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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
1

Magnetization Dynamics in Coupled Thin Film Systems

Adams, Daniel J. 23 May 2019 (has links)
A study is presented detailing experimental investigations of magnetization dynamics in nanostructured systems which are coupled magnetically. This work seeks to characterize the anisotropy of such systems through experimental techniques which probe microwave resonant absorption in the materials. A custom-built experimental setup, designed and assembled in our labs, is explained in detail. This setup allows for angular-dependent ferromagnetic resonance (FMR) measurements in the sample plane through vector network analyzer spectroscopy and is adaptable to two different types of coplanar waveguides. This technique has proven effective for characterization of multiple types of magnetic systems, including multilayered structures as detailed here, with different types of anisotropies while allowing us to draw analogies with more common characterization techniques. The angular FMR setup has been used to study coupled systems, such as those coupled through the Ruderman–Kittel–Kasuya–Yosida interaction as well as exchange-biased structures. These types of coupled systems have technological impacts and are highly applied in the components of magnetoresistive random access memory. Using this new characterization technique, properties of synthetic antiferromagnets have been revealed which had not been observed before. In addition to these experiments, magnetic susceptibility and FMR in exchange biased systems have been investigated at temperatures as low as 2 K. This investigation used a new FMR spectrometer and was one of the first studies to use this instrument. For the first time a new method of identifying several types of coupling which can be present in layered nanostructures is presented and supported through comparison with known techniques, thus connecting a new characterization technique for layered structures with decades-old procedures. Many results within this work are also supported theoretically with computer simulations.

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