We present a preliminary design for a neutron detection system that is compact, lightweight, and low power consuming, utilizing the CubeSat platform making it suitable for space-based applications. This is made possible using the scintillating crystal lithium indium diselenide ((LiInSe2)-Li-6), the first crystal to include Li-6 in the crystalline structure, and a silicon avalanche photodiode. The schematics of this instrument are presented as well as the response of the instrument to initial testing under alpha radiation. A principal aim of this work is to demonstrate the feasibility of such a neutron detection system within a CubeSat platform. The entire end-to-end system presented here is 10 x 10 x 15 cm(3), weighs 670 g, and requires 5 V direct current at 3 W. (C) 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)

A wide variety of group III-Nitride-based photonic and electronic devices have opened a new era in the field of semiconductor research in the past ten years. The direct and large bandgap nature, intrinsic high carrier mobility, and the capability of forming heterostructures allow them to dominate photonic and electronic device market such as light emitters, photodiodes, or high-speed/high-power electronic devices. Avalanche photodiodes (APDs) based on group III-Nitrides materials are of interest due to potential capabilities for low dark current densities, high sensitivities and high optical gains in the ultraviolet (UV) spectral region. Wide-bandgap GaN-based APDs are excellent candidates for short-wavelength photodetectors because they have the capability for cut-off wavelengths in the UV spectral region (λ < 290 nm). These intrinsically solar-blind UV APDs will not require filters to operate in the solar-blind spectral regime of λ < 290 nm. For the growth of GaN-based heteroepitaxial layers on lattice-mismatched substrates, a high density of defects is usually introduced during the growth; thereby, causing a device failure by premature microplasma, which has been a major issue for GaN-based APDs. The extensive research on epitaxial growth and optimization of Al_x Ga _1-x N (0 ≤ x ≤ 1) grown on low dislocation density native bulk III-N substrates have brought UV APDs into realization. GaN and AlGaN UV <i> p-i-n </i> APDs demonstrated first and record-high true avalanche gain of > 10,000 and 50, respectively. The large stable optical gains are attributed to the improved crystalline quality of epitaxial layers grown on low dislocation density bulk substrates. GaN <i>p-i-n </i> rectifiers have brought much research interest due to its superior physical properties. The AIN-free full-vertical GaN<i> p-i-n </i> rectifiers on<i> n </i>- type 6H-SiC substrates by employing a conducting AIGaN:Si buffer layer provides the advantages of the reduction of sidewall damage from plasma etching and lower forward resistance due to the reduction of current crowding at the bottom<i> n </i> -type layer. The AlGaN:Si nucleation layer was proven to provide excellent electrical properties while also acting as a good buffer role for subsequent GaN growth. The reverse breakdown voltage for a relatively thin 2.5 μm-thick<i> i </i>-region was found to be over -400V.

This thesis describes the fabrication and characterization of GaN homojunction visible-blind ultraviolet (UV) p-i-n avalanche photodiodes (APDs) grown by metalorganic chemical vapor deposition (MOCVD) on free-standing bulk GaN substrates. The objective of this research is to develop GaN UV p-i-n APDs with high linear-mode avalanche gains and the Geiger-mode operation for single photon detection. Low noise, high responsivity, and high detectivity are also required for fabricated APDs used as photodiodes in the photovoltaic mode (zero bias) and the photoconductive mode (low reverse bias). High material defect density and immature fabrication technology have hampered the development of III-nitride APDs in the past. In this thesis, sidewall leakage reduction methods have been developed to achieve significant improvement in dark current density, noise performance, and photo detection performance. A record linear-mode avalanche gain > 10⁵ for GaN APDs was demonstrated at λ = 360 nm. The first Geiger-mode deep UV (DUV) APD using front-illuminated homojunction p-i-n diode structure on a free-standing bulk GaN substrate was also measured with single photo detection efficiency (SPDE) of 1.0 % and dark count probability (DCP) of 0.03 at 265 nm. The performance of fabricated homojunction GaN p-i-n photodiodes was also evaluated in the photoconductive mode as well as the photovoltaic mode. For an 80-µm-diameter device biased at - 20 V (in the photoconductive mode) the dark current density is lower than 40 pA/cm² which is the lowest value achieved for any III-nitride photodiode so far. Its responsivity is 0.140 A/W at 360 nm with an ultraviolet-visible rejection ratio of 8×10³. The room-temperature noise equivalent power is 4.27×10 ⁻¹⁷ W-Hz-[superscript 0.5] and the detectivity D* is 1.66×10¹⁴ cm-Hz[superscript 0.5]-W ⁻¹ at - 20 V. The minimum detectable optical power is as low as 100 fW. They are among the best values reported for reverse-biased GaN p-i-n photodiodes to date.

