Gravitational lensing studies the distortions of a distant galaxy’s observed size, shape or flux due to the tidal bending of photons by matter between the source and observer. Such distortions can be used to infer knowledge on the mass distribution of the intervening matter, such as the dark matter halos in which clusters of individual galaxies may reside, or on cosmology through the statistics of the matter density of large scale structure and geometrical factors. In particular, gravitational lensing has the advantage that it is insensitive to the nature of the lensing matter. However, contamination of the signal by correlations between galaxy shape or size and local environment complicate a lensing analysis. Further, measurement of traditional lensing estimators is made more difficult by limitations on observations, in the form of atmospheric distortions or optical limits of the telescope itself. As a result, there has been a large effort within the lensing community to develop methods to either reduce or remove these contaminants, motivated largely by stringent science requirements for current and forthcoming surveys such as CFHTLenS, DES, LSST, HSC, Euclid and others. With the wealth of data from these wide-field surveys, it is more important than ever to understand the full range of independent probes of cosmology at our disposal. In particular, it is desirable to understand how each probe may be used, individually and in conjunction, to maximise the information of a lensing analysis and minimise or mitigate the systematics of each. With this in mind, I investigate the use of galaxy clustering measurements using photometric redshift information, including a contribution from flux magnification, as a probe of cosmology. I present cosmological forecasts when clustering data alone are used, and when clustering is combined with a cosmic shear analysis. I consider two types of clustering analysis: firstly, clustering with only redshift auto-correlations in tomographic redshift bins; secondly, clustering using all available redshift bin correlations. Finally, I consider how inferred cosmological parameters may be biased using each analysis when flux magnification is neglected. Results are presented for a Stage–III ground-based survey, and a Stage–IV space-based survey modelled with photometric redshift errors, and values for the slope of the luminosity function inferred from CFHTLenS catalogues. I find that combining clustering information with shear gives significant improvement on cosmological parameter constraints, with the largest improvement found when all redshift bins are included in the analysis. The addition of galaxy-galaxy lensing gives further improvement, with a full combined analysis improving constraints on dark energy parameters by a factor of > 3. The presence of flux magnification in a clustering analysis does not significantly affect the precision of cosmological constraints when combined with cosmic shear and galaxy-galaxy lensing. However if magnification is neglected, inferred cosmological parameter values are biased, with biases in some cosmological parameters found to be larger than statistical errors. We find that a combination of clustering, cosmic shear and galaxy-galaxy lensing can provide a significant reduction in statistical errors from each analysis individually, however care must be taken to measure and model flux magnification. Finally, I consider how measurements of galaxy size and flux may be used to constrain the dark matter profile of a foreground lens, such as galaxy- or galaxy-cluster-dark matter halos. I present a method of constructing probability distributions for halo profile free parameters using Bayes’ Theorem, provided the intrinsic size-magnitude distribution may be measured from data. I investigate the use of this method on mock clusters, with an aim of investigating the precision and accuracy of returned parameter constraints under certain conditions. As part of this analysis, I quantify the size and significance of inaccuracies in the dark matter reconstruction as a result of limitations in the data from which the sample and size-magnitude distribution is obtained. This method is applied to public data from the Space Telescope A901/902 Galaxy Evolution Survey (STAGES), and results are presented for the four STAGES clusters using measurements of source galaxy size and magnitude, and a combination of both. I find consistent results with existing shear measurements using measurements of galaxy magnitudes, but interesting inconsistent results when galaxy size measurements are used. The simplifying assumptions and limitations of the analysis are discussed, and extensions to the method presented.

Advances in microlithography, dry etching, scaling of devices, ion-implantation, process control, and computer aid design brought the integrated circuit technology into the era of VLSI circuits. Those circuits are characterized by high packing density, improved performance, complex circuits, and large chip sizes. Interconnects and their spacing dominate the chip area of VLSI circuits and they degrade the circuit performance through the unacceptable high time delays. Multilayer metallization enables shorter interconnects, ease of design and yet higher packing density for VLSI circuits. It was shown in this dissertation that, tungsten films deposited in a cold-wall LPCVD reactor offer viable solution to the problems of VLSI multilayer interconnects. Experiments showed that LPCVD tungsten films have good uniformity, high purity, low resistivity, low stress-good adherence and are readily patterned into high resolution lines. Moreover, a multilayer interconnect system consisting of three layers of tungsten metallization followed by a fourth layer of aluminum metallization has been designed, fabricated and tested. The interlevel dielectric used to separate the metal layers was CVD phosphorus doped silicon dioxide. Low ohmic contacts were achieved for heavily doped silicon. Also, low resistance tungsten-tungsten intermetallic contacts were obtained. In addition to excellent step coverage, high electromigration resistance of interconnects was realized. Finally, CMOS devices and logic gates were successfully fabricated and tested using tungsten multilayer metallization schemes.

