Thesis (M. Phil.)--University of Hong Kong, 1993.

Filtered backprojection (FBP) reconstruction algorithms are very popular in the field of X-ray computed tomography (CT) because they give advantages in terms of the numerical accuracy and computational complexity. Ramp filter based fan-beam FBP reconstruction algorithms have the position dependent weight in the backprojection which is responsible for spatially non-uniform distribution of noise and resolution, and artifacts. Many algorithms based on shift variant filtering or spatially-invariant interpolation in the backprojection step have been developed to deal with this issue. However, these algorithms are computationally demanding. Recently, fan-beam algorithms based on Hilbert filtering with inverse distance weight and no weight in the backprojection have been derived using the Hamaker’s relation. These fan-beam reconstruction algorithms have been shown to improve noise uniformity and uniformity in resolution. In this thesis, fan-beam FBP reconstruction algorithms with inverse distance back-projection weight and no backprojection weight for 2D image reconstruction are presented and discussed for the two fan-beam scan geometries -equi-angular and equispace detector array. Based on the proposed and discussed fan-beam reconstruction algorithms with inverse distance backprojection and no backprojection weight, new 3D cone-beam FDK reconstruction algorithms with circular and helical scan trajectories for curved and planar detector geometries are proposed. To start with three rebinning formulae from literature are presented and it is shown that one can derive all fan-beam FBP reconstruction algorithms from these rebinning formulae. Specifically, two fan-beam algorithms with no backprojection weight based on Hilbert filtering for equi-space linear array detector and one new fan-beam algorithm with inverse distance backprojection weight based on hybrid filtering for both equi-angular and equi-space linear array detector are derived. Simulation results for these algorithms in terms of uniformity of noise and resolution in comparison to standard fan-beam FBP reconstruction algorithm (ramp filter based fan-beam reconstruction algorithm) are presented. It is shown through simulation that the fan-beam reconstruction algorithm with inverse distance in the backprojection gives better noise performance while retaining the resolution properities. A comparison between above mentioned reconstruction algorithms is given in terms of computational complexity. The state of the art 3D X-ray imaging systems in medicine with cone-beam (CB) circular and helical computed tomography scanners use non-exact (approximate) FBP based reconstruction algorithm. They are attractive because of their simplicity and low computational cost. However, they produce sub-optimal reconstructed images with respect to cone-beam artifacts, noise and axial intensity drop in case of circular trajectory scan imaging. Axial intensity drop in the reconstructed image is due to the insufficient data acquired by the circular-scan trajectory CB CT. This thesis deals with investigations to improve the image quality by means of the Hilbert and hybrid filtering based algorithms using redundancy data for Feldkamp, Davis and Kress (FDK) type reconstruction algorithms. In this thesis, new FDK type reconstruction algorithms for cylindrical detector and planar detector for CB circular CT are developed, which are obtained by extending to three dimensions (3D) an exact Hilbert filtering based FBP algorithm for 2D fan-beam beam algorithms with no position dependent backprojection weight and fan-beam algorithm with inverse distance backprojection weight. The proposed FDK reconstruction algorithm with inverse distance weight in the backprojection requires full-scan projection data while the FDK reconstruction algorithm with no backprojection weight can handle partial-scan data including very short-scan. The FDK reconstruction algorithms with no backprojection weight for circular CB CT are compared with Hu’s, FDK and T-FDK reconstruction algorithms in-terms of axial intensity drop and computational complexity. The simulation results of noise, CB artifacts performance and execution timing as well as the partial-scan reconstruction abilities are presented. We show that FDK reconstruction algorithms with no backprojection weight have better noise performance characteristics than the conventional FDK reconstruction algorithm where the backprojection weight is known to result in spatial non-uniformity in the noise characteristics. In this thesis, we present an efficient method to reduce the axial intensity drop in circular CB CT. The efficient method consists of two steps: the first one is reconstruction of the object using FDK reconstruction algorithm with no backprojection weight and the second is estimating the missing term. The efficient method is comparable to Zhu et al.’s method in terms of reduction in axial intensity drop, noise and computational complexity. The helical scanning trajectory satisfies the Tuy-smith condition, hence an exact and stable reconstruction is possible. However, the helical FDK reconstruction algorithm is responsible for the cone-beam artifacts since the helical FDK reconstruction algorithm is approximate in its derivation. In this thesis, helical FDK reconstruction algorithms based on Hilbert filtering with no backprojection weight and FDK reconstruction algorithm based on hybrid filtering with inverse distance backprojection weight are presented to reduce the CB artifacts. These algorithms are compared with standard helical FDK in-terms of noise, CB artifacts and computational complexity.

