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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
21

Scanning Probe Alloying Nanolithography (SPAN)

Lee, Hyungoo 2009 May 1900 (has links)
In recent years, nanowires have become increasingly important due to their unique properties and applications. Thus, processes in the fabrication to nanostructures has come a focal point in research. In this research, a new method to fabricate nanowires has been developed. The new technique is called the Scanning Probe Alloying Nanolithography (SPAN). The SPAN was processed using an Atomic Force Microscope (AFM) in ambient environment. Firstly, an AFM probe was coated with gold (Au), and then slid on a silicon (Si) substrate. The contact-sliding motion generated a nanostructure on the substrate, instead of wear. Subsequently, careful examination was carried out at the scale relevant to an AFM probe, in terms of physical dimension and electrical conductivity. The measured conductivity value of the generated microstructures was found to be between the conductivity values of pure silicon and gold. Simple analysis indicated that the microstructures were formed due to frictional energy dispersed in the interface forming a bond to sustain mechanical wear. This research proves the feasibilities of tip-based nanomanufacturing. The SPAN process was developed to increase efficiency of the technique. This study also explored the possibility of the applications as a biosensor and a flexible device. This dissertation contains nine sections. The first section introduces backgrounds necessary to understand the subject matter. It reviews current status of the nanofabrication technologies. The basic concepts of AFM are also provided. The second section discusses the motivation and goals in detail. The third section covers the new technology, scanning probe alloying nanolithography (SPAN) to fabricate nanostructures. The fourth talks about characterization of nanostructures. Subsequently, the characterized nanostructures and their mechanical, chemical, and electrical properties are discussed in the fifth section. In the sixth section, the new process to form a nanostructure is evaluated and its mechanism is discussed. The seventh section discusses the feasibility of the nanostructures to be used in biosensors and flexible devices. The conclusion of the research is summarized in the seventh section.
22

Development of combined scanning electrochemical optical microscopy with shear force feedback using a tuning fork and current feedback

Lee, Young Mi. January 2001 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2001. / Vita. Includes bibliographical references. Available also from UMI/Dissertation Abstracts International.
23

Development of combined scanning electrochemical optical microscopy with shear force feedback using a tuning fork and current feedback

Lee, Young Mi 24 March 2011 (has links)
Not available / text
24

P-n junction dopant profiling using scanning capacitance microscopy /

Yang, Jing. January 2004 (has links) (PDF)
Thesis (Ph.D.) - University of Queensland, 2005. / Includes bibliography.
25

Modelling and inverse modelling of scanning capacitance microscopy for dopant profile extraction /

Hong, Yang David. January 2005 (has links) (PDF)
Thesis (Ph.D.) - University of Queensland, 2006. / Includes bibliography.
26

Surface Potential Sensing Atomic Force Microscopy to Probe the Role of Oxygen Evolution Catalysts When Paired with Metal-Oxide Semiconductors

Nellist, Michael 11 January 2019 (has links)
While prices of solar energy are becoming cost competitive with traditional fossil fuel resources, large scale deployment of solar energy has been limited by the inability to store excess electrical energy efficiently. One promising route towards both the capture and storage of solar energy is through photoelectrochemical water splitting, a process by which a semiconducting material can collect energy from the sun and use it to directly split water (H2O) into hydrogen fuel and oxygen. Unfortunately, photoelectrochemical water splitting devices are limited by the low efficiencies and high overpotentials of the oxygen evolution reaction (OER). To improve kinetics of OER, different electrocatalyst are often coated on the semiconductor. However, the role of the catalyst and the mechanism of charge transfer at the semiconductor|catalyst interface is not clear. It is important to understand this interface if we are to rationally design high performance water splitting cells. The research presented in this dissertation takes on two aims: 1) obtaining a fundamental knowledge of the charge transfer processes that take place at the semiconductor catalyst interface of photoanodes and 2) developing new experimental approaches that can be applied towards achieving the first aim. Specifically, this dissertation begins with a prospectus that outlines the state of the field, and the what was known about the semiconductor|electrocatalyst interface at the outset of the presented work (Chapter II). Next, the testing and application of new nanoelectrode AFM probes to study an array of electrochemical phenomena will be discussed (Chapter III). These probes will then be applied towards the study of hematite (Fe2O3) semiconductors coated with cobalt phosphate (oxy)hydroxide (CoPi) electrocatalyst (Chapter IV) and bismuth vanadate (BiVO4) semiconductors coated with CoPi electrocatalyst (Chapter 5). This dissertation includes previously published and unpublished co-authored material. / 2020-01-11
27

