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Electron wavefunctions at crystal interfacesPatitsas, Stathis Nikos January 1990 (has links)
A one dimensional analysis of the boundary conditions of the electron energy eigenfunc-tion at a sharp interface between two crystals was made. An attempt to evaluate these conditions in terms of known band structure was made. It was concluded that this cannot be done in general. It was shown, however, that if the interface has the proper symmetry properties, the boundary conditions can be expressed in terms of only one unknown, energy-dependent parameter. It was concluded that setting this parameter equal to one gives boundary conditions which, though more general, are equivalent to the commonly used effective mass boundary conditions when they are applicable. It was concluded from numerical results for the transmission coefficient of the symmetric interface, that in general, these boundary conditions, which depend only on known band structure, do not give a good approximation to the exact answer. Since the energy dependence of the parameter mentioned above is described quite well qualitatively using the nearly free electron approximation or the tight-binding approximation, the applicability of any boundary conditions depending only on band structure can be predicted using these simple theories. The exact numerical results were calculated using the transfer matrix method. It was also concluded that the presence of symmetry in the interface either maximizes or minimizes the transmission coefficient. A tight-binding calculation showed that the transmission coefficient depends on an interface parameter which is independent of band structure. The transmission coefficient is maximized when this parameter is ignored. It was concluded that the effective mass equation is of little use when applied to this problem. Some transfer matrix results pertaining to the barrier and the superlattice were obtained. / Science, Faculty of / Physics and Astronomy, Department of / Graduate
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Detection of Hall effect in single crystal trigonal selenium.Chan, Alfred Kai-Tai. January 1972 (has links)
No description available.
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Pulsed forward, current-voltage characteristics in monocrystalline Cd-Se-Te structures.McLaughlin, Charles Randolph January 1971 (has links)
No description available.
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DE HAAS - VAN ALPHEN EFFECT IN QUENCHED PLATINUM CRYSTALS.BOUFELFEL, ALI. January 1987 (has links)
The oscillatory de Haas-van Alphen (DHVA) magnetization has been studied in Pt crystals containing more than 100 ppm vacancies. Magnetic fields as high as 75 kG were used. The oscillations were observed at temperatures as low as 0.45 k, and found to be strongly attenuated by the vacancies in this concentration range. The emphasis of this work is on the measurement of this attenuation for the purpose of studying conduction electron scattering due to single vacancies. Dingle (scattering) temperatures due to vacancies are reported for four cyclotron orbits with the field in a (110) plane, along with a new measurement of the cyclotron effective mass (m* = 2.31 ± 0.03) for the electron orbit 33° away from <100>. Vacancies were generated by quenching Pt single crystals from temperatures as high as 1730 °C in air, using a technique which minimizes the induced strain. The vacancy contribution to the electron scattering rate was separated by measuring the Dingle temperature in both quenched and annealed specimens which had been subjected to the same quenching process. The results suggest that there is only a moderate variation in this scattering rate over the s-p-like electron sheet of the Fermi surface. However, the scattering rate for the d-like open hole sheet, which contacts the Brillouin zone, is about 49% larger than that for the electron sheet. This anisotropy is attributed mainly to the lattice distortion around a vacancy and to the difference between the hole and electron wave-function symmetries.
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Flexoelectricity in nematic liquid crystalsKischka, Claudius January 2011 (has links)
Flexoelectricity in liquid crystals is thought to be due to a coupling between dielectric properties and shape anisotropy of the molecules and described by the fiexoelectric coefficients el and e3. Two experiments are needed to measure el and e3 and it is usual to measure the difference (el - e3) and the sum (el + e3) and then calculate el and e3· The first experiment to measure the difference (el - e3) uses a TN structure with an in-plane applied electric field. Due to the dielectric coupling, the director aligns with the electric field and due to the fiexoelectric effect, the director tilts out of plane. This tilt is measured optically using two laser beams at oblique incidence, e.g. 45°. Using a theoretical model the experimental data is fitted and the difference (el - e3) extracted. The second experiment to measure the sum (el + e3) uses a Pi cell. Applying an ac voltage the transmission through the device is a repeating oscillating signal which contains 1st and 2nd harmonics. The 1st harmonic corresponds to the fiexoelectric effect and the 2nd harmonic to the dielectric effect. Using a lock-in amplifier, the harmonics were measured and the sum (el + e3) extracted using a theoretical model to fit the experimental data. Unfortunately, the data proved the experiment to be unreliable and another method was developed, which uses a BAN cell. The third experiment uses simple pulses in a BAN cell and also measures the sum (el + e3). The big disadvantage of the BAN cell is an internal voltage, which is created by the homeotropic alignment layer and the fiexoelectric polarisation. The internal voltage has the same effect on the director profile as the fiexoelectric effect, which is a big problem in measuring fiexoelectricity. Using a material, which is non ionic and has no fiexoelectricity, the internal bias could be measured and taken into account. Applying short de pulses of opposite sign, the fiexoelectric effect can be observed by the optical response and can be measured. Using these experiments, a number of investigation are being carried out such as the correlation between fiexoelectricity and the molecular structure, ions, elastic properties, molecular orientation, dielectric anisotropy 6E, and order parameter S. The results showed that fiexoelectricity only depends on ions and dielectric properties which was very interesting and surprising at the same time.