The primary goal of this work is to arrive at direction tomography (DT) algorithms freed from the severe linearization in the formulation, and as-assumptions on variation of the refractive index distribution (RID), involved in the earlier approaches based on Born and Royton approximations and the Fourier di reaction theorem (FDT). To start with, a direct single-step re-covery of RID from intensity measurements is demonstrated, replacing the common two-step procedure involving, rest the recovery of phase from in-density followed by the inversion of scattered led for the RID. The information loss, unavoidable in a two-step procedure is thus successfully addressed. Secondly, an iterative method which works with a forward model obtained directly from the Helmholtz equation is developed. This forward model, though has simplifying assumptions, is more general and can accommodate larger variations in RID than that allowed in the previous linear models. The iterative procedure has an update step which uses a linearization of the forward model and a re-linearization step at the updated RID. The procedure which directly employs the measured intensities is used as part of a deterministic Gauss-Newton algorithm and a stochastic optimization algorithm which uses the ensemble Kalman lter to arrive at the recursive update. The stochastic method is found to be more noise-tolerant and efficient to take care of process model inaccuracies. The proof is seen in better reconstructions from experimental data for two example objects, namely, a graded-index optical bre and a photonic-crystal bre. It is further ob-served that the reconstructions from photonic crystal bre are blurred, noisy and less accurate. Identifying the inaccurate implementation of the modemed Helmholtz equation for large k values employing the current sampling rate as the shortcoming, a new procedure, which splits the bandwidth into smaller components using short-time Fourier Transform is developed. The set of equations arrived at, each t for a narrow frequency band, is solved and the solutions are reassembled to obtain the scattered led for the original problem. The simulated di rated intensities so obtained are better matched to their measured experimental counterparts. However, the impel-mentation of the mode end procedure is computation-intensive, for which a parallel-processing machine can be a good solution. The recovery of RID with this mode cation is not attempted in this work and is left for future implementation.

[ES] La tomografía por difracción surge para mejorar las técnicas de imagen al considerar la naturaleza ondulatoria de la luz. Mientras que los primeros sistemas de imagen médica se basaban únicamente en fuentes sin difracción, este enfoque consigue mejorar la reconstrucción del índice de refracción de los objetos, lo que permite, por ejemplo, el estudio de estructuras subcelulares. Del mismo modo, la demanda de redes de telecomunicaciones cada vez más rápidas y seguras ha propiciado la aparición de la fotónica. Hace dos décadas, la combinación de estos dos campos dio lugar a los primeros sistemas de tomografía por difracción óptica (ODT), los cuáles han evolucionado rápidamente durante este siglo. En esta tesis, presentamos dos nuevas aplicaciones de la ODT. La primera está relacionada con el concepto del microscopio tomográfico de fase (TPM), una versión de la ODT que permite el estudio de células aisladas, con muchas aplicaciones biomédicas, como el diagnóstico y la prognosis del cáncer. Sin embargo, los sistemas TPM actuales son caros, pesados y complejos. Para resolver estos problemas, proponemos el concepto de TPM en chip. Con este fin, diseñamos una hoja de ruta hacia el primer dispositivo tomográfico integrado en el marco de la tecnología lab-on-a-chip (LoC), y desarrollamos los primeros pasos para ello: 1) Hasta ahora, sólo se han utilizado detectores planos para obtener los mapas de índice de refracción de los objetos estudiados en TPM, basados en la detección del campo difractado hacia delante. Sin embargo, los principios físicos fundamentales indican que medir también el campo difractado hacia detrás debería mejorar la resolución de las imágenes. Además, un detector plano no es la configuración óptima para el TPM en chip. En esta línea, hemos explorado la posibilidad de usar detectores circulares en este escenario, como una técnica más adecuada para las configuraciones en chip, demostrando al mismo tiempo que este enfoque proporciona una mejor resolución que el lineal. 2) Proponemos un esquema de TPM en chip basado en el uso de nanoantenas dieléctricas como fuente de luz y píxeles detectores ODT, y caracterizamos experimentalmente su comportamiento mediante microscopía óptica de campo cercano. En cuanto a la segunda aplicación, estudiamos el potencial de la ODT como nuevo paradigma en la detección de capas de invisibilidad realistas, una de las aplicaciones más importantes de los metamateriales. Hasta ahora, el scattering cross section (SCS) se ha utilizado como modelo de referencia para diseñar y observar la eficacia de estos dispositivos para ocultar objetos. En nuestro estudio, demostramos que la ODT puede detectar las capas de invisibilidad prácticas con una sensibilidad superior a la que ofrece el SCS, incluso a las frecuencias de trabajo óptimas. Además, es posible obtener una imagen representativa del tamaño y la forma de la capa, revelando claramente su existencia. Finalmente, se discuten las conclusiones extraídas de los resultados obtenidos. Además, se detallan las futuras líneas de trabajo para abordar los retos que no se han completado en esta tesis doctoral. / [CA] La tomografia per difracció sorgeix per millorar les tècniques d'imatge anteriors en considerar la naturalesa ondulatòria de la llum. Mentre que els primers sistemes d'imatge mèdica es basaven únicament en fonts sense difracció, aquest enfocament aconsegueix millorar la reconstrucció de l'índex de refracció