71 |
Symbolic methods in simulation-based verificationYuan, Jun 28 August 2008 (has links)
Not available / text
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72 |
Global interconnect modeling for a Gigascale System-on-a-Chip (GSoC)Zarkesh-Ha, Paymen 05 1900 (has links)
No description available.
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73 |
Design rules for RF and microwave flip-chipStaiculescu, Daniela 08 1900 (has links)
No description available.
|
74 |
Statistical prediction of integrated circuit performance based on circuit design and test structure evaluationGibson, David 08 1900 (has links)
No description available.
|
75 |
Characterization of hot-carriers induced degradation via small signal characterisations in MOSFETSLau, M. P. Unknown Date (has links)
No description available.
|
76 |
Silicon-on-sapphire MOSFETs parameters extraction by small-signal measurementKong, F. Unknown Date (has links)
No description available.
|
77 |
Development of electronic instrument for defect measurements with eddy currentsPrabhakaran, P. Unknown Date (has links)
No description available.
|
78 |
Development of a decomposition approach for testing large analog circuitsDai, Hong. January 1989 (has links)
Thesis (Ph. D.)--Ohio University, June, 1989. / Title from PDF t.p.
|
79 |
Deform a new approach for redistributing placements /Paroski, Andrew John. January 2006 (has links)
Thesis (M.S.)--State University of New York at Binghamton, Department of Computer Science, Thomas J. Watson School of Engineering and Applied Science, 2006. / Includes bibliographical references.
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80 |
Process variation-resistant dynamic power optimization of VLSI circuitsHu, Fei, January 2005 (has links) (PDF)
Thesis (Ph.D.)--Auburn University, 2005. / Abstract. Vita. Includes bibliographic references (ℓ. 165-179)
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