Over 90% of traffic accidents are caused by human error. Therefore, the realization of autonomous driving could save countless lives and drastically reduce the associated financial expenses. Moreover, the collective behavior of self-driving cars would avoid traffic jams and thus reduce fuel consumption and greenhouse gas emissions. The majority of concepts is based on Light Detection And Ranging (LiDAR), which is the most precise method to measure distances. Matched to the 95% of commercial LiDAR systems based on laser wavelengths of mostly 905nm, siliconbased photo sensors are used. Avalanche photo diodes (APD) are the only sensor solution in mass production [6]. Due to an internal multiplication mechanism based on impact ionization, high signal-noise-ratios (SNR) are achieved and provide the required resolution of low signals from more than 100m distant targets. Currently none of the LiDAR technologies meet the reliability requirements of the automotive industry concerning the aging of installed components. Consequently, autonomous driving cannot yet be realized for public use. Very little is known about the aging of APDs in general and nothing at all in the field of automotive LiDAR. In order to provide novel insights into APD aging that help designers to achieve more robust sensors and thus to enable a step closer to the realization of autonomous driving, it was the aim of this thesis prepared in the industrial environment to reveal the underlying physical aging mechanisms and their effects on the function of APDs in automotive LiDAR application. At first, a novel APD degradation model was developed encompassing a wide range of processes, treating numerous fundamental aspects of negative oxide charge generation and Si:SiO2 interface trap generation. So far, no model is known covering the kinetics of APD degradation comprehensively in such deep detail. Due to the feedback between degradation phenomena and sensor internal fields and currents, a coupled problem arose. It was tackled by a sophisticated numerical iteration approach which was tailor-made and solved this problem self-consistently in a tandem procedure combining the simulation of sensor degradation and the Silvaco Atlas device simulator. This led to novel insights into the APD degradation behavior. The generation of negative oxide charges was identified to cause a drift of the impact ionization rate in the sensor edge. The generation of interface traps promotes the accumulation of negative oxide charges by their supply of thermally generated dark current. In this way, degradation is about 14% faster. In order to reflect not only the causal relations of APD degradation, the model was calibrated on experimental degradation data. With the calibrated degradation model and its self-consistent simulation approach an elaborated powerful tool was available. Stress experiments have been performed on test sensors under a variation of operation conditions and on APDs. APDs of the studied design are currently tested and installed in automotive LiDAR modules. The entire set of experimental results found its complete physical interpretation in conjunction with the degradation model which achieved an excellent agreement. Thereby, numerous novel insights were revealed: The extent of degradation is induced by the properties of the sensors oxide layer. The degradation pace increases with temperature, voltage and intensity of illumination whereas the impact of temperature is particularly strong due to the significant participation of the dark current during degradation. The oxygen vacancy was proven to be the dominant trap in the oxide layer of the studied sensors. An empirical distribution of individual sensor properties was achieved. In some cases, the impact ionization rate in the sensor edge increased which indicates a major problem, as noise increases when the generation- recombination processes in the sensor become more pronounced during degradation. In order to estimate the impact of the degradation induced increase of noise on the LiDAR application, the empirical distribution of individual sensor properties was extrapolated to the tail where sensors are very prone to degradation. Furthermore, the available noise models were extended to cover the effect of degradation. Application of the calibrated APD degradation model revealed, that the APD noise is highly effected and even triples during aging. The origin was exclusively assigned to the edge contribution. There, the avalanche breakdown of the edge dark current caused by degradation is the main initiator. Consequently, for the first time ever, the signal-noise-ratio (SNR) degradation mode of APDs in LiDAR application was identified. During degradation, the SNR of small signals from 100m distant objects degrades to a value below 1, where even theoretically a resolution is impossible. Finally, the picture of APD degradation was completed by the estimation of lifetime. In the case of the most severe conditions in LiDAR operation, it amounts to only 1000 h, which falls much below the requirements of the automotive industry of several decades.

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No description available.