In this dissertation, performance analyses for large-scale antennas equipped two-way amplify-and-forward (AF) relaying and heterogeneous network (HetNet) are carried out. Energy-efficiency oriented design becomes more important for the next generation of wireless systems, which motivates us to study the strong candidates, such as massive multiple-input multiple-output (MIMO) combined with cooperative relaying and HetNet. Based on the achievable rate analyses for both massive MIMO two-way AF relaying, effective power allocation schemes are presented to further improve system performance. Focusing on the MIMO downlinks in the HetNet, mean square error (MSE) based precoding schemes are designed and employed by the macro base station (BS) and the small cell (SC) nodes. Considering a HetNet where both macro BS and SC nodes are equipped with large-scale antenna arrays, the capacity lower bounds are derived, followed by the proposed user scheduling algorithms. The work on multi-pair two-way AF relaying with linear processing considers a system where multiple sources exchange information via a relay equipped with massive antennas. Given that channel estimation is non-ideal, and that the relay employs either maximum-ratio combining/maximum-ratio transmission (MRC/MRT) or zero-forcing reception/zero-forcing transmission (ZFR/ZFT) beamforming, we derive two corresponding closed-form lower bound expressions for the ergodic achievable rate of each pair sources. The closed-form expressions enable us to design an optimal power allocation (OPA) scheme that maximizes the sum spectral efficiency under certain practical constraints. As the antenna array size tends to infinity and the signal to noise ratios become very large, asymptotically optimal power allocation schemes in simple closed-form are derived. The capacity lower bounds are verified to be accurate predictors of the system performance by simulations, and the proposed OPA outperforms equal power allocation (EPA). It is also found that in the asymptotic regime, when MRC/MRT is used at the relay and the link end-to-end large-scale fading factors among all pairs are equal, the optimal power allocated to a user is inverse to the large-scale fading factor of the channel from the user to the relay, while OPA approaches EPA when ZFR/ZFT is adopted. The work on the MSE-based precoding design for MIMO downlinks investigates a HetNet system consisting of a macro tier overlaid with a second tier of SCs. First, a new sum-MSE of all users based minimization problem is proposed aiming to design a set of macro cell (MC) and SC transmit precoding matrices or vectors. To solve it, two different algorithms are presented. One is via a relaxed-constraints based alternating optimization (RAO) realized by efficient alternating optimization and relaxing non-convex constraints to convex ones. The other is via an unconstrained alternating optimization with normalization (UAON) implemented by introducing the constraints into the iterations with the normalization operation. Second, a separate MSE minimization based two-level precoder is proposed by considering the signal and interference terms corresponding to the macro tier and the individual SCs separately. Furthermore, robust precoders are designed correspondingly with estimated imperfect channel. Simulation results show that the sum-MSE based RAO algorithm provides the best MSE performance among the proposed schemes under a number of system configurations. When the number of antennas at the macro-BS is sufficiently large relative to the number of MUEs, the MSE of the separate MSE-based precoding is found to approach those of RAO and UAON. Together, this thesis provides a suite of three new precoding techniques that is expected to meet the need in a broad range of HetNet environments with balance between performance and complexity. The work on a large-scale HetNet studies the performance for MIMO downlink systems where both macro BS and SC nodes are equipped with large-scale antenna arrays. Suppose that the large-scale antenna arrays at both macro BS and SC nodes employ MRT or ZFT precoding, and transmit data streams to the served users simultaneously. A new pilot reuse pattern among small cells is proposed for channel estimation. Taking into account imperfect CSI, lower capacity bounds for MRT and ZFT are derived, respectively, in closed-form expressions involving only statistical CSI. Then asymptotic analyses for massive arrays are presented, from which we obtain the optimal antenna number ratio between BS and SCs under specific power scaling laws. Subsequently, two user scheduling algorithms, that is, greedy scheduling algorithm and asymptotical scheduling algorithm (ASA), are proposed based on the derived capacity lower bounds and asymptotic analyses, respectively. ASA is demonstrated to be a near optimal user scheduling scheme in the asymptotic regime and has low complexity. Finally, the derived closed-form achievable rate expressions are verified to be accurate predictors of the system performance by Monte-Carlo simulations. Numerical results demonstrate the effectiveness of the asymptotic analysis and the proposed user scheduling schemes. / Graduate / 0544 / 0984