dels objectes, la qual cosa permet, per exemple, l'estudi d'estructures subcelulars. De la mateixa manera, la demanda de xarxes de telecomunicacions cada vegada més ràpides i segures ha propiciat l'aparició de la fotònica. Fa dues dècades, la combinació d'aquests dos camps va portar als primers sistemes de tomografia per difracció òptica (ODT), els quals han evolucionat ràpidament durant aquest segle. En aquesta tesi, presentem dues noves aplicacions de la ODT. La primera està relacionada amb el concepte del microscopi tomogràfic de fase (TPM), una versió de la ODT que permet l'estudi de cèl·lules aïllades, amb moltes aplicacions en biomedicina, com el diagnòstic i prognosi del càncer. No obstant això, els sistemes TPM actuals són cars, pesats i complexos. Per resoldre aquests problemes, proposem el concepte de TPM en xip. Per fer-ho, dissenyem un full de ruta cap al primer dispositiu tomogràfic integrat en el marc de la tecnologia lab-on-a-chip (LoC), i desenvolupem els primers passos a aquest efecte: 1) Fins ara, només s'han utilitzat detectors plans per a obtindre els mapes d'índex de refracció dels objectes estudiats en TPM, basats en la detecció del camp difractat cap avant. No obstant això, els principis físics fonamentals indiquen que mesurar també el camp difractat cap endarrere hauria de millorar la resolució de les imatges. A més, un detector pla no és la configuració òptima per al TPM en xip. En aquesta línia, hem explorat la possibilitat d'usar detectors circulars en aquest escenari, com una tècnica més adequada per a les configuracions en xip, demostrant al mateix temps que aquest enfocament proporciona una millor resolució que el lineal. 2) Proposem un esquema de TPM en xip basat en l'ús de nanoantenes dielèctriques com a font de llum i píxels detectors ODT, i caracteritzem experimentalment el seu comportament en camp pròxim mitjançant microscòpia òptica de camp pròxim. Pel que fa a la segona aplicació, estudiem el potencial de la ODT com a nou paradigma en la detecció de capes d'invisibilitat realistes, una de les aplicacions més importants dels metamaterials. Fins ara, el scattering cross section (SCS) s'ha utilitzat com a model de referència per a dissenyar i observar l'eficàcia d'aquests dispositius per a ocultar objectes. En el nostre estudi, vam demostrar que la ODT pot detectar les capes d'invisibilitat pràctiques amb una sensibilitat superior a la que ofereix el SCS, fins i tot a les freqüències de treball òptimes. A més, és possible obtindre una imatge representativa de la grandària i la forma de la capa, revelant clarament la seua existència. Finalment, es discuteixen les conclusions extretes dels resultats obtinguts i es detallen les futures línies de treball per a abordar els reptes que no s'han completat en aquesta tesi doctoral. / [EN] Diffraction Tomography arises to improve previous imaging techniques by considering the wave nature of light. Whereas the first medical imaging systems relied only on non-diffracting sources, this approach results in an enhanced reconstruction of the object's refractive index distribution, allowing, for example, the study of subcellular structures. Likewise, the demand for increasingly faster and secure telecommunication networks led to the advent of photonics. Two decades ago, the combination of these two fields gave rise to the first optical diffraction tomography (ODT) systems, which have rapidly evolved during this century. In this thesis, we present two novel applications of ODT. The first one is related to the concept of tomographic phase microscopy (TPM), a version of ODT that enables the study of isolated cells, with many applications in biomedicine, such as the diagnosis and prognosis of cancer. Nevertheless, current TPM systems are expensive, heavy, and cumbersome. To solve these issues we propose the concept of on-chip TPM. For this purpose, we design a roadmap towards the first integrated tomographic device in the frame of lab-on-a-chip (LoC) technology and develop the first steps to this end: 1) Until now, only flat detectors have been used to obtain the refractive index maps of the objects studied in TPM, based on the detection of the forward scattering. However, fundamental physical principles indicate that measuring also the backscattered field should improve the resolution of the images. Moreover, a flat detector is not the optimal configuration for on-chip TPM. In this vein, we have explored the possibility of using circular detectors in this scenario as a more suitable technique for on-chip configurations, demonstrating at the same time that this approach provides a better resolution than the linear one. 2) We propose a TPM on-chip scheme based on the use of dielectric nanoantennas as the ODT light source and detector pixels, and experimentally characterize their near-field behavior via scanning near-field optical microscopy. As for the second application, we study the potential of ODT as a new paradigm in the detection of realistic invisibility cloaks, one of the most important applications of metamaterials. Up to now, the scattering cross section (SCS) has been used as the gold standard to design and observe the effectiveness of these devices in hiding objects. In our study, we show that ODT can detect practical invisibility cloaks with a higher sensitivity than that offered by the SCS, even at the optimal working frequencies. Moreover, it is possible to obtain an image depicting the size and shape of the cloak, clearly revealing their existence. Finally, the conclusions drawn from the obtained results are discussed. In addition, future lines of action to address the challenges that have not been completed in this doctoral thesis are detailed. / Díaz Fernández, FJ. (2021). Novel Applications of Optical Diffraction Tomography: On-chip Microscopy and Detection of Invisibility Cloaks [Tesis doctoral]. Universitat Politècnica de València. https://doi.org/10.4995/Thesis/10251/180125