Neste trabalho são apresentados os resultados obtidos no desenvolvimento de um sistema especificado para realizar testes na caracterização de dispositivos fotodetectores como fotodiodos de avalanche. O sistema de ensaios elaborado pretende auxiliar com na caracterização da fotodetecção em dispositivos de acoplamento de cargas com multiplicação de elétrons (EMCCD). O objetivo deste trabalho é avaliar o desempenho dos dispositivos fotodetectores para caracterizar os parâmetros mais significativos no processo da transdução óptica de modo a colaborar no projeto da eletrônica embarcada de controle e leitura da informação contida no EMCCD. A tecnologia da multiplicação dos elétrons em dispositivos CCD e diodos de avalanche têm aplicações importantes na vigilância de ambiente de luminosidade reduzida, astronomia, além de outras aplicações de imagens científicas incluindo as de baixo nível de bioluminescência para identificação de drogas e aplicações da engenharia genética. Para efeito de avaliação do desempenho do sistema fotodetector foi necessário desenvolver uma infra-estrutura para ter controle adequado da temperatura de operação do EMCCD. Foram nomeadas as opções com uma montagem de resfriamento com células Peltier e uma opção por criogenia resfriada com nitrogênio líquido. Os resultados obtidos são úteis na detecção de sinais luminosos ultrafracos minimizando o ruído do detector na aquisição de imagens com o auxilio da instrumentação de um filtro óptico sintonizável que será integrado no telescópio SOAR de 4 metros, instalado no Chile, para observações melhoradas com óptica adaptativa. / This work presents the results obtained in the development of a system specified to perform tests in the characterization of photo-detectors devices such as avalanche photodiodes. The test system is prepared to contribute to the characterization of the photo-detection in charge-coupled devices with electron multiplication (EMCCD). The objective of this study is to evaluate the performance of photo-detectors devices to characterize the most significant parameters in the optic transduction in order to collaborate in the project of an embedded electronic system for controlling and reading the information contained with the EMCCD. The technology of the electron multiplication in CCD devices and avalanche diodes has important applications in monitoring the environment of low light, astronomy and other scientific imaging applications including the low level of bioluminescence for the identification of drugs and applications of genetic engineering. For purposes of assessing the performance of the photo-detector it was necessary to develop an infrastructure to have proper control of the operating temperature of the EMCCD. Options were named with a montage of Peltier cell cooling and a choice of cryogenically cooled with liquid nitrogen. The results are useful in the detection of ultra weak light signals while minimizing detector noise during the acquisition of images from instrument comprising an optical tunable filter, that will be integrated into SOAR 4 meters telescope, installed in Chile, for observations improved with adaptive optics.

Neste trabalho são apresentados os resultados obtidos no desenvolvimento de um sistema especificado para realizar testes na caracterização de dispositivos fotodetectores como fotodiodos de avalanche. O sistema de ensaios elaborado pretende auxiliar com na caracterização da fotodetecção em dispositivos de acoplamento de cargas com multiplicação de elétrons (EMCCD). O objetivo deste trabalho é avaliar o desempenho dos dispositivos fotodetectores para caracterizar os parâmetros mais significativos no processo da transdução óptica de modo a colaborar no projeto da eletrônica embarcada de controle e leitura da informação contida no EMCCD. A tecnologia da multiplicação dos elétrons em dispositivos CCD e diodos de avalanche têm aplicações importantes na vigilância de ambiente de luminosidade reduzida, astronomia, além de outras aplicações de imagens científicas incluindo as de baixo nível de bioluminescência para identificação de drogas e aplicações da engenharia genética. Para efeito de avaliação do desempenho do sistema fotodetector foi necessário desenvolver uma infra-estrutura para ter controle adequado da temperatura de operação do EMCCD. Foram nomeadas as opções com uma montagem de resfriamento com células Peltier e uma opção por criogenia resfriada com nitrogênio líquido. Os resultados obtidos são úteis na detecção de sinais luminosos ultrafracos minimizando o ruído do detector na aquisição de imagens com o auxilio da instrumentação de um filtro óptico sintonizável que será integrado no telescópio SOAR de 4 metros, instalado no Chile, para observações melhoradas com óptica adaptativa. / This work presents the results obtained in the development of a system specified to perform tests in the characterization of photo-detectors devices such as avalanche photodiodes. The test system is prepared to contribute to the characterization of the photo-detection in charge-coupled devices with electron multiplication (EMCCD). The objective of this study is to evaluate the performance of photo-detectors devices to characterize the most significant parameters in the optic transduction in order to collaborate in the project of an embedded electronic system for controlling and reading the information contained with the EMCCD. The technology of the electron multiplication in CCD devices and avalanche diodes has important applications in monitoring the environment of low light, astronomy and other scientific imaging applications including the low level of bioluminescence for the identification of drugs and applications of genetic engineering. For purposes of assessing the performance of the photo-detector it was necessary to develop an infrastructure to have proper control of the operating temperature of the EMCCD. Options were named with a montage of Peltier cell cooling and a choice of cryogenically cooled with liquid nitrogen. The results are useful in the detection of ultra weak light signals while minimizing detector noise during the acquisition of images from instrument comprising an optical tunable filter, that will be integrated into SOAR 4 meters telescope, installed in Chile, for observations improved with adaptive optics.

