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Study of Magnetization Switching in Coupled Magnetic Nanostructured SystemsRadu, Cosmin 19 December 2008 (has links)
A study of magnetization dynamics experiments in nanostructured materials using the rf susceptibility tunnel diode oscillator (TDO) method is presented along with a extensive theoretical analysis. An original, computer controlled experimental setup that measures the change in susceptibility with the variation in external magnetic field and sample temperature was constructed. The TDO-based experiment design and construction is explained in detail, showing all the elements of originality. This experimental technique has proven reliable for characterizing samples with uncoupled magnetic structure and various magnetic anisotropies like: CrO2 , FeCo/IrMn and Co/SiO2 thin films. The TDO was subsequently used to explore the magnetization switching in coupled magnetic systems, like synthetic antiferromagnet (SAF) structures. Magnetoresistive random access memory (MRAM) is an important example of devices where the use of SAF structure is essential. To support the understanding of the SAF magnetic behavior, its configuration and application are reviewed and more details are provided in an appendix. Current problems in increasing the scalability and decreasing the error rate of MRAM devices are closely connected to the switching properties of the SAF structures. Several theoretical studies that were devoted to the understanding of the concepts of SAF critical curve are reviewed. As one can notice, there was no experimental determination of SAF critical curve, due to the difficulties in characterizing a magnetic coupled structure. Depending of the coupling strength between the two ferromagnetic layers, on the SAF critical curve one distinguishes several new features, inexistent in the case of uncoupled systems. Knowing the configuration of the SAF critical curve is of great importance in order to control its switching characteristics. For the first time a method of experimentally recording the critical curve for SAF is proposed in this work. In order to overcome technological limitations, a new way of recording the critical curve by using an additional magnetic bias field was explored.
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Magnetization Dynamics in Coupled Thin Film SystemsAdams, Daniel J. 23 May 2019 (has links)
A study is presented detailing experimental investigations of magnetization dynamics in nanostructured systems which are coupled magnetically. This work seeks to characterize the anisotropy of such systems through experimental techniques which probe microwave resonant absorption in the materials.
A custom-built experimental setup, designed and assembled in our labs, is explained in detail. This setup allows for angular-dependent ferromagnetic resonance (FMR) measurements in the sample plane through vector network analyzer spectroscopy and is adaptable to two different types of coplanar waveguides. This technique has proven effective for characterization of multiple types of magnetic systems, including multilayered structures as detailed here, with different types of anisotropies while allowing us to draw analogies with more common characterization techniques. The angular FMR setup has been used to study coupled systems, such as those coupled through the Ruderman–Kittel–Kasuya–Yosida interaction as well as exchange-biased structures. These types of coupled systems have technological impacts and are highly applied in the components of magnetoresistive random access memory. Using this new characterization technique, properties of synthetic antiferromagnets have been revealed which had not been observed before.
In addition to these experiments, magnetic susceptibility and FMR in exchange biased systems have been investigated at temperatures as low as 2 K. This investigation used a new FMR spectrometer and was one of the first studies to use this instrument.
For the first time a new method of identifying several types of coupling which can be present in layered nanostructures is presented and supported through comparison with known techniques, thus connecting a new characterization technique for layered structures with decades-old procedures. Many results within this work are also supported theoretically with computer simulations.
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