The expansion of the universe is currently accelerating, as first inferred by Efstathiou et al. (1990), Ostriker & Steinhardt (1995) and directly determined by Riess et al. (1998) and Perlmutter et al. (1999). Current constraints are consistent with a time independent equation-of-state of w = -1, which is to be expected when a constant vacuum energy density dominates. But the Quantum Field Theory prediction for the magnitude of this vacuum energy is very much larger than that inferred (Weinberg, 1989; Koksma & Prokopec, 2011). It is entirely possible that the cause of the expansion has an alternative explanation, with both the inclusion of a quantum scalar field and modified gravity theories able to reproduce an expansion history close to, but potentially deviating from, that of a cosmological constant and cold dark matter. In this work I investigate the consistency of the VIMOS Public Extragalactic Redshift Survey (VIPERS) v7 census of the galaxy distribution at z = 0:8 with the expansion history and linear growth rate predicted by General Relativity (GR) when a Planck Collaboration et al. (2016) fiducial cosmology is assumed. To do so, I measure the optimally weighted redshift-space power spectrum (Feldman et al., 1994), which is anisotropic due to the coherent infall of galaxies towards overdensities and outflow from voids (Kaiser, 1987). The magnitude of this anisotropy can distinguish between modified theories of gravity as the convergence (divergence) rate of the velocity field depends on the effective strength of gravity on cosmological scales (Guzzo et al., 2008). This motivates measuring the linear growth rate rather than the background expansion, which is indistinguishable for a number of modified gravity theories. In Chapter 6 I place constraints of fσ8(0:76) = 0:44 ± 0:04; fσ8(1:05) = 0:28 ± 0:08; with the completed VIPERS v7 survey; the combination remains consistent with General Relativity at 95% confidence. The dependence of the errors on the assumed priors will be investigated in future work. Further anisotropy is introduced by the Alcock-Paczynski effect - a distortion of the observed power spectrum due to the assumption of a fiducial cosmology differing from the true one. These two sources of anisotropy may be separated based on their distinct scale and angular dependence with sufficiently precise measurements. Doing so degrades the constraints: fσ8(0:76) = 0:31 ± 0:10; fσ8(1:05) = -0:04 ± 0:26; but allows for the background expansion (FAP ≡ (1 + z)DAH=c) to be simultaneously constrained. Galaxy redshift surveys may then directly compare both the background expansion and linear growth rate to the GR predictions I find the VIPERS v7 joint-posterior on (fσ8; FAP ) shows no compelling deviation from the GR expectation although the sizeable errors reduce the significance of this conclusion. In Chapter 4 I describe and outline corrections for the VIPERS spectroscopic selection, which enable these constraints to be made. The VIPERS selection strategy is (projected) density dependent and may potentially bias measures of galaxy clustering. Throughout this work I present numerous tests of possible systematic biases, which are performed with the aid of realistic VIPERS mock catalogues. These also allow for accurate statistical error estimates to be made { by incorporating the sample variance due to both the finite volume and finite number density. Chapter 5 details the development and testing of a new, rapid approach for the forward modelling of the power spectrum multipole moments obtained from a survey with an involved angular mask. An investigation of the necessary corrections for the VIPERS PDR-1 angular mask is recorded. This includes an original derivation for the integral constraint correction for a smoothed, joint-field estimate of ¯n(z) and a description of how the mask should be accounted for in light of the Alcock- Paczynski effect. Chapter 7 investigates the inclusion of a simple local overdensity transform: 'clipping' prior to the redshift-space distortions (RSD) analysis. This tackles the root cause of non-linearity and potentially extends the validity of perturbation theory. Moreover, this marked clustering statistic potentially amplifies signatures of modified gravity and, as a density-weighted two-point statistic, includes information not available to the power spectrum. I show that a linear real-space power spectrum with a Kaiser factor and a Lorentzian damping yields a significant bias without clipping, but that this may be removed with a sufficiently strict transform; similar behaviour is observed for the VIPERS v7 dataset. Estimates of fσ8 for different thresholds are highly correlated due to the overlapping volume, but the bias for insufficient clipping can be calibrated and the correlation obtained using mock catalogues. A maximum likelihood value for the combined constraint of a number of thresholds is shown to achieve a ' 16% decrease in statistical error relative to the most precise single-threshold estimate. The results are encouraging to date but represent a work in progress; the final analysis will be submitted to Astronomy & Astrophysics as Wilson et al. (2016). In addition to this, an original extension of the prediction for a clipped Gaussian field to a clipped lognormal field is presented. The results of tests of this model with a real-space cube populated according to the halo occupation distribution model are also provided.

