The effects of ionizing radiation on the breakdown-voltage degradation of power-MOSFET termination structures were examined through two-dimensional simulation. A wide variety of sensitivity to surface-charge density was found for various devices employing floating field rings and/or equipotential field plates. Termination structures that were both insensitive to surface charge and possessed a high breakdown voltage were identified. The results were compared with measurements made on selected structures. The principal ionizing radiation damaging mechanisms in MOS devices are discussed. Modifications made to an existing simulation program in order to simulate these complex field ring and field plate structures are described. Background information into how these termination structures improve the breakdown voltage and their sensitivities to positive interface charge buildup is investigated.

Thesis. 1977. Ph.D.--Massachusetts Institute of Technology. Dept. of Chemical Engineering. / M̲i̲c̲ṟo̲f̲i̲c̲ẖe̲ c̲o̲p̲y̲ a̲v̲a̲i̲ḻa̲ḇḻe̲ i̲ṉ A̲ṟc̲ẖi̲v̲e̲s̲ a̲ṉḏ S̲c̲i̲e̲ṉc̲e̲.̲ / Bibliography : leaves 286-295. / by Albert Sacco, Jr. / Ph.D.

Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Chemical Engineering, 1980. / MICROFICHE COPY AVAILABLE IN ARCHIVES AND SCIENCE. / Bibliography: leaves 190-192. / by James Edwin Garmirian. / Ph.D.

Thesis (Ph. D.)--University of Missouri-Columbia, 1997. / Typescript. Vita. Includes bibliographical references (leaves 107-110). Also available on the Internet.

Thesis (M. S. in Electrical Engineering)--Vanderbilt University, Aug. 2008. / Title from title screen. Includes bibliographical references.

Thesis (Ph. D.)--University of Missouri-Columbia, 1997. / Typescript. Vita. Includes bibliographical references (leaves 107-110). Also available on the Internet.

Thesis (M.M.A.S.)--School of Advanced Airpower Studies, 1995. / Subject: Whether spacepower's limitations are predominantly inherent to the space environment or are self-imposed by the current US approach to space. Cover page date: [1995]. Vita. Includes bibliographical references.

Source: Dissertation Abstracts International, Volume: 57-08, Section: B, page: 5173. Advisor: Lawrence W. Whitehead. Includes bibliographical references.

Thesis (Ph. D.) University of Missouri-Columbia, 2006. / The entire dissertation/thesis text is included in the research.pdf file; the official abstract appears in the short.pdf file (which also appears in the research.pdf); a non-technical general description, or public abstract, appears in the public.pdf file. Title from title screen of research.pdf file (viewed on August 2, 2007) Includes bibliographical references.

[FR] Les travaux de thèse s'inscrivent dans le contexte d'une évaluation de la fiabilité de matrices de phototransistors bipolaires en technologie silicium pour des applications de codage optique angulaire en environnement spatial. Après un état de l'art relatif aux technologies des phototransistors et un rappel sur leur fonctionnement physique, les conditions environnementales spécifiques liées au domaine spatial sont décrites. La caractérisation des paramètres électro-optiques des phototransistors, associée à une phase préliminaire de métrologie, a été effectuée à partir de bancs dédiés. L'étude de la sensibilité aux charges mobiles de technologies issues de différents fondeurs, habituellement piégées aux interfaces et identifiée comme un mécanisme fortement pénalisant en terme de durée de vie opérationnelle, a permis d'optimiser et fiabiliser une nouvelle source européenne. Une méthodologie originale basée sur le concept des plans d'expérience « D-optimal » a été mise en œuvre et validée. L'objectif est d'estimer le taux de dégradation d'un ou de plusieurs paramètres clés du composant en fonction des conditions environnementales imposées par l'orbite de rotation du satellite à partir d'un nombre limité d'expériences réalisées au sol. / [EN] The research activities presented in this thesis are related to the specific contextof the qualification tests, for space missions, of new sources of silicon phototransistor arraysfor optical angular encoders. Our studies on a first source revealed the fragility of thattechnology in active storage and ionizing radiation because of its sensitivity to oxidestrapped charges. Then, a study on a second set of components was performed in order toanalyze the reliability of phototransistors subjected to several constraints in terms of bothionizing and displacement doses. The methodology of “Design of Experiments” was for thefirst time implemented and validated in this context. Thanks to this methodology, it ispossible to obtain an estimate of the degradation of one or more key parameters of thecomponent in environmental conditions for a given mission profile with a limited number ofexperiments. / [IT] Il lavoro di tesi s’inscrive nel contesto particolare della valutazione dell'affidabilità di matrici di fototransistor in tecnologia bipolare in silicio per applicazioni di codifica ottica angolare in ambiente spaziale. Dopo uno stato dell’arte riguardante le tecnologie di fototransistor, una breve descrizione dell’applicazione per cui i dispositivi studiati sono intesi, ed infine un richiamo sul loro funzionamento fisico, vengono descritte le condizioni ambientali specifiche legate al settore spaziale. La caratterizzazione dei parametri elettro-ottici dei fototransistor, associata ad una fase preliminare di metrologia, è stata effettuata a partire da banchi dedicati. Lo studio della sensibilità di diversi design di fototransistor agli effetti di cariche mobili intrappolate alle interfacce ossido-silicio, di solito identificata come un meccanismo fortemente penalizzante in termini di durata di vita operativa del dispositivo, ha permesso d'ottimizzare e accrescere l’affidabilità di fototransistor di un nuovo fabbricante europeo. Una metodologia originale basata sul concetto dei piani d'esperienza “D-optimal” è stata attuata e convalidata. L'obiettivo è di ottenere il tasso di degradazione di uno o più parametri chiave del dispositivo in funzione delle condizioni ambientali imposte dall'orbita in cui il satellite si troverà a operare, e a partire da un numero limitato d'esperienze realizzate a terra.