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Electrical characterization of SiC/Si heterostructure by ion implantation of carbon.January 1996 (has links)
by Ho Lai-Ching. / Year shown on spine: 1997. / Thesis (M.Phil.)--Chinese University of Hong Kong, 1996. / Includes bibliographical references (leaves xiii-xvii). / ACKNOWLEDGMENT --- p.I / ABSTRACT --- p.II / CONTENTS --- p.IV / FIGURE CAPTIONS --- p.VI / TABLE CAPTIONS --- p.IX / Chapter CHAPTER 1 --- INTRODUCTION --- p.1 / Chapter CHAPTER 2 --- A BRIEF REVIEW OF ION BEAM SYNTHESIS OF SiC --- p.5 / Chapter CHAPTER 3 --- SAMPLE PREPARATION AND MEASUREMENT METHODS --- p.9 / Chapter 3.1 --- Sample Preparation --- p.9 / Chapter 3.1.1 --- MEVVA Implantation --- p.9 / Chapter 3.1.2 --- Implantation Conditions --- p.12 / Chapter 3.2 --- Characterization Methods --- p.14 / Chapter 3.2.1 --- Spreading Resistance Profiling (SRP) --- p.14 / Chapter 3.2.1.1 --- Principle of SRP Measurement Method --- p.14 / Chapter 3.2.1.2 --- Sample Preparation and Measurement --- p.15 / Chapter 3.2.2 --- Current-Voltage Measurement (I-V) --- p.17 / Chapter 3.2.3 --- Infrared Transmission Measurements (IR) --- p.19 / Chapter CHAPTER 4 --- RESULTS AND DISCUSSIONS --- p.20 / Chapter 4.1 --- Results of SRP Measurements --- p.20 / Chapter 4.2 --- Results of I-V Measurements --- p.27 / Chapter 4.3 --- Results of IR Measurements --- p.34 / Chapter 4.4 --- Discussions --- p.39 / Chapter 4.4.1 --- IR Absorption Results --- p.39 / Chapter 4.4.2 --- Hot Probe Measurement Results --- p.45 / Chapter 4.4.3 --- SRP Depth Profiles --- p.50 / Chapter 4.4.4 --- Current Transport Mechanism --- p.55 / Chapter 4.4.5 --- Ideality Factor and Transport Mechanisms --- p.76 / Chapter CHAPTER 5 --- CONCLUSIONS AND FUTURE WORKS --- p.85 / Chapter 5.1 --- Conclusions --- p.85 / Chapter 5.2 --- Future Works --- p.86 / APPENDIX --- p.i / BIBLIOGRAPHY --- p.xiii
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Inversion-Asymmetry Splitting of the Conduction Band in N-Type Indium AntimonideBajaj, Bhushan D. 12 1900 (has links)
The origin of the Shubnikov-de Haas effect, the strain theory developed by Bir and Pikus, and a simple, classical beating-effects model are discussed. The equipment and the experimental techniques used in recording the Shubnikov-de Haas oscillations of n-type indium antimonite are described. The analysis of the experimental data showed that the angular anisotropy of the period of SdH oscillations at zero stress was unmeasurable for low concentration samples as discussed by other workers. Thus the Fermi surfaces of InSb are nearly spherical at low concentration. It was also shown that the Fermi surface of a high concentration sample of InAs is also nearly spherical. The advantages of using the magnetic field modulation and phase sensitive detection techniques in determining the beats are given. The simple, classical beating-effects model is able to explain the experimental beating effect data in InSb. The computer programs used to obtain the theoretical values of the beat nodal position, SdH frequencies, average frequency, the Fermi surface contours, and the energy eigenvalues are given.
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A 6% efficient MIS particulate silicon solar cellGreer, Michael R. 09 March 1998 (has links)
Graduation date: 1998
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Crystallographic variations of field emission from single tungsten crystalsJanuary 1952 (has links)
M.K. Wilkinson. / "May 7, 1952." / Bibliography: p. 18. / Army Signal Corps Contract DA36-039 sc-100, Project no. 8-102B-0. Dept. of the Army Project no. 3-99-10-022.
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Field effect measurements on amorphous silicon produced by chemical vapor depositionHey, Hans Peter Willy January 1981 (has links)
No description available.
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