As the ever-advancing fabrication technologies in semiconductor industry enable the VLSI circuits with increasing integration and decreasing cost, the circuits suffer from much severer Signal Integrity (SI) faults, where SI is the capability of signals generating correct responses in their downstream circuits. SI faults are complex problems to tackle since SI may be damaged by numerous kinds of causes and SI faults may impact multiple aspects of circuits' performance. Such SI problems can seriously reduce product yield, result in function error or even permanently damage the chip. Therefore, effective testing methodologies are essential to alleviate SI problems by verifying the SI satisfaction of VLSI circuits efficiently. / Hereby the thesis has examined the SI problems systematically and proposed effective test methods corresponding to the specific feature of SI faults. Firstly, considering that SI on inter-core interconnects of SOCs is under severe danger, new test wrapper design has been proposed to achieve accurate SI test on interconnects. Secondly, test architecture has been optimized for cost reduction considering SI test and logic test simultaneously. Thirdly, the impact of power distribution network (PDN) defects on SI has been analyzed and efficient computation method has been proposed to identify those potentially harmful PDN defects. Effective test pattern manipulation method has also been proposed to improve test coverage of PDN defects. Fourthly, considering the increasing impact of process variation and aging effect on SI, an innovative online test architecture has been proposed, which can accurately measure the delay of critical paths when the circuit is working in function mode, where such valuable information is of great help for a variety of applications. / Zhang, Yubin. / Adviser: Qiang Xu. / Source: Dissertation Abstracts International, Volume: 73-06, Section: B, page: . / Thesis (Ph.D.)--Chinese University of Hong Kong, 2011. / Includes bibliographical references (leaves 121-133). / Electronic reproduction. Hong Kong : Chinese University of Hong Kong, [2012] System requirements: Adobe Acrobat Reader. Available via World Wide Web. / Electronic reproduction. [Ann Arbor, MI] : ProQuest Information and Learning, [201-] System requirements: Adobe Acrobat Reader. Available via World Wide Web. / Abstract also in Chinese.

by Man-chung Suen. / Thesis (M.Phil.)--Chinese University of Hong Kong, 1994. / Includes bibliographical references (leaves [123]-[126]). / Acknowledgement --- p.ii / Abstract --- p.iii / List of Tables --- p.vii / List of Figures --- p.xii / Chapter 1 --- Introduction --- p.1 / Chapter 2 --- Approach to Find the Equivalent Models --- p.5 / Chapter 2.1 --- Scattering Parameters of the Microstrip Structure --- p.5 / Chapter 2.2 --- Optimization Process --- p.7 / Chapter 2.3 --- Summary --- p.8 / Chapter 3 --- Microstrip Discontinuities Being Modelled --- p.9 / Chapter 3.1 --- Right-Angled Bend --- p.9 / Chapter 3.2 --- T-Junction --- p.10 / Chapter 3.3 --- Tapered Line --- p.10 / Chapter 4 --- Deficiency of Lumped Equivalent Circuits --- p.13 / Chapter 4.1 --- Scattering Parameter of the T-Network --- p.13 / Chapter 4.2 --- Optimization Result for the T-Network --- p.14 / Chapter 4.3 --- Summary --- p.15 / Chapter 5 --- Proposed Wideband Equivalent Circuits --- p.17 / Chapter 5.1 --- Model of a Uniform Non-Homogeneous Microstrip Line --- p.17 / Chapter 5.2 --- Right-Angled Bend --- p.22 / Chapter 5.2.1 --- Circuit 1L --- p.24 / Chapter 5.2.2 --- Circuit 2L --- p.25 / Chapter 5.2.3 --- Circuit 3L --- p.26 / Chapter 5.2.4 --- Circuit 4L --- p.27 / Chapter 5.3 --- T-Junction --- p.28 / Chapter 5.3.1 --- Circuit IT --- p.28 / Chapter 5.3.2 --- Circuit 2T --- p.31 / Chapter 5.3.3 --- Circuit 3T --- p.31 / Chapter 5.3.4 --- Circuit 4T --- p.34 / Chapter 5.4 --- Tapered Line --- p.36 / Chapter 5.4.1 --- Circuit It -n =3 --- p.37 / Chapter 5.5 --- Summary --- p.38 / Chapter 6 --- Performance of the Equivalent Circuits --- p.39 / Chapter 6.1 --- Right-Angled Bend --- p.40 / Chapter 6.1.1 --- Without Conductor Loss --- p.40 / Chapter 6.1.2 --- With Conductor Loss --- p.48 / Chapter 6.2 --- T-Junction --- p.49 / Chapter 6.2.1 --- Without Conductor Loss --- p.53 / Chapter 6.2.2 --- With Conductor Loss --- p.63 / Chapter 6.3 --- Tapered Line --- p.69 / Chapter 6.3.1 --- Without Conductor Loss --- p.69 / Chapter 6.3.2 --- With Conductor Loss --- p.72 / Chapter 6.4 --- Summary --- p.73 / Chapter 7 --- Modelling Performance Using TEM Approximation --- p.77 / Chapter 7.1 --- Right-Angled Bend --- p.77 / Chapter 7.1.1 --- Without Conductor Loss --- p.78 / Chapter 7.1.2 --- With Conductor Loss --- p.87 / Chapter 7.2 --- T-Junction --- p.92 / Chapter 7.2.1 --- Without Conductor Loss --- p.92 / Chapter 7.2.2 --- With Conductor Loss --- p.104 / Chapter 7.3 --- Tapered Line --- p.115 / Chapter 7.3.1 --- Without Conductor Loss --- p.116 / Chapter 7.3.2 --- With Conductor Loss --- p.117 / Chapter 7.4 --- Summary --- p.117 / Chapter 8 --- Conclusion --- p.120 / Bibliography --- p.123

by Tsz Shing Cheung. / Thesis (M.Phil.)--Chinese University of Hong Kong, 1990. / Includes bibliographical references. / Chapter Section 1 --- Introduction --- p.2 / Chapter 1.1 --- The Affinity Clustering Phase --- p.2 / Chapter 1.2 --- The Alteration Phase --- p.3 / Chapter 1.3 --- Floorplan of Macrocell Array --- p.3 / Chapter 1.4 --- Chip Model --- p.4 / Chapter 1.4.1 --- Location Representation --- p.4 / Chapter 1.4.2 --- Interconnection Length Estimation --- p.6 / Chapter 1.5 --- Cost Function Evaluation --- p.6 / Chapter 1.5.1 --- Net-length Calculation --- p.6 / Chapter 1.5.2 --- Net-length Estimated by Half of the Perimeter of Bounding Box --- p.7 / Chapter 1.6 --- Thesis Layout --- p.8 / Chapter Section 2 --- Reviews of Partitioning and Placement Methods --- p.9 / Chapter 2.1 --- Partitioning Methods --- p.9 / Chapter 2.1.1 --- Direct Method --- p.10 / Chapter 2.1.2 --- Group Migration Method --- p.10 / Chapter 2.1.3 --- Metric Allocation Methods --- p.10 / Chapter 2.1.4 --- Simulated Annealing --- p.11 / Chapter 2.2 --- Placement Methods --- p.12 / Chapter 2.2.1 --- Min-cut Methods --- p.13 / Chapter 2.2.2 --- Affinity Clustering Methods --- p.13 / Chapter 2.2.3 --- Other Placement Methods --- p.16 / Chapter Section 3 --- Algorithm --- p.17 / Chapter 3.1 --- The Affinity Clustering Phase --- p.18 / Chapter 3.1.1 --- Construction of Connection Lists --- p.18 / Chapter 3.1.2 --- Primary Grouping --- p.21 / Chapter 3.1.3 --- Element Appendage to Existing Groups --- p.23 / Chapter 3.1.4 --- Loose Appendage of Ungrouped Elements --- p.25 / Chapter 3.1.5 --- Single Element Groups Formation --- p.26 / Chapter 3.2 --- The Alteration Phase --- p.27 / Chapter 3.2.1 --- Element Assignment to a Group --- p.29 / Chapter 3.2.2 --- Empty Space Searching --- p.30 / Chapter 3.2.3 --- Determination of Direction of Element Allocation --- p.31 / Chapter 3.2.3.1 --- Cross-cut Direction of Allocation --- p.32 / Chapter 3.2.3.2 --- Dynamic Determination of Path Based on Size Functions --- p.34 / Chapter 3.2.3.2.1 --- Segmentation of Cross-cut --- p.35 / Chapter 3.2.3.2.2 --- Partial Optimization of Segments --- p.36 / Chapter 3.2.3.2.3 --- Dynamic Linking of Segments --- p.38 / Chapter 3.2.4 --- Element Allocation --- p.39 / Chapter Section 4 --- Implementation --- p.41 / Chapter 4.1 --- The System Row --- p.41 / Chapter 4.1.1 --- The Affinity Clustering Phase --- p.43 / Chapter 4.1.2 --- The Alteration Phase --- p.44 / Chapter 4.2 --- Data Structures --- p.47 / Chapter 4.2.1 --- Insertion of Elements to a Linked List --- p.54 / Chapter 4.2.2 --- Dynamic Linking of Segments --- p.56 / Chapter 4.2.3 --- Advantages of the Dynamic Data Structure --- p.59 / Chapter 4.3 --- Data Manipulation and File Management --- p.60 / Chapter 4.3.1 --- The Connection Lists and the Group List --- p.60 / Chapter 4.3.2 --- Description on Programs and Data Files --- p.62 / Chapter 4.3.2.1 --- The Affinity Clustering Phase --- p.63 / Chapter 4.3.2.2 --- The Alteration Phase --- p.64 / Chapter Section 5 --- Results --- p.70 / Chapter 5.1 --- Results on Affinity Clustering Phase --- p.84 / Chapter 5.2 --- Details of Affinity Clustering Procedure on Ckt. 2 and Ckt. 5 --- p.92 / Chapter 5.3 --- Results on Alteration Phase --- p.97 / Chapter 5.4 --- Details of Alteration Procedure on Ckt. 2 and Ckt. 5 --- p.101 / Chapter Section 6 --- Discussion --- p.107 / Chapter 6.1 --- Computation Time of the Algorithm --- p.107 / Chapter 6.2 --- Alternative Methods on the Determination of Propagation Path --- p.110 / Chapter 6.2.1 --- Method 1 --- p.110 / Chapter 6.2.2 --- Method 2 --- p.111 / Chapter 6.2.3 --- Method 3 --- p.114 / Chapter 6.2.4 --- Comparison on Execution Time of the Four Methods --- p.117 / Chapter 6.3 --- Wiring Optimization --- p.118 / Chapter 6.3.1 --- Data Structure --- p.119 / Chapter 6.3.2 --- Overlapping and Separate Bounding Boxes --- p.120 / Chapter 6.4 --- Generalization of the Data Structure --- p.122 / Chapter 6.4.1 --- Cell Types --- p.123 / Chapter 6.4.2 --- Adhesive Attributes --- p.124 / Chapter 6.4.3 --- Blocks Representation --- p.124 / Chapter 6.4.4 --- Critical Path Adjustment --- p.125 / Chapter 6.4.5 --- Total Interconnection Length Estimation --- p.129 / Chapter 6.5 --- A New Placement Algorithm --- p.130 / Chapter 6.6 --- An Alternative Method on Element Allocation --- p.132 / Chapter Section 7 --- Conclusion --- p.136 / Chapter Section 8 --- References --- p.138 / Chapter Section 9 --- Appendix I --- p.142 / Chapter 9.1 --- Definition of the Problem --- p.142 / Chapter 9.2 --- The Simulated Annealing Algorithm --- p.142 / Chapter 9.3 --- Example Circuit --- p.143 / Chapter 9.4 --- Performance Indices and Energy Value --- p.144 / Chapter 9.4.1 --- Total Interconnection Length --- p.144 / Chapter 9.4.2 --- Delay on Critical Paths --- p.144 / Chapter 9.4.3 --- Skew in Input-to-Output Delays --- p.146 / Chapter 9.4.4 --- Energy Value --- p.146 / Chapter 9.5 --- The Simulation Program --- p.146 / Chapter 9.5.1 --- "The ""function"" Subroutines" --- p.147 / Chapter 9.5.1.1 --- alise --- p.147 / Chapter 9.5.1.2 --- max delay --- p.147 / Chapter 9.5.1.3 --- replace --- p.147 / Chapter 9.5.1.4 --- total length --- p.147 / Chapter 9.5.2 --- "The ""procedure"" Subroutines" --- p.148 / Chapter 9.5.2.1 --- init_weight --- p.148 / Chapter 9.5.2.2 --- inverse --- p.148 / Chapter 9.5.2.3 --- initial --- p.148 / Chapter 9.5.2.4 --- shuffle --- p.148 / Chapter 9.5.3 --- The Main Program --- p.148 / Chapter 9.6 --- Results and Discussion --- p.149 / Chapter 9.7 --- Summary --- p.156 / Chapter 9.8 --- References --- p.156 / Chapter Section 10 --- Appendix II --- p.157

