NDLTD Global ETD Search
  • Refine Query
  • Source
  • Publication year
  • to
  • Language
  • 3
  • Tagged with
  • 3
  • 3
  • 3
  • 3
  • 3
  • 3
  • 3
  • 3
  • 3
  • 2
  • 2
  • 2
  • 2
  • 2
  • 2
  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

Search results

Showing 1 to 3 of 3 (0.082 seconds)
1

Characterizing and Understanding Performance Limiting Defects in β-Ga<sub>2</sub>O<sub>3</sub> Transistors

McGlone, Joseph Francis, II January 2022 (has links)
No description available.
Electrical Engineering
Nanotechnology
Gallium oxide
Ga2O3
defect spectroscopy
traps
defects
reliability
dynamic on-resistance
deep level transient spectroscopy
DLTS
deep level optical spectroscopy
DLOS
PAMBE
MOCVD
Radiation
2

Investigation of electrically-active defects in AlGaN/GaN high electron mobility transistors by spatially-resolved spectroscopic scanned probe techniques.

Cardwell, Drew 16 September 2013 (has links)
No description available.
Solid State Physics
Electrical Engineering
3

Quantitative spectroscopy of reliability limiting traps in operational gallium nitride based transistors using thermal and optical methods

Sasikumar, Anup January 2014 (has links)
No description available.
Electrical Engineering
Materials Science

Page generated in 0.0859 seconds