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Élaboration de nouvelles méthodologies d’évaluation de la fiabilité de circuits nanoélectroniquesEl Moukhtari, Issam 29 November 2012 (has links)
Ce travail constitue une contribution à l’étude de la synergie entre le vieillissement accéléré et l’évolution de la robustesse aux évènements singuliers pour les technologies MOS avancées. Ce manuscrit expose le travail fait autour de la Caractérisations des mécanismes de dégradation NBTI, HCI, TDDB et Electromigration sur les structures de tests conçues dans le véhicule de test NANOSPACE en technologie CMOS LP 65 nm. Il décrit aussi l’évaluation de la robustesse face aux évènements singuliers après un vieillissement de type NBTI sur les chaines de portes logiques (inverseurs, NOR, bascules D). Cette dernière partie nous a permis de démontrer que le vieillissement de type NBTI améliore la robustesse face aux SET dans ce cas d’étude. / This work is a contribution to the study of the synergy between accelerated aging and the evolution of robustness to single event effects for advanced MOS technologies.This manuscript describes the work done around the characterization of degradation mechanisms NBTI, HCI, TDDB and Electromigration on test structures designed in the NANOSPACE test vehicle on CMOS 65 nm Low Power technology. It also describes the evaluation of the robustness to Single Events Effects after NBTI aging on chains of logic gates (inverters, NOR, D flip-flops). This last part allows to show that the NBTI aging improves the robustness to SET in this case of study.
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Testovací metody pro hodnocení radiačních efektů v přesných analogových a signálově smíšených obvodech pro aplikace v kosmické elektronice / Test Methods for Evaluation of Radiation Effects in High Precision Analog and Mixed-Signal Devices for Space ApplicationsHofman, Jiří January 2019 (has links)
The traditional radiation testing of space electronics has been used for more than fifty years to support the radiation hardness assurance. Its typical goal is to ensure reliable operation of the spacecraft in the harsh environment of space. This PhD research looks into the radiation testing from a different perspective; the goal is to develop radiation testing methods that are focused not only on the reliability of the components but also on a continuous radiation-induced degradation of their performance. Such data are crucial for the understanding of the impact of radiation on the measurement uncertainty of data acquisition systems onboard research space missions.
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