The transient time-domain simulation, of the circuit response, is a fundamental component in the Computer-Aided Design tools of all integrated circuit and systems. It is typically desirable that a method adopted in the transient circuit simulator be of high- order and numerically stable. The two requirements, however, proved to be in conflict with each other, especially in the larger class of methods that were used in traditional circuit simulators. Recent work based on utilizing the Obreshkov formula has proved that it is possible to combine the high order with the numerical stability. The objective of this thesis is to show how the present implementation of the Obreshkov- based method can be improved and generalized to handle different types of circuits. The first aspect of improvement targets the computation of the high-order derivatives re- quired by the Obreshkov formula. The second aspect of improvement, presented in the thesis, develops a generalized formulation that takes into account the presence of non- linear memory elements, whose nonlinearity is based on a capacitive or inductive-based nonlinear model.

Le travail présenté dans ce manuscrit a pour objet l’étude et le développement d’un banc de caractérisation généraliste appliqué à l’extraction du modèle comportemental d’amplificateur TPM-NIM (Two-Path Memory Nonlinear Integral). Ce modèle qui dispose d’une des architectures les plus abouties au laboratoire XLIM requiert une instrumentation microonde haut de gamme, très onéreuse, hors de portée de la majorité des concepteurs pour sa mise en œuvre expérimentale. L’objectif est donc de proposer des principes de mesure originaux permettant d’identifier le modèle TPM-NIM avec une instrumentation standard. Dans ces travaux, deux bancs sont présentés : tout d’abord, un banc de caractérisation développé autour d’une instrumentation de pointe disposant des meilleures propriétés pour extraire le modèle. Puis, un banc construit autour d’une instrumentation standard mais incluant des méthodes de traitement et de mesure novatrices. Ces deux bancs ont été utilisés avec plusieurs véhicules de tests et il ressort que le second permet de diminuer le bruit des mesures de phase tout en réduisant le coût total des équipements. Enfin, une dernière partie est consacrée à la comparaison du modèle TPM-NIM avec deux modèles comportementaux classiques mettant en avant sa polyvalence. / The work presented in this manuscript is devoted to the study and development of a general characterization bench applied to the extraction of the TPM-NIM (Two-Path Memory Nonlinear Integral) amplifier behavioral model. This model, has one of the most advanced architectures at the XLIM laboratory. It requires a high-end microwave instrumentation, overpriced and beyond reach for most of the designers for its experimental implementation. The aim is to propose some original measurements principles allowing the TPM-NIM model’s identification with a standard instrumentation. Two benches are presented in these works : firstly, a characterization bench, developed using a high performance instrumentation with the best properties to extract the model. Then, a bench, built with a standard instrumentation but through innovative processing and measurement methods. These two benches have been used with several test vehicles and it appears that the second one decreases the noise of phase measurements while reducing the equipment’s total cost. Finally, a last part is dedicated to the comparison of the TPM-NIM model with two classic behavioral models by emphasizing its versatility.