- About
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The Global ETD Search service is a free service for researchers
to find electronic theses and dissertations. This service is
provided by the
Networked Digital Library of Theses and Dissertations.
Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
Search results
Showing 181 to 190 of 761 (0.021 seconds)Spelling suggestions: "subject:"fieldeffect"" "subject:"fields:effect""
| 181 |
GaAs MESFET modeling and its applicationsHo, Wai. January 1993 (has links)
Thesis (M.S.)--Ohio University, November, 1993. / Title from PDF t.p.
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| 182 |
Computerized evaluation of parameters for HEMT, DC and microwave S parameter modelsChen, Lu. January 1995 (has links)
Thesis (M.S.)--Ohio University, November, 1995. / Title from PDF t.p.
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| 183 |
1/f AM and PM noise in a common source heterojunction field effect transistor amplifierCardon, Christopher Don. January 2007 (has links)
Thesis (M.S.)--University of Wyoming, 2007. / Title from PDF title page (viewed on July 28, 2008). Includes bibliographical references (p. 61-62).
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| 184 |
Buried-channel silicon carbide MOSFETS /Wagner, William E., January 1997 (has links)
Thesis (Ph. D.)--Lehigh University, 1997. / Includes vita. Bibliography: leaves 117-141.
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| 185 |
Investigation of electrical characteristics of III-V MOS devices with silicon interface passivation layerZhu, Feng, January 1900 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2008. / Vita. Includes bibliographical references.
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| 186 |
Surface and interface modification of alternative semiconductor materials for advanced transistorsJiang, Qi, January 2009 (has links)
Thesis (M.S.)--Rutgers University, 2009. / "Graduate Program in Chemistry and Chemical Biology." Includes bibliographical references (p. 29-31).
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| 187 |
Reliability of advanced dielectrics in gate oxide and device level packaging in MEMSRahman, Mohammad Shahriar. January 2009 (has links)
Thesis (Ph.D.)--University of Texas at Arlington, 2009.
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| 188 |
A study of electron transport in the inversion layer advanced silicon carbide (SiC) power MOSFETs /Zeng, Yu (Anne), January 2004 (has links)
Thesis (Ph. D.)--Lehigh University, 2004. / Includes vita. Includes bibliographical references (leaves 85-89).
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| 189 |
Hafnium dioxide gate dielectrics, metal gate electrodes, and phenomena occurring at their interfacesSchaeffer, James Kenyon, Ekerdt, John G. January 2004 (has links) (PDF)
Thesis (Ph. D.)--University of Texas at Austin, 2004. / Supervisor: John G. Ekerdt. Vita. Includes bibliographical references. Also available from UMI.
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| 190 |
Linearity analysis of single and double-gate silicon-on-insulator metal-oxide-semiconductor-field-effect-transistor /Ma, Wei. January 2004 (has links)
Thesis (M.S.)--Ohio University, August, 2004. / Includes bibliographical references (p. 64-66).
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