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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

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Spelling suggestions: "subject:"8tress optar coefficient"" "subject:"_stress optar coefficient""

1

Study of stress measurement using polariscope

Li, Fang 18 May 2010 (has links)
The goal of this research was to investigate an experimental infrared transmission technique to extract the full stress components of the in-plane residual stresses in thin multi crystalline silicon wafer, and try to meet the need of photovoltaic industry to in situ measure residual stress for large cast wafers.
Stress optic coefficient
Silicon wafer
Stress separation
Photoelasticity
Silicon crystals
Residual stresses
Polariscope

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