NDLTD Global ETD Search
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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

Search results

Showing 1 to 2 of 2 (0.096 seconds)
1

A Study on Performance Binning in Error Resilient Circuits

Nilamboor, Sanjay N. 30 June 2015 (has links)
No description available.
Electrical Engineering
performance binning
atpg
delay test patterns
2

On Resilient System Testing and Performance Binning

Han, Qiang 02 June 2015 (has links)
No description available.
Computer Engineering
Resilient computing
Delay testing
Performance binning
Yield improvement
Error rate modeling
Statistical analysis

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