designed digital structures will be described by VHDL language.

In power electronics, the switched converter plays a fundamental role in the efficient conversion and dynamical control of electrical energy. Due to the switching operation of these systems, overlaid disturbances come into existence in addition to the desired behavior of the variables, causing deviations in the current and voltages. From a control perspective, these disturbances are of no interest since they cannot be compensated. They can even alter the measurements given to the control system, affecting its behavior. Furthermore, during the control design, averaged models are often used, by which the switching operation is somehow disregarded. They consider instead the average behavior of the system variables. Thus, it is essential that the measuring setup provides a measurement of the average value to the control system. To accomplish this goal, there are in practice different approaches. For example, the disturbances originated by the switching operation can be either suppressed using an analog or digital filter, or the sampling of the variables can be carried out in a suitable manner, synchronous to the carrier of the modulation method. Unfortunately, the use of filters adds an extra phase shift or delay to the control loop, reducing its dynamical performance. Moreover, the synchronous sampling method provides a good approximation of the average value only if certain conditions are met, otherwise a distortion due to aliasing takes place. A method is developed in this work to predict, in every switching cycle, the average value of the system variables in a switched power converter. In this context, the work presents an alternative method to carry out the measurement of the average value, avoiding the principal drawbacks of the standard measuring methods. To achieve this, a suitable model of the converter is used, incorporating the modulation method and the type of analog-to-digital converter, either a conventional sample-and-hold or a sigma-delta converter. The measurement given by the analog-to-digital converter is used to predict the time behavior of the system variables during the present switching period and then to evaluate its average value, before the period is completed. The method allows to obtain simultaneously the average value of currents and voltages, to get rid of the delay introduced by filtering, and to avoid the drawback of sampling in the measurement, i.e. aliasing. In this work, an overview of the standard measuring methods for switched power converters is first presented. The problematics that arise from the sampling process are also discussed. Next, the theoretical grounds of the method are developed and the tools needed to implement it are derived. To illustrate its applicability, the method is used first in DC-DC converters, where the case of the buck converter is analyzed in detail. Similarly, the method is applied to a three-phase two-level voltage source converter. In both cases, simulation results and experimental verification are presented for different operational modes. The usage of the method in open and closed loop is discussed, and its effect in the system behavior is shown. The performance of the prediction method is contrasted with other standard measuring methods.

Diplomová práce obsahuje stručný teoretický základ pro designéra/ku A/D převodníku v technologii CMOS a přehled architektur A/D převodníků používaných v automobilovém průmyslu. Volba vhodné architektury pro konkrétní aplikaci byla zásadním úkolem zpra- covaným v semestrálním projektu předcházejícím tuto práci a je rovněž součástí této práce. Analýza v Matlabu, ze které by mělo vyplynout, je-li třeba zahrnout do architek- tury podblok Sample and Hold, je také součástí práce. Klíčovou částí práce je dokumen- tace návrhu jednotlivých podbloků A/D převodníku – operačního zesilovače, kompará- toru a R-2R D/A převodníku – a ověření jejich funkčnosti. V závěru práce je ověřena funkčnost A/D převodníku jako celku.