by Chan Lap-kong. / Thesis (M.Phil.)--Chinese University of Hong Kong, 1994. / Includes bibliographical references (leaves 77-80). / ABSTRACT / ACKNOWLEDGEMENTS / LIST OF FIGURES / Chapter 1. --- INTRODUCTION --- p.1 / Chapter 1.1 --- Background --- p.1 / Chapter 1.2 --- Problems in Testing VLSI Circuits --- p.3 / Chapter 1.2.1 --- Test-cost-per-gate --- p.3 / Chapter 1.2.2 --- Tester Complexity --- p.3 / Chapter 1.3 --- Tester Based on Terminals Characteristics -Automatic Testing Equipment(ATE) --- p.4 / Chapter 1.4 --- Tester Based on Terminal and Internal Characteristics --- p.6 / Chapter 1.4.1 --- Mechanical Probing Method --- p.6 / Chapter 1.4.2 --- E-beam Probing Method --- p.7 / Chapter 1.5 --- Movitation for this Research --- p.7 / Chapter 1.6 --- Outline of the Remaining Chapters --- p.9 / Chapter 2. --- E-BEAM TESTER --- p.10 / Chapter 2.1 --- State-of-art of E-Beam Tester --- p.10 / Chapter 2.2 --- An Electron-optical Column of a SEM --- p.12 / Chapter 2.3 --- Beam Rastering Methods --- p.13 / Chapter 2.4 --- Voltage Contrast Phenomenon --- p.14 / Chapter 2.5 --- Configuration of an E-Beam Test System --- p.18 / Chapter 2.6 --- Advantages of an E-beam Tester --- p.20 / Chapter 3. --- BASIC PRINCIPLES --- p.21 / Chapter 3.1 --- Single-Stuck-At Fault Model --- p.21 / Chapter 3.2 --- Observability and Controllability --- p.24 / Chapter 3.3 --- Netlist Format --- p.25 / Chapter 3.4 --- Level --- p.27 / Chapter 3.5 --- Reconvergent Fanout --- p.28 / Chapter 4. --- CONVENTIONAL TEST GENERATION --- p.29 / Chapter 4.1 --- Conventional Automatic Test Generation for ATEs --- p.29 / Chapter 4.3 --- Conventional E-Beam Test Generation --- p.31 / Chapter 5. --- TEST AND PROBE POINT GENERATION --- p.32 / Chapter 5.1 --- Wafer Stage E-beam Testing --- p.32 / Chapter 5.2 --- Critical Paths Generation --- p.33 / Chapter 5.3 --- Assumptions of the Test and Probe Point Generation Algorithm --- p.35 / Chapter 5.4 --- Rules of the Test and Probe Point Generation Algorithm --- p.36 / Chapter 5.5 --- Probe Points Selection and Reduction --- p.38 / Chapter 5.6 --- Test and Probe Point Generation Algorithm --- p.40 / Chapter 5.7 --- Propagation and Justification at Fanout Site --- p.42 / Chapter 6. --- EXAMPLES --- p.45 / Chapter 6.1 --- Example of Test and Probe Point Generation for Circuit sc2 --- p.45 / Chapter 6.2 --- Example of Test and Probe Point Generation for Circuit sfc4 --- p.53 / Chapter 7. --- CONCLUSIONS --- p.61 / Chapter 7.1 --- Summary of Results --- p.61 / Chapter 7.2 --- Further Research --- p.63 / APPENDIX / Appendix A: Algorithm to Find Reconvergent Fanouts / Appendix B: Results of Test Generation for Circuit sc1 / Appendix C: Results of Test Generation for Circuit sc3 / REFERENCES --- p.77

