171 |
Swift electro-optic modulator /Harston, Geof, January 2003 (has links) (PDF)
Thesis (M.S.)--Brigham Young University. Dept. of Electrical and Computer Engineering, 2003. / Includes bibliographical references (p. 89-91).
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Temperature control and characterization of silicon-germanium growth by rapid thermal chemical vapor deposition /Hwang, Sung-bo, January 2002 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2002. / Vita. Includes bibliographical references (leaves 163-173). Available also in a digital version from Dissertation Abstracts.
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173 |
Design and characterization of silicon micromechanical resonatorsHo, Gavin Kar-Fai. January 2008 (has links)
Thesis (Ph.D)--Electrical and Computer Engineering, Georgia Institute of Technology, 2009. / Committee Member: David R. Hertling; Committee Member: Farrokh Ayazi; Committee Member: Gary S. May; Committee Member: Oliver Brand; Committee Member: Paul A. Kohl. Part of the SMARTech Electronic Thesis and Dissertation Collection.
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174 |
Catalytic oxidation of methane using single crystal silicon carbideGopalkrishna, Akshoy. January 2003 (has links)
Thesis (M.S. Ch. E.)--University of South Florida, 2003. / Title from PDF of title page. Document formatted into pages; contains 70 pages. Includes bibliographical references.
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175 |
Infrared studies of the rotational motion of interstitial H₂ and the vibrational lifetimes of H- decorated lattice defects in Si /Chen, E. Elinor, January 2002 (has links)
Thesis (Ph. D.)--Lehigh University, 2003. / Includes bibliographical references and vita.
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176 |
Temperature control and characterization of silicon-germanium growth by rapid thermal chemical vapor depositionHwang, Sung-Bo, January 2002 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2002. / Vita. Includes bibliographical references. Available also from UMI Company.
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177 |
EFFECTS OF CERTAIN PROCESSING VARIABLES ON STACKING FAULT FORMATION IN SILICON CRYSTALSChang, Yang-Ming, 1937- January 1977 (has links)
No description available.
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178 |
FABRICATION AND TESTING OF A SENSITIVE ULTRAVIOLET-VISIBLE SILICON PHOTODIODE DEVICEMartínez Montes, José de la Luz January 1979 (has links)
No description available.
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179 |
Injection-Avalanche-Based nþpn Silicon Complementary Metal Oxide–Semiconductor Light-Emitting Device (450 – 750 nm) with 2-Order-of-Magnitude Increase in Light Emission IntensitySnyman, LW, Du Plessis, M, Aharoni, H 18 April 2007 (has links)
In this paper, we report on an increase in emission intensity of up to 10 nW/mm2 that has been realized with a new novel two
junction, diagonal avalanche control, and minority carrier injection silicon complementary metal–oxide–semiconductor
(CMOS) light emitting device (LED). The device utilizes a four-terminal configuration with two embedded shallow nþp
junctions in a p substrate. One junction is kept in deep-avalanche and light-emitting mode, while the other junction is forward
biased and minority carrier electrons are injected into the avalanching junction. The device has been realized using standard
0.35 mm CMOS design rules and fabrication technology and operates at 9V in the current range 0.1– 3 mA. The optical output
power is about one order of magnitude higher for previous single-junction nþp light-emitting devices while the emission
intensity is about two orders of magnitude higher than for single-junction devices. The optical output is about three orders of
magnitude higher than the low-frequency detectivity limit of silicon p–i–n detectors of comparable dimensions. The realized
characteristics may enable diverse optoelectronic applications in standard-CMOS-silicon-technology-based integrated
circuitry.
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Temperature control and characterization of silicon-germanium growth by rapid thermal chemical vapor depositionHwang, Sung-Bo, 1965- 25 April 2011 (has links)
Not available / text
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