This dissertation describes the development of III-nitride (III-N) bipolar devices for optoelectronic and electronic applications. Research mainly involves device design, fabrication process development, and device characterization for Geiger-mode gallium nitride (GaN) deep-UV (DUV) p-i-n avalanche photodiodes (APDs), indium gallium nitride (InGaN)/GaN-based violet/blue laser diodes (LDs), and GaN/InGaN-based npn radio-frequency (RF) double-heterojunction bipolar transistors (DHBTs). All the epitaxial materials of these devices were grown in the Advanced Materials and Devices Group (AMDG) led by Prof. Russell D. Dupuis at the Georgia Institute of Technology using the metalorganic chemical vapor deposition (MOCVD) technique. Geiger-mode GaN p-i-n APDs have important applications in DUV and UV single-photon detections. In the fabrication of GaN p-i-n APDs, the major technical challenge is the sidewall leakage current. To address this issue, two surface leakage reduction schemes have been developed: a wet-etching surface treatment technique to recover the dry-etching-induced surface damage, and a ledged structure to form a surface depletion layer to partially passivate the sidewall. The first Geiger-mode DUV GaN p-i-n APD on a free-standing (FS) c-plane GaN substrate has been demonstrated. InGaN/GaN-based violet/blue/green LDs are the coherent light sources for high-density optical storage systems and the next-generation full-color LD display systems. The design of InGaN/GaN LDs has several challenges, such as the quantum-confined stark effect (QCSE), the efficiency droop issue, and the optical confinement design optimization. In this dissertation, a step-graded electron-blocking layer (EBL) is studied to address the efficiency droop issue. Enhanced internal quantum efficiency (ɳi) has been observed on 420-nm InGaN/GaN-based LDs. Moreover, an InGaN waveguide design is implemented, and the continuous-wave (CW)-mode operation on 460-nm InGaN/GaN-based LDs is achieved at room temperature (RT). III-N HBTs are promising devices for the next-generation RF and power electronics because of their advantages of high breakdown voltages, high power handling capability, and high-temperature and harsh-environment operation stability. One of the major technical challenges to fabricate high-performance RF III-N HBTs is to suppress the base surface recombination current on the extrinsic base region. The wet-etching surface treatment has also been employed to lower the surface recombination current. As a result, a record small-signal current gain (hfe) > 100 is achieved on GaN/InGaN-based npn DHBTs on sapphire substrates. A cut-off frequency (fT) > 5.3 GHz and a maximum oscillation frequency (fmax) > 1.3 GHz are also demonstrated for the first time. Furthermore, A FS c-plane GaN substrate with low epitaxial defect density and good thermal dissipation ability is used for reduced base bulk recombination current. The hfe > 115, collector current density (JC) > 141 kA/cm², and power density > 3.05 MW/cm² are achieved at RT, which are all the highest values reported ever on III-N HBTs.

This dissertation thesis deals with a long range free space optical links for communication over the distance of few tens of kilometers in the atmosphere. The problematic of the beam propagation and atmospheric effects influencing the beam and the quality of the communication protocol are discussed. The measuring link is also designed to study the parameters of the communication link work conditions. The measuring link consists of two heads. The transmitter head is designed to use two optical beams with laser diodes at the wavelength of the atmospheric windows 850 or 1550 nm and the overall power of hundredths of mW. The receiver head includes the Fressnel lens. For the detection of very weak signal, the avalanche photodiode is used. In the end of this work, due to the high power of the transmitting optical beam, the laser safety conditions are also discussed, including the deduced optical transmitters construction recommendations.