NDLTD Global ETD Search
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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

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1

The role of defects on Schottky and Ohmic contact characteristics for GaN and AlGaN/GaN high-electron mobility transistors

Walker, Dennis Eugene, Jr. 15 March 2006 (has links)
No description available.
GaN
AlGaN
HEMT
Schottky
Ohmic
contacts
CL
cathodoluminescence
UHV
surface cleaning
Auger
AES
RIE
defect
current collapse
cleave

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