by Wai-Hung Leung. / Thesis (M.Phil.)--Chinese University of Hong Kong, 1995. / Includes bibliographical references (leaves 73-75). / Chapter 1 --- Introduction --- p.1 / Chapter 2 --- Wavelet Theory --- p.5 / Chapter 2-1 --- Basic Wavelet Theories --- p.5 / Chapter 2-2 --- Example of Haar Wavelet Base --- p.6 / Chapter 2-3 --- Wavelet Decomposition and Reconstruction with Multiresolution Analysis --- p.12 / Chapter 2-4 --- Conditions for the Effective Filter Bank and the Constructions of the Filter Coefficients --- p.17 / Chapter 2-5 --- Comparison between Wavelet Analysis and Fourier Analysis --- p.20 / Chapter 3 --- Waveform Relaxation Analysis of Distributed Network --- p.25 / Chapter 3-1 --- Introduction --- p.25 / Chapter 3-2 --- Method of Characteristics for the Simulation of Transmission Lines --- p.27 / Chapter 3-3 --- Waveform Relaxation Algorithm --- p.30 / Chapter 3-4 --- Pade Synthesis of Lossy Characteristic Impedance --- p.33 / Chapter 4 --- Application of FFT on the Transient Simulation of Distributed Network --- p.39 / Chapter 4-1 --- Simulation of Wave Propagation in Lossy Transmission Line with FFT --- p.39 / Chapter 4-2 --- Some Special Properties of the Wave Propagation Function of Lossy Transmission Lines --- p.44 / Chapter 5 --- Wavelet-based Convolution --- p.49 / Chapter 5-1 --- Introduction --- p.49 / Chapter 5-2 --- Application of Wavelet-based Convolution on the Simulation of Wave Propagation Function and Waveform Transformation --- p.58 / Chapter 6 --- Experimental Results of using Wavelet- based Convolution on the Transient Simulation of Lossy Transmission Lines --- p.64 / Chapter 7 --- Conclusions and Prospective Studies --- p.71 / Chapter 8 --- References --- p.73 / Appendix Program Lists --- p.76

Ku Man-Ho. / Thesis (M.Phil.)--Chinese University of Hong Kong, 1995. / Includes bibliographical references (leaves 86-87). / Chapter 1. --- Introduction / Chapter 1.1. --- Introduction --- p.1 / Chapter 1.2. --- Power Noise --- p.2 / Chapter 1.3. --- High Speed Output Driver Design --- p.3 / Chapter 2. --- Power Bus Noise Analysis / Chapter 2.1. --- Introduction --- p.7 / Chapter 2.2. --- The Power bus model of a packed VLSI chip --- p.7 / Chapter 2.3. --- The effects of bonding wire on Power bus --- p.11 / Chapter 2.4. --- Noise analysis of multi-driver switching --- p.15 / Chapter 3. --- Effects of Power bus noise / Chapter 3.1. --- Introdcution --- p.22 / Chapter 3.2. --- Digital noise definition --- p.22 / Chapter 3.3. --- Static CMOS Inverter --- p.23 / Chapter 3.4. --- Dynamic gate --- p.32 / Chapter 4. --- Output Driver Design / Chapter 4.1. --- Introduction --- p.37 / Chapter 4.2. --- Optimum Discharge Current Waveform --- p.37 / Chapter 4.3. --- Simple Inverter Output driver --- p.40 / Chapter 4.4. --- Weighted and Distributed Driver --- p.42 / Chapter 4.5. --- Short circuit current prevention circuit --- p.50 / Chapter 5.6. --- Adaptive output driver --- p.52 / Chapter 5. --- Test chip Implementation / Chapter 5.1. --- Introduction --- p.57 / Chapter 5.2. --- Output Driver Circuit Design --- p.57 / Chapter 5.3. --- Simulation Results --- p.62 / Chapter 5.4. --- Test chip circuit --- p.65 / Chapter 5.5. --- Physical design --- p.67 / Chapter 6. --- Test Chip evaluation / Chapter 6.1. --- Introduction --- p.75 / Chapter 6.2. --- Rise time and overshoot Test --- p.76 / Chapter 6.3. --- Switching noise --- p.79 / Chapter 6.4. --- Driving Test --- p.82 / Chapter 7. --- Conslusions --- p.84 / Chapter 8. --- References --- p.86 / Chapter 9. --- Appendix A --- p.88 / Chapter 10. --- Appendix B --- p.91 / Chapter 11. --- Appendix C --- p.100 / Chapter 12. --- Appendix D --- p.101 / Chapter 13. --- Appendix E --- p.102