In Situ Scanning Probe Techniques for Evaluating Electrochemical Systems

Dorfi, Anna January 2020 (has links)
Falling technology costs are allowing renewable sources of energy to become increasingly more competitive with fossil fuel-based sources. However, challenges still remain in the widespread deployment of sources like wind and solar due to their intermittent nature and cost-prohibitive storage options. An attractive solution to address these issues is by using renewably derived energy to drive electrolysis reactions that generate useful chemicals and fuels. In order to do this effectively and economically, efficient and durable electrocatalysts are needed for the reactions of interest, such as hydrogen production from water electrolysis. Presently, the best catalysts for this process are noble metals such as platinum, which are expensive and in limited supply. The discovery and mechanistic understanding of earth abundant materials that can also efficiently catalyze these reactions remains a current research focus. Scanning probe microscopy (SPM) techniques can be used to aid in the discovery of these materials, as they are able to investigate catalyst surfaces in situ and at a higher resolution than conventional 3-electrode electroanalytical methods. This dissertation explores the use of two in situ SPM techniques, scanning electrochemical microscopy (SECM) and scanning photocurrent microscopy (SPCM), for evaluating both photocatalytic and electrocatalytic electrochemical systems. Three different studies that use these two techniques were carried out over the duration of my thesis work and are presented in Chapters 2 through 4. After providing an overview of solar fuels and SPM techniques in Chapter 1, Chapter 2 describes the design considerations, implementation and demonstration of a home-built SECM instrument for use with nonlocal continuous line probes (CLPs) that can achieve high areal imaging rates with compressed sensing (CS) image reconstruction. The CLP consists of an electroactive band electrode sandwiched between two insulating layers, where one of the insulating layers needs to be on the same length scale as the band electrode because it determines the average separation distance from the band electrode to the substrate. Similarly, the spatial resolution of the CLP is determined by the thickness of the band and the realizable imaging rate is determined by its width and linear scan rate. Like conventional SECM systems, a combination of linear motors and a bipotentiostat is needed. However, for the CLP-SECM system both linear and rotational motors are needed to scan at different substrate angles to obtain the necessary raw signal to reconstruct the target electrochemical image with CS algorithms. Detailed descriptions of the microscope design, CLP fabrication, and the procedures necessary to carry out the CLP-SECM imaging are given in this chapter. Measurements with this novel CLP-SECM microscope are done with flat platinum disk electrode samples of varying sizes. A substrate-generation-probe-collection mode is used during the SECM linescan measurements to illustrate procedures for position calibration of the system, CLP and substrate cleaning, as well as verifying the sensitivity along the length of the CLP. Finally, linescans over a three disk platinum sample were taken and CS image reconstruction was done, with as few as three linescans, to demonstrate the order of magnitude time advantage of this approach over conventional SECM scanning methods. In Chapter 3, colorimetric imaging studies are done using a pH dye indicator to visualize the plume of electroactive species that is generated during in situ SECM measurements for both conventional and CLP-SECM systems. In SECM, the signal recorded by the probe is facilitated by transport of electroactive species and not by direct contact between the probe and the substrate, which is typical of many scanning probe microscopy (SPM) techniques. One of the complexities with SECM is being able to fully understand the interaction between the electroactive species generated at the substrate and the probe. Thus in order to understand this further, a pH indicator dye is used to visualize pH gradients associated with the hydrogen product plume generated by water electrolysis during in situ SECM measurements. The in situ colorimetric experiments are then used to inform assumptions about the system and validate simulations using finite element modeling software. From this study, we are able to develop quantitative relationships to describe how the plume of electroactive species influences the recorded current at the probe for different probe geometries. Finally, we use this initial study as groundwork for investigating the influence of higher probe scan speeds where convection starts to play a role on the distortion of the signal and plume dynamics, and how it can be corrected using CS post-processing methods. Lastly, SPCM is employed in Chapter 4 to study the optical efficiency losses due to varying size bubbles on a photoelectrode surface. Individual single hydrogen bubbles ranging from 100 µm to 1000 µm were generated on a photoelectrode surface and a laser was used to scan over single isolated bubbles to create localized optical efficiency maps based on photocurrent and external quantum efficiency (EQE). Moreover, a ray-tracing model based on Snell’s law was also constructed to compare to experimental SPCM linescans. This model showed very good agreement to the experimental SPCM linescan results. This investigation showed that larger bubbles lead to higher optical efficiency losses, not only due to higher inactive electrochemically active surface areas (ECSAs) but also due to a larger region of total internal reflection of light from the edge regions of bubbles. A macroscale study over a large photoelectrode surface was also done where the images of the surface were taken while the “sawtooth” was measured under AM1.5 illumination. Consequently, a predictive current−time profile was generated from the single bubble SPCM empirical relationship between bubble size and optical losses and was compared to the experimental measurement. Understanding how bubbles can impact the efficiency of the overall system is important, as bubbles in a system and on an electrode surface increases ohmic resistances, optical losses, and kinetic losses. Overall, this study can be used as a starting point for designing systems, electrolyte, and catalyst surfaces to improve one or more of the aforementioned losses.
28

Applications of scanning probe microscopies in electrocatalytic systems

Chen, Rongrong January 1993 (has links)
No description available.
29

Studies of localized electrical properties of ZnO:Al by scanning probe microscope (SPM). / 基於掃描探針顯微鏡 SPM)的關於鋁摻雜氧化鋅(ZnO:Al)局域電學性質之研究 / Studies of localized electrical properties of ZnO:Al by scanning probe microscope (SPM). / Ji yu sao miao tan zhen xian wei jing (SPM) de guan yu lü shan za yang hua xin (ZnO:Al) ju yu dian xue xing zhi zhi yan jiu

January 2008 (has links)
Fang, Qianying = 基於掃描探針顯微鏡(SPM)的關於鋁摻雜氧化鋅(ZnO:Al)局域電學性質之研究 / 方倩莹. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2008. / Includes bibliographical references (leaves 97-100). / Text in English; abstracts in English and Chinese. / Fang, Qianying = Ji yu sao miao tan zhen xian wei jing (SPM) de guan yu lü shan za yang hua xin (ZnO:Al) ju yu dian xue xing zhi zhi yan jiu / Fang Qianying. / Chapter I. --- Abstract / Chapter II. --- Acknowledgement / Chapter III. --- Table of contents / Chapter IV. --- List of figures / Chapter V. --- List of tables / Chapter 1 --- Introduction / Chapter 1.1 --- Motivations / Chapter 1.2 --- Outline of thesis / Chapter 2 --- Experimental Conditions and Techniques Used / Chapter 2.1 --- Sample preparation / Chapter 2.1.1 --- Radio frequency magnetic sputtering / Chapter 2.1.2 --- Substrates / Chapter 2.1.3 --- Thermal evaporation / Chapter 2.1.4 --- Thermal annealing / Chapter 2.2 --- Microscopic electrical measurement / Chapter 2.2.1 --- Conductive atomic force microscope (c-AFM) / Chapter 2.2.2 --- Scanning capacitance microscope (SCM) / Chapter 2.2.3 --- Surface Potential (SP) / Chapter 2.3 --- SEM and cathodoluminescence spectroscopy / Chapter 3 --- Calibrations / Chapter 3.1 --- Calibrations of c-AFM measurements / Chapter 3.1.1 --- Reproducible images / Chapter 3.1.2 --- Further statistical analysis / Chapter 3.1.3 --- Sample thickness effect / Chapter 3.1.4 --- Conclusions / Chapter 3.2 --- Calibrations of cathodeluminescence (CL) measurements / Chapter 3.2.1 --- Effect of removing residual magnetic field / Chapter 3.2.2 --- Effect of Faraday cup moving / Chapter 3.2.3 --- Time effect / Chapter 3.2.4 --- Effect of mirror shift / Chapter 3.2.5 --- Effect of electron beam shift / Chapter 3.2.6 --- Conclusions / Chapter 3.3 --- Calibrations of scanning capacitance microscope (SCM) measurements / Chapter 3.3.1 --- SCM images and morphological dependence of as-deposited AlOx/ZnO thin film / Chapter 3.3.2 --- Comparison between as-deposited and e-beam irradiated AlOx/ZnO thin film / Chapter 3.3.3 --- SCM images and morphological dependence of e-beam irradiated AlOx/ZnO thin film / Chapter 3.3.4 --- Conclusions / Chapter 4 --- Experimental Results and Data Analysis / Chapter 4.1 --- Conductive Atomic Force Microscope (c-AFM) / Chapter 4.1.1 --- Effect of scan rate / Chapter 4.1.2 --- Dual images and morphological dependence / Chapter 4.1.3 --- Statistic microscopic current-voltage (I-V) / Chapter 4.1.4 --- Schottky barrier at Pt-ZnO contact / Chapter 4.1.5 --- C-AFM artifact / Chapter 4.2 --- Scanning Capacitance Microscope (SCM) / Chapter 4.2.1 --- Dual images and morphological dependence / Chapter 4.2.2 --- Statistic microscopic SCM data-voltage (dC/dV-V) / Chapter 4.3 --- Surface Potential (SP) / Chapter 5 --- Discussions and Conclusion / Chapter 5.1 --- Mechanism / Chapter 5.2 --- Conclusions / Chapter 5.3 --- Future plan / Chapter 6 --- References
30

Symmetric Near-Field Probe Design and Comparison to Asymmetric Probes

Doughty, Jeffrey Jon 01 January 2010 (has links)
Tip Enhanced Near-field Optical Microscopy (TENOM) is a method for optically imaging at resolutions far below the diffraction limit. This technique requires optical nano-probes with very specialized geometries, in order to obtain large, localized enhancements of the electromagnetic field, which is the driver behind this imaging method. Traditional methods for the fabrication of these nano-probes involve electrochemical etching and subsequent FIB milling. However, this milling process is non-trivial, requiring multiple cuts on each probe. This requires multiple rotations of the probe within the FIB system, which may not be possible in all systems, meaning the sample must be removed from vacuum, rotated by hand and placed back under vacuum. This is time consuming and costly and presents a problem with reproducibility. The method presented here is to replace multiple cuts from a side profile with a small number of cuts from a top down profile. This method uses the inherent imaging characteristics of the FIB, by assigning beam dwell times to specific locations on the sample, through the use of bitmap images. These bitmaps are placed over the sample while imaging and provide a lookup table for the beam while milling. These images are grayscale with the color of each pixel representing the dwell time at that pixel. This technique, combined with grayscale gradients, can provide probes with a symmetric geometry, making the